-
In both PIN-type and NIP-type thin film silicon solar cells, textured light trapping substrates are used to enhance light absorption and improve energy conversion efficiencies. Scalar scattering theory is used to simulate the light trapping performance of textured substrates. The results indicate that in order to get good light trapping performance, the root mean square (RMS) for front reflectors in PIN-type solar cells should be at least 160 nm, while it is only 40 nm for back reflectors in NIP-type solar cells. A series of a-SiGe:H single-junction solar cells is deposited on back reflectors with different RMS values. It is found that a-SiGe:H solar cells deposited on back reflectors with RMS values of 40 and 61.5 nm demonstrate similar short current density values and quantum efficiencies. These results indicate that RMS value of 40 nm is enough to get good light trapping performance, which is consistent with the numerical simulation.
-
Keywords:
- light trapping structure /
- haze /
- scalar scattering theory /
- thin film silicon solar cells
[1] Schropp R E I, Zeman M 1998 Amorphous and Microcrystalline Silicon Solar Cells: Modeling, Materials and Device Technology (1st Ed.) (Boston: Kluwer Academic)
[2] Berginski M, Hpkes J, Gordijn A, Reetza W, Wätjen T, Rech B, Wuttig M 2008 Sol. Energ. Mat. Sol. C 92 1037
[3] Deckman H W, Wronski C R, Witzke H, Yablonovitch E 1983 Appl. Phys. Lett. 42 968
[4] Meng X Q, Drouard E, Gomard G, Peretti R, Fave A, Seassal C 2012 Opt. Express 20 A560
[5] Boccard M, Battaglia C, Hänni S, Söderström K, Escarré J, Nicolay S, Meillaud F, Despeisse M, Ballif C 2012 Nano Lett. 12 1344
[6] Python M, Madani O, Domine D, Meillaud F, Vallat-Sauvain E, Ballif C 2009 Sol. Energ. Mat. Sol. C 93 1714
[7] Ding L, Boccard M, Bugnon G, Benkhaira M, Nicolay S, Despeisse M, Meillaud F, Ballif C 2012 Sol. Energ. Mat. Sol. C 98 331
[8] Battaglia C, Escarré J, Söderström K, Charriére M, Despeisse M, Haug F J, Ballif C 2011 Nat. Photonics 5 535
[9] Hou G F, Xue J M, Yuan Y J, Zhang X D, Sun J, Chen X L, Geng X H, Zhao Y 2012 Acta Phys. Sin. 61 058403 (in Chinese) [侯国付, 薛俊明, 袁育杰, 张晓丹, 孙建, 陈新亮, 耿新华, 赵颖 2012 61 058403]
[10] Haug F J, Sonderstrom T, Python M, Terrazzoni-Daudrix V, Niquille X, Ballif C 2009 Sol. Energ. Mat. Sol. C 93 884
[11] Dahal L R, Sainju D, Podraza N J, Marsillac S, Collins R W 2011 Thin Solid Films 519 2682
[12] Yan B J, Yue G Z, Sivec L, Owens-Mawson J, Yang J, Guha S 2012 Sol. Energ. Mat. Sol. C 104 13
[13] Saito K, Sano M, Okabe S, Sugiyama S, Ogawa K 2005 Sol. Energ. Mat. Sol. C 86 565
[14] Li H B B T, Franken R H, Rath J K, Schropp R E I 2009 Sol. Energ. Mat. Sol. C 93 338
[15] Born M, Wolf E 1999 Principles of Optics (7th Ed.) (Cambridge: Cambridge University Press) chapter 8
[16] Beckmann P, Spizzichino A 1963 The Scattering of Electromagnetic Waves from Rough Surfaces (1st Ed.) (New York: Pergamon)
[17] Macleod H A 1986 Thin-Film Optical Filters (2nd Ed.) (New York: Macmillan)
[18] Carniglia C K 1979 Opt. Eng. 18 104
[19] Bennett H E, Porteus J O 1961 J. Opt. Soc. Am. 51 123
