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The photo-induced insulator-metal transition for silicon-based VO2 nanofilm is studied by THz time-domain spectroscopy (THz-TDS). Obvious variations of THz ray transmittance are observed before and after the CW laser beam exciting, and the conductivity of metallic-phased VO2 film in the THz region is calculated in the thin film approximation. According to the measured results, the metallic-phased VO2 film is characterized equivalently with Drude’s model, and complex conductivity, dielectric function and refractive index are acquired by the model. As an examination on the equivalent Drude model, numerical simulation based on the finite integral method in time domain is carried out. The results show that they are in good agreement with the experimental results. This work provides a reference for the study on phase transition of VO2 nanofilm and its application in the THz region.
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Keywords:
- Vandium dioxide /
- photo-induced phase transition /
- Drude model /
- THz-TDS
[1] Morin F 1959 Phys. Rev. Lett. 3 34
[2] Zylbersztejn A, Mott N F 1975 Phys. Rev. B 11 4383
[3] Muraoka Y, Yamauchi T, Ueda Y, Hiroi Z 2002 J. Phys.: Condens. Matter 14 757
[4] Arcangeletti E, Baldassarre L, Castro D D, Lupi S, Malavasi L, Marini C, Perucchi A, Postorino P 2007 Phys. Rev. Lett. 98 196406
[5] Stefanovich G, Pergament A, Stefanovich D 2000 J. Phys.: Condens. Matter 12 8837
[6] Ben-Messaoud T, Landry G, Gariépy J P, Ramamoorthy B, Ashrit P V, Haché A 2008 Opt. Commun. 281 6024
[7] Manning T, Parkin I, Clark R, Sheel D, Pemble M, Vernadou D 2002 J. Mater. Chem. 12 2936
[8] Bugayev A A, Gupta M C 2003 Opt. Lett. 28 1463
[9] Rini M, Hao Z, Schoenlein R W, Giannetti C, Parmigiani F, Fourmaux S, Kieffer J C, Fujimori A, Onoda M, Wall S, Cavalleri A 2008 Appl. Phys. Lett. 92 181904
[10] Chen S H, Ma H, Yi X J, Xiong T, Wang H C, Ke C J 2004 Sens. Actuators, A: Phys 115 28
[11] Wang L X, Li J P, He X L, Gao X G 2006 Acta Phys. Sin. 55 2851(in Chinese) [王利霞、李建平、何秀丽、高晓光 2006 55 2851]
[12] Zhang H, Liu Y S, Liu W H, Wang B Y, Wei L 2007 Acta Phys. Sin. 56 7255 (in Chinese) [张 辉、刘应书、刘文海、王宝义、魏 龙 2007 56 7255]
[13] Nihei Y, Sasakawa Y, Okimura K 2008 Thin Solid Films 516 3572
[14] Kim H K, You H, Chiarello R P, Chang H L M, Zhang T J, Lam D J 1993 Phys. Rev. B 47 12900
[15] Lysenko S, Rua A J, Vikhnin V, Jimenez J, Fernandez F, Liu H 2006 Appl. Surf. Sci. 252 5512
[16] Saitzek S, Guinneton F, Guirleo G, Sauques L, Aguir K, Gavarri J 2008 Thin Solid Films 516 891
[17] Nakajima M, Takubo N, Hiroi Z, Ueda Y, Suemoto T 2008 Appl. Phys. Lett. 92 011907
[18] Borek M, Qian F, Nagabushnam V, Singh R K 1993 Appl. Phys. Lett. 63 3288
