Lu Chao, Chen Wei, Luo Yin-Hong, Ding Li-Li, Wang Xun, Zhao Wen, Guo Xiao-Qiang, Li Sai. Effect of source-drain conduction in single-event transient on nanoscaled bulk fin field effect transistorJ. Acta Physica Sinica, 2020, 69(8): 086101. DOI: 10.7498/aps.69.20191896