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The space charge packet is a special sort of space charge phenomenon that is characterized by the migration of aggregated space charge in the form of a packet in the sample. Currently, most of the experimental and simulation studies on the generation and migration of space charge packets focus on the space charge packets with positive polarity in polyethylene and their cross-linking products, while the characteristics of the space charge packets with negative polarity still need studying. This paper presents an integrated experimental system for studying space charge packet with negative polarity, which enables experimental studies combining electron beam irradiation technique and real-time space charge distribution measurement. The beam flux for electron beam irradiation is controlled by a metal grid with an optical fiber-electric relay, and the space charge distribution measurement is performed by the piezo- pressure wave propagation method. The system achieves a withstand voltage value of 17 kV and a measuring resolution of 25 ns for space charge distribution measurement and is suitable for experimental studies of various material samples with different thickness ranges under different electric fields. In this work, the migration behaviors of space charge packets with negative polarity in polypropylene (PP) and polymethyl methacrylate (PMMA) samples under different applied electric fields (15, 20, 25, 30 kV/mm) are studied by using the experimental system. The relationship between the migration properties of carriers with negative polarity (electrons) and the electric field can be extracted from the experimental results. The “negative differential mobility” phenomenon is found for both materials, i.e. the migration rate decreases with the increase of the electric field. The threshold electric field for the “negative differential mobility” phenomenon of electrons in PP sample is about 26.0 kV/mm while the threshold electric field for the “negative differential mobility” phenomenon of electrons in PMMA sample is 19.5 kV/mm, and the phenomenon disappears at an electric field of 27.5 kV/mm. The electric field where the "negative differential mobility" phenomenon of electrons appears and disappears in different materials can be extracted by using the experimental system proposed in this paper.
[1] 杜伯学, 韩晨磊, 李进, 李忠磊 2019 电工技术学报 34 179
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Du B X, Han C L, Li J, Li Z L 2019 Trans. Chin. Electrotech. Soc. 34 179
Google Scholar
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Google Scholar
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Google Scholar
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Google Scholar
Xia J F, Zhang Y W, Zheng F H, Lei Q Q 2010 Acta Phys. Sin. 59 508
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[14] 张冶文, 赵晖, 郭世忠, 郑飞虎, 安振连 2016 电工技术学报 31 145
Google Scholar
Zhang Y W, Zhao H, Guo Sh Z, Zheng F H, An Z L 2016 Trans. Chin. Electrotech. Soc. 31 145
Google Scholar
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图 1 电子束辐照系统的结构示意图与实物图 (a) 结构示意图; (b) 实物图
Figure 1. Schematic diagram and actual photo of the electron beam irradiation system: (a) Structure diagram; (b) actual photo.
图 2 金属栅极调控下的电子束束流量
Figure 2. Electron beam flux controlled by metal grid.
图 3 压电压力波法测量装置的结构示意图
Figure 3. Schematic diagram of the piezo-PWP method measurement device.
图 4 相同辐照条件下不同聚丙烯样品内的初始空间电荷分布(撤压信号)
Figure 4. Space charge distribution in different PP samples under the same irradiation conditions (without applied voltage).
图 5 不同外加电场下聚丙烯样品内部的空间电荷分布 (a) 15 kV/mm; (b) 20 kV/mm; (c) 25 kV/mm; (d) 30 kV/mm
Figure 5. Space charge distribution inside PP samples under different applied electric fields: (a) 15 kV/mm; (b) 20 kV/mm; (c) 25 kV/mm; (d) 30 kV/mm.
图 6 不同外加电场下聚丙烯样品内部的局部电场分布 (a) 15 kV/mm; (b) 20 kV/mm; (c) 25 kV/mm; (d) 30 kV/mm
Figure 6. Electric field distribution inside PP samples under different applied electric fields: (a) 15 kV/mm; (b) 20 kV/mm; (c) 25 kV/mm; (d) 30 kV/mm.
图 7 聚丙烯样品内电子的迁移速率与局部电场的关系
Figure 7. Migration rate of electrons as a function of the local electric field inside PP samples.
