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The extraction method for trap parameters in 4H-SiC MESFETs

Lü Hong-Liang Zhang Yi-Men Zhang Yu-Ming Che Yong Wang Yue-Hu Chen Liang

Citation:

The extraction method for trap parameters in 4H-SiC MESFETs

Lü Hong-Liang, Zhang Yi-Men, Zhang Yu-Ming, Che Yong, Wang Yue-Hu, Chen Liang
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  • Abstract views:  8037
  • PDF Downloads:  690
  • Cited By: 0
Publishing process
  • Received Date:  09 May 2007
  • Accepted Date:  18 July 2007
  • Published Online:  28 May 2008

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