He Yu, Chen Wei-Bin, Hong Bin, Huang Wen-Tao, Zhang Kun, Chen Lei, Feng Xue-Qiang, Li Bo, Liu Guo, Sun Xiao-Han, Zhao Meng, Zhang Yue. Significant role of thermal effects in current-induced exchange bias field switching at antiferromagnet/ferromagnet interfaceJ. Acta Physica Sinica, 2024, 73(2): 027501. DOI: 10.7498/aps.73.20231374