Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

A 1/f noise based research of radiation induced interface trap buildup process

Li Rui-Min Du Lei Zhuang Yi-Qi Bao Jun-Lin

Citation:

A 1/f noise based research of radiation induced interface trap buildup process

Li Rui-Min, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

Metrics
  • Abstract views:  8901
  • PDF Downloads:  1135
  • Cited By: 0
Publishing process
  • Received Date:  04 September 2005
  • Accepted Date:  22 September 2006
  • Published Online:  05 March 2007

/

返回文章
返回
Baidu
map