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Noise as a representation for reliability of light emitting diode

Hu Jin Du Lei Zhuang Yi-Qi Bao Jun-Lin Zhou Jiang

Citation:

Noise as a representation for reliability of light emitting diode

Hu Jin, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, Zhou Jiang
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(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

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  • Abstract views:  9927
  • PDF Downloads:  1808
  • Cited By: 0
Publishing process
  • Received Date:  09 December 2005
  • Accepted Date:  18 December 2005
  • Published Online:  20 March 2006

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