Li Hua-Mei, Hou Peng-Fei, Wang Jin-Bin, Song Hong-Jia, Zhong Xiang-Li. Single-event-upset effect simulation of HfO2-based ferroelectric field effect transistor read and write circuitsJ. Acta Physica Sinica, 2020, 69(9): 098502. DOI: 10.7498/aps.69.20200123