[19] Kim D H, Kwok H S 1994 Appl. Phys. Lett. 65 3188
[20] Wang H C, Yi X J, Li Y 2005 Opt. Commun.256 305
[21] Yang Y F, Long H, Yang G, Zheng Q G, Li Y H, Lu P X 2009 Acta Phys. Sin. 58 2785(in Chinese) [杨义发、龙华、杨 光、郑启光、李玉华、陆培祥 2009 58 2785]
[22] Deng J X, Zhang X K, Yao Q, Wang X Y, Chen G H, He D Y 2009 Chin. Phys. B 18 4013
[23] Yan J F, Wang T, Wang J W, Zhang Z Y, Zhao W 2009 Chin. Phys. B 18 320
[24] Nuss M C, Goossen K W, Gordon J, Mankiewich P M, O'Malley M L, Bhushan M 1991 J. Appl. Phys. 70 2238
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[1] Morin F 1959 Phys. Rev. Lett. 3 34
[2] Zylbersztejn A, Mott N F 1975 Phys. Rev. B 11 4383
[3] Muraoka Y, Yamauchi T, Ueda Y, Hiroi Z 2002 J. Phys.: Condens. Matter 14 757
[4] Arcangeletti E, Baldassarre L, Castro D D, Lupi S, Malavasi L, Marini C, Perucchi A, Postorino P 2007 Phys. Rev. Lett. 98 196406
[5] Stefanovich G, Pergament A, Stefanovich D 2000 J. Phys.: Condens. Matter 12 8837
[6] Ben-Messaoud T, Landry G, Gariépy J P, Ramamoorthy B, Ashrit P V, Haché A 2008 Opt. Commun. 281 6024
[7] Manning T, Parkin I, Clark R, Sheel D, Pemble M, Vernadou D 2002 J. Mater. Chem. 12 2936
[8] Bugayev A A, Gupta M C 2003 Opt. Lett. 28 1463
[9] Rini M, Hao Z, Schoenlein R W, Giannetti C, Parmigiani F, Fourmaux S, Kieffer J C, Fujimori A, Onoda M, Wall S, Cavalleri A 2008 Appl. Phys. Lett. 92 181904
[10] Chen S H, Ma H, Yi X J, Xiong T, Wang H C, Ke C J 2004 Sens. Actuators, A: Phys 115 28
[11] Wang L X, Li J P, He X L, Gao X G 2006 Acta Phys. Sin. 55 2851(in Chinese) [王利霞、李建平、何秀丽、高晓光 2006 55 2851]
[12] Zhang H, Liu Y S, Liu W H, Wang B Y, Wei L 2007 Acta Phys. Sin. 56 7255 (in Chinese) [张 辉、刘应书、刘文海、王宝义、魏 龙 2007 56 7255]
[13] Nihei Y, Sasakawa Y, Okimura K 2008 Thin Solid Films 516 3572
[14] Kim H K, You H, Chiarello R P, Chang H L M, Zhang T J, Lam D J 1993 Phys. Rev. B 47 12900
[15] Lysenko S, Rua A J, Vikhnin V, Jimenez J, Fernandez F, Liu H 2006 Appl. Surf. Sci. 252 5512
[16] Saitzek S, Guinneton F, Guirleo G, Sauques L, Aguir K, Gavarri J 2008 Thin Solid Films 516 891
[17] Nakajima M, Takubo N, Hiroi Z, Ueda Y, Suemoto T 2008 Appl. Phys. Lett. 92 011907
[18] Borek M, Qian F, Nagabushnam V, Singh R K 1993 Appl. Phys. Lett. 63 3288
[19] Kim D H, Kwok H S 1994 Appl. Phys. Lett. 65 3188
[20] Wang H C, Yi X J, Li Y 2005 Opt. Commun.256 305
[21] Yang Y F, Long H, Yang G, Zheng Q G, Li Y H, Lu P X 2009 Acta Phys. Sin. 58 2785(in Chinese) [杨义发、龙华、杨 光、郑启光、李玉华、陆培祥 2009 58 2785]
[22] Deng J X, Zhang X K, Yao Q, Wang X Y, Chen G H, He D Y 2009 Chin. Phys. B 18 4013
[23] Yan J F, Wang T, Wang J W, Zhang Z Y, Zhao W 2009 Chin. Phys. B 18 320
[24] Nuss M C, Goossen K W, Gordon J, Mankiewich P M, O'Malley M L, Bhushan M 1991 J. Appl. Phys. 70 2238
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