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Zhang Song-Ran, He Dai-Hua, Tu Hua-Yao, Sun yan, Kang Ting-Ting, Dai Ning, Chu Jun-Hao, Yu Guo-Lin. Magnetotransport properties and stress control of HgCdTe thin film. Acta Physica Sinica,
2020, 69(5): 057301.
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Wang Xiao-Ka, Tang Fu-Ling, Xue Hong-Tao, Si Feng-Juan, Qi Rong-Fei, Liu Jing-Bo. First-principles study of H, Cl and F passivation for Cu2ZnSnS4(112) surface states. Acta Physica Sinica,
2018, 67(16): 166401.
doi: 10.7498/aps.67.20180626
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Shen Dan-Ping, Zhang Xiao-Dong, Sun Yan, Kang Ting-Ting, Dai Ning, Chu Jun-Hao, Yu Guo-Lin. Magnetotransport property of negative band gap HgCdTe bulk material. Acta Physica Sinica,
2017, 66(24): 247301.
doi: 10.7498/aps.66.247301
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Zhao Qi-Feng, Zhuang Yi-Qi, Bao Jun-Lin, Hu Wei. Quantitative separation of radiation induced charges for NPN bipolar junction transistors based on 1/f noise model. Acta Physica Sinica,
2015, 64(13): 136104.
doi: 10.7498/aps.64.136104
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Xue Yuan, Gao Chao-Jun, Gu Jin-Hua, Feng Ya-Yang, Yang Shi-E, Lu Jing-Xiao, Huang Qiang, Feng Zhi-Qiang. Study on the properties and optical emission spectroscopy of the intrinsic silicon thin film in silicon heterojunction solar cells. Acta Physica Sinica,
2013, 62(19): 197301.
doi: 10.7498/aps.62.197301
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Chen Hai-Peng, Cao Jun-Sheng, Guo Shu-Xu. Temperature-dependent relation between junction temperature and 1/f noise in high power semiconductor laser. Acta Physica Sinica,
2013, 62(10): 104209.
doi: 10.7498/aps.62.104209
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Li Yang, Guo Shu-Xu. A new method to estimate the parameter of 1/f Noise of high power semiconductor laser diode based on sparse decomposition. Acta Physica Sinica,
2012, 61(3): 034208.
doi: 10.7498/aps.61.034208
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Wu Shao-Bing, Chen Shi, Li Hai, Yang Xiao-Fei. Researching progress of the 1/f noise in TMR and GMR sensors. Acta Physica Sinica,
2012, 61(9): 097504.
doi: 10.7498/aps.61.097504
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Gao Kuang-Hong, Wei Lai-Ming, Yu Guo-Lin, Yang Rui, Lin Tie, Wei Yan-Feng, Yang Jian-Rong, Sun Lei, Dai Ning, Chu Jun-Hao. Magnetotransport property of HgCdTe inversion layer. Acta Physica Sinica,
2012, 61(2): 027301.
doi: 10.7498/aps.61.027301
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Dai Yu, Zhang Jian-Xun. Reduction of 1/f noise in semiconductor devices based on wavelet transform and Wiener filter. Acta Physica Sinica,
2011, 60(11): 110516.
doi: 10.7498/aps.60.110516
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Pan Shu-Wan, Qi Dong-Feng, Chen Song-Yan, Li Cheng, Huang Wei, Lai Hong-Kai. Se ultrathin film growth on Si(100) substrate and its application in Ti/n-Si(100) ohmic contact. Acta Physica Sinica,
2011, 60(9): 098108.
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Chen Wen-Hao, Du Lei, Yin Xue-Song, Kang Li, Wang Fang, Chen Song. Investigation on the low-freauency noise physical models and the defects' characterization of the PbS infrared dectector. Acta Physica Sinica,
2011, 60(10): 107202.
doi: 10.7498/aps.60.107202
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Bao Jun-Lin, Lin Li-Yan, He Liang, Du Lei. Noise as a characteriscic for current transmitting rateof optoelectronic coupled devicesfor ionization radiation damage. Acta Physica Sinica,
2011, 60(4): 047202.
doi: 10.7498/aps.60.047202
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Yin Fei, Hu Wei-Da, Quan Zhi-Jue, Zhang Bo, Hu Xiao-Ning, Li Zhi-Feng, Chen Xiao-Shuang, Lu Wei. Determination of electron diffusion length in HgCdTe photodiodes using laser beam induced current. Acta Physica Sinica,
2009, 58(11): 7884-7890.
doi: 10.7498/aps.58.7884
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Zhang Zhen-Guo, Gao Feng-Li, Guo Shu-Xu, Li Xue-Yan, Yu Si-Yao. A novel method to estimate the parameters of 1/f noise of semiconductor laser diodes. Acta Physica Sinica,
2009, 58(4): 2772-2775.
doi: 10.7498/aps.58.2772
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Liu Gui-Li. Electronic theoretical study on the corrosion and passivation mechanism of Ti metal. Acta Physica Sinica,
2008, 57(7): 4441-4445.
doi: 10.7498/aps.57.4441
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Zhang Guo-Ying, Zhang Hui, Liu Yan-Xia, Yang Li-Na. The electronic theory study of the influence of Pd on the passivation of Ti alloys. Acta Physica Sinica,
2008, 57(4): 2404-2408.
doi: 10.7498/aps.57.2404
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Yang Li-Xia, Du Lei, Bao Jun-Lin, Zhuang Yi-Qi, Chen Xiao-Dong, Li Qun-Wei, Zhang Ying, Zhao Zhi-Gang, He Liang. The effect of 60Co γ-ray irradiation on the 1/f noise of Schottky barrier diodes. Acta Physica Sinica,
2008, 57(9): 5869-5874.
doi: 10.7498/aps.57.5869
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Li Rui-Min, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin. A 1/f noise based research of radiation induced interface trap buildup process. Acta Physica Sinica,
2007, 56(6): 3400-3406.
doi: 10.7498/aps.56.3400
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Bao Jun-Lin, Zhuang Yi-Qi, Du Lei, Li Wei-Hua, Wan Chang-Xing, Zhang Ping. A unified model for 1/f noise in n-channel and p-channel MOSFETs. Acta Physica Sinica,
2005, 54(5): 2118-2122.
doi: 10.7498/aps.54.2118
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