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2020, 69(1): 018101.
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Wang Dang-Hui, Xu Tian-Han. Low-frequency generation-recombination noise behaviors of blue/violet-light-emitting diode. Acta Physica Sinica,
2019, 68(12): 128104.
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2019, 68(15): 158504.
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2018, 67(10): 104205.
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Jia Bo-Lun, Deng Ling-Ling, Chen Ruo-Xi, Zhang Ya-Nan, Fang Xu-Min. Numerical research of emission properties of localized surface plasmon resonance enhanced light-emitting diodes based on Ag@SiO2 nanoparticles. Acta Physica Sinica,
2017, 66(23): 237801.
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2015, 64(5): 050701.
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2014, 63(6): 068103.
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2012, 61(12): 127807.
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2012, 61(1): 018503.
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2011, 60(7): 074219.
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2010, 59(7): 4996-5001.
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2009, 58(5): 3421-3426.
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2009, 58(10): 7189-7193.
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2008, 57(1): 472-476.
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2007, 56(10): 6003-6007.
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Hu Jin, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, Zhou Jiang. Noise as a representation for reliability of light emitting diode. Acta Physica Sinica,
2006, 55(3): 1384-1389.
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2006, 55(3): 1424-1429.
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