图 8 聚甲基丙烯酸甲酯样品内电子的迁移速率与局部电场的关系
Figure 8. Migration rate of electrons as a function of the local electric field inside PMMA samples.
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[1] 杜伯学, 韩晨磊, 李进, 李忠磊 2019 电工技术学报 34 179
Google Scholar
Du B X, Han C L, Li J, Li Z L 2019 Trans. Chin. Electrotech. Soc. 34 179
Google Scholar
[2] 屠德民, 王霞, 吕泽鹏, 吴锴, 彭宗仁 2012 61 017104
Google Scholar
Tu D M, Wang X, Lü Z P, Wu K, Peng Z R 2012 Acta Phys. Sin. 61 017104
Google Scholar
[3] Zhang Y W, Lewiner J 1996 IEEE Trans. Dielectr. Electr. Insul. 3 778
Google Scholar
[4] Hozumi N, Suzuki H 1994 IEEE Trans. Dielectr. Electr. Insul. 1 1068
Google Scholar
[5] Matsui K, Tanaka Y, Takada T, Fukao T, Fukunaga K, Maeno T, Alison J M 2005 IEEE Trans. Dielectr. Electr. Insul. 12 406
Google Scholar
[6] 夏俊峰, 张冶文, 郑飞虎, 雷清泉 2009 58 8529
Google Scholar
Xia J F, Zhang Y W, Zheng F H, Lei Q Q 2009 Acta Phys. Sin. 58 8529
Google Scholar
[7] Zheng F H, Zhang Y W, Gong B, Zhu J W, Wu C S 2005 Sci. China Ser. E: Technol. Sci. 48 354
Google Scholar
[8] Kon H, Suzuoki Y, Mizutani T, Ieda M, Yoshifuji N 1996 IEEE Trans. Dielectr. Electr. Insul. 3 380
Google Scholar
[9] Hozumi N, Takeda T, Suzuki H, Okamoto T 1998 IEEE Trans. Dielectr. Electr. Insul. 5 82
Google Scholar
[10] Fabiani D, Montanari G, Dissado L, Laurent C, Teyssedre G 2009 IEEE Trans. Dielectr. Electr. Insul. 16 241
Google Scholar
[11] Zhao J, Chen G, Lewin P L 2012 J. Appl. Phys. 112 034116
Google Scholar
[12] 夏俊峰, 张冶文, 郑飞虎, 雷清泉 2010 59 508
Google Scholar
Xia J F, Zhang Y W, Zheng F H, Lei Q Q 2010 Acta Phys. Sin. 59 508
Google Scholar
[13] Xia J F, Zhang Y W, Zheng F H, An Z L, Lei Q Q 2011 J. Appl. Phys. 109 034101
Google Scholar
[14] 张冶文, 赵晖, 郭世忠, 郑飞虎, 安振连 2016 电工技术学报 31 145
Google Scholar
Zhang Y W, Zhao H, Guo Sh Z, Zheng F H, An Z L 2016 Trans. Chin. Electrotech. Soc. 31 145
Google Scholar
[15] 金维芳 1997 电介质物理学 (北京: 机械工业出版社) 第116页
Jin W F 1997 Dielectric Physics (Beijing: China Machine Press) p116
[16] 郑飞虎, 张冶文, 吴长顺, 李吉晓, 夏钟福 2003 52 1137
Google Scholar
Zheng F H, Zhang Y W, Wu C S, Li J X, Xia Z F 2003 Acta Phys. Sin. 52 1137
Google Scholar
[17] Weber K H 1963 Nucl. Instrum. Methods 25 261
Google Scholar
[18] Ieda M 1984 IEEE Trans. Electr. Insul. EI-19 162
Google Scholar
[19] 夏钟福 2001 驻极体 (北京: 科学出版社) 第199—206页
Xia Z F 2001 Electret (Beijing: China Science Press) pp199–206
[20] Jones J P, Llewellyn J P, Lewis T J 2005 IEEE Trans. Dielectr. Electr. Insul. 12 951
Google Scholar
[21] Chen G, Zhao J 2011 J. Phys. D: Appl. Phys. 44 212001
Google Scholar
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