[20] Zeman M, van Swaaij R A C M M, Metselaar J W, Schropp R E I 2000 J. Appl. Phys. 88 6436
[21] Krc J, Zeman M, Smole F, Topic M 2002 J. Appl. Phys. 92 749
[22] Krc J, Zeman M, Smole F, Topic M 2004 Thin Solid Films 451 298
[23] Lipovsek B, Krc J, Isabella O, Zeman M, Topic M 2010 J. Appl. Phys. 108 103115
[24] Krc J, Zeman M, Kluth O, Smole F, Topic M 2003 Thin Solid Films 426 296
[25] Bittkau K, Böttler W, Ermes M, Smirnov V, Finger F 2012 J. Appl. Phys. 111 083101
-
[1] Schropp R E I, Zeman M 1998 Amorphous and Microcrystalline Silicon Solar Cells: Modeling, Materials and Device Technology (1st Ed.) (Boston: Kluwer Academic)
[2] Berginski M, Hpkes J, Gordijn A, Reetza W, Wätjen T, Rech B, Wuttig M 2008 Sol. Energ. Mat. Sol. C 92 1037
[3] Deckman H W, Wronski C R, Witzke H, Yablonovitch E 1983 Appl. Phys. Lett. 42 968
[4] Meng X Q, Drouard E, Gomard G, Peretti R, Fave A, Seassal C 2012 Opt. Express 20 A560
[5] Boccard M, Battaglia C, Hänni S, Söderström K, Escarré J, Nicolay S, Meillaud F, Despeisse M, Ballif C 2012 Nano Lett. 12 1344
[6] Python M, Madani O, Domine D, Meillaud F, Vallat-Sauvain E, Ballif C 2009 Sol. Energ. Mat. Sol. C 93 1714
[7] Ding L, Boccard M, Bugnon G, Benkhaira M, Nicolay S, Despeisse M, Meillaud F, Ballif C 2012 Sol. Energ. Mat. Sol. C 98 331
[8] Battaglia C, Escarré J, Söderström K, Charriére M, Despeisse M, Haug F J, Ballif C 2011 Nat. Photonics 5 535
[9] Hou G F, Xue J M, Yuan Y J, Zhang X D, Sun J, Chen X L, Geng X H, Zhao Y 2012 Acta Phys. Sin. 61 058403 (in Chinese) [侯国付, 薛俊明, 袁育杰, 张晓丹, 孙建, 陈新亮, 耿新华, 赵颖 2012 61 058403]
[10] Haug F J, Sonderstrom T, Python M, Terrazzoni-Daudrix V, Niquille X, Ballif C 2009 Sol. Energ. Mat. Sol. C 93 884
[11] Dahal L R, Sainju D, Podraza N J, Marsillac S, Collins R W 2011 Thin Solid Films 519 2682
[12] Yan B J, Yue G Z, Sivec L, Owens-Mawson J, Yang J, Guha S 2012 Sol. Energ. Mat. Sol. C 104 13
[13] Saito K, Sano M, Okabe S, Sugiyama S, Ogawa K 2005 Sol. Energ. Mat. Sol. C 86 565
[14] Li H B B T, Franken R H, Rath J K, Schropp R E I 2009 Sol. Energ. Mat. Sol. C 93 338
[15] Born M, Wolf E 1999 Principles of Optics (7th Ed.) (Cambridge: Cambridge University Press) chapter 8
[16] Beckmann P, Spizzichino A 1963 The Scattering of Electromagnetic Waves from Rough Surfaces (1st Ed.) (New York: Pergamon)
[17] Macleod H A 1986 Thin-Film Optical Filters (2nd Ed.) (New York: Macmillan)
[18] Carniglia C K 1979 Opt. Eng. 18 104
[19] Bennett H E, Porteus J O 1961 J. Opt. Soc. Am. 51 123
[20] Zeman M, van Swaaij R A C M M, Metselaar J W, Schropp R E I 2000 J. Appl. Phys. 88 6436
[21] Krc J, Zeman M, Smole F, Topic M 2002 J. Appl. Phys. 92 749
[22] Krc J, Zeman M, Smole F, Topic M 2004 Thin Solid Films 451 298
[23] Lipovsek B, Krc J, Isabella O, Zeman M, Topic M 2010 J. Appl. Phys. 108 103115
[24] Krc J, Zeman M, Kluth O, Smole F, Topic M 2003 Thin Solid Films 426 296
[25] Bittkau K, Böttler W, Ermes M, Smirnov V, Finger F 2012 J. Appl. Phys. 111 083101
Catalog
Metrics
- Abstract views: 8040
- PDF Downloads: 943
- Cited By: 0
下载:
