-
For investigating the mechanism of high power microwave flashover and breakdown on dielectric surface with outgassing, firstly, the theoretical modeling is put forward, including dynamic equations, particle-in-cell (PIC) method, secondary emission, Monte-Carlo collision (MCC) method and outgassing model. Secondly, based on the theoretical modeling, the 1D3V PIC-MCC code is programmed by authors. By using this code, the flashover and breakdown on dielectric surface with weak and strong outgassing course under different gas moving velocities are studied numerically. The numerical results are concluded in the following. The flashover and breakdown on dielectric surface are caused by continuous increase of deposited power. For weak outgassing, multipacting is dominant. As outgassing coefficient increases, multipacting is promoted by ionization collision. The typical phenomena are the increases of space-charge field, average energy of surface-collision electrons and the number of surface-collision electrons. Here, the surface-collision electrons are caused by multipacting mostly. With the increase of gas molecule velocity, ionization course is suppressed by gas pressure decreasing near to the dielectric surface. For strong outgassing, ionization collision is dominant. As outgassing coefficient increases, the number of ions increases exponentially with ionization frequency increasing, multipacting is suppressed by ionization collision. The typical phenomena are the negative value of space-charge field on dielectric surface, the decrease of average energy of surface-collision electrons, and the exponential increase of surface-collision electrons caused by ionization collision near to dielectric surface. Here, the surface-collision electrons are caused by ionization mostly. With the increase of gas molecule velocity, the depth of gas is enlarged, thereby promoting the ionization collision.
-
Keywords:
- high power microwave /
- surface outgassing /
- flashover and breakdown on dielectric surface /
- MCC-PIC
[1] Barker R J, Schamiloglu E 2001 High-power Microwaves Sources and Technologies (Piscataway, New Jersey: IEEE Press, 2001) pp325–375
[2] Neuber A, Edmiston G, Krile J 2007 IEEE Trans on Magnetics 43 496
[3] Ford P J, Beeson S R, Krompholz H G, Neuber A A 2012 Phys. Plasmas 19 073503
[4] Chang C, Liu G, Tang C, Chen C, Fang J, Hou Q 2008 Phys. Plasmas 15 093508
[5] Chang C, Liu G, Tang C, Chen C, Fang J 2011 Phys. Plasmas 18 055702
[6] Zhang P, Lau Y Y, Franzi M, Gilgenbach R M 2011 Phys. Plasmas 19 053508
[7] Kim H C, Verboncoeur J P 2005 Phys. Plasmas 12 123504
[8] Kim H C, Verboncoeur J P 2007 IEEE Trans. on Dielectr. Electr. Insul. 14 766
[9] Cai L B, Wang J G 2011 Acta Phys. Sin. 60 025217 (in Chinese) [蔡利兵, 王建国 2011 60 025217]
[10] Cai L B, Wang J G 2009 Acta Phys. Sin. 58 3268 (in Chinese) [蔡利兵, 王建国 2009 58 3268]
[11] Dong Y, Zhou Q H, Dong Z W, Yang W Y, Zhou H J, Sun H F 2013 High Power Laser and Particle Beams 25 950 (in Chinese) [董烨, 周前红, 董志伟, 杨温渊, 周海京, 孙会芳 2013 强激光与粒子束 25 950]
[12] Dong Y, Dong Z W, Zhou Q H, Yang W Y, Zhou H J 2013 High Power Laser and Particle Beams 25 1215 (in Chinese) [董烨, 董志伟, 周前红, 杨温渊, 周海京 2013 强激光与粒子束 25 1215]
[13] Vaughan J R M 1993 IEEE Trans Electron Dev. 40 830
[14] Vahedi V, Surendra M 1995 Comp. Phys. Commun. 87 179
[15] Anderson R A, Brainard J P 1980 J. Appl. Phys. 51 1414
-
[1] Barker R J, Schamiloglu E 2001 High-power Microwaves Sources and Technologies (Piscataway, New Jersey: IEEE Press, 2001) pp325–375
[2] Neuber A, Edmiston G, Krile J 2007 IEEE Trans on Magnetics 43 496
[3] Ford P J, Beeson S R, Krompholz H G, Neuber A A 2012 Phys. Plasmas 19 073503
[4] Chang C, Liu G, Tang C, Chen C, Fang J, Hou Q 2008 Phys. Plasmas 15 093508
[5] Chang C, Liu G, Tang C, Chen C, Fang J 2011 Phys. Plasmas 18 055702
[6] Zhang P, Lau Y Y, Franzi M, Gilgenbach R M 2011 Phys. Plasmas 19 053508
[7] Kim H C, Verboncoeur J P 2005 Phys. Plasmas 12 123504
[8] Kim H C, Verboncoeur J P 2007 IEEE Trans. on Dielectr. Electr. Insul. 14 766
[9] Cai L B, Wang J G 2011 Acta Phys. Sin. 60 025217 (in Chinese) [蔡利兵, 王建国 2011 60 025217]
[10] Cai L B, Wang J G 2009 Acta Phys. Sin. 58 3268 (in Chinese) [蔡利兵, 王建国 2009 58 3268]
[11] Dong Y, Zhou Q H, Dong Z W, Yang W Y, Zhou H J, Sun H F 2013 High Power Laser and Particle Beams 25 950 (in Chinese) [董烨, 周前红, 董志伟, 杨温渊, 周海京, 孙会芳 2013 强激光与粒子束 25 950]
[12] Dong Y, Dong Z W, Zhou Q H, Yang W Y, Zhou H J 2013 High Power Laser and Particle Beams 25 1215 (in Chinese) [董烨, 董志伟, 周前红, 杨温渊, 周海京 2013 强激光与粒子束 25 1215]
[13] Vaughan J R M 1993 IEEE Trans Electron Dev. 40 830
[14] Vahedi V, Surendra M 1995 Comp. Phys. Commun. 87 179
[15] Anderson R A, Brainard J P 1980 J. Appl. Phys. 51 1414
Catalog
Metrics
- Abstract views: 6743
- PDF Downloads: 575
- Cited By: 0
下载:
