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中国物理学会期刊
Ma Zhen-Yang, Chai Chang-Chun, Ren Xing-Rong, Yang Yin-Tang, Qiao Li-Ping, Shi Chun-Lei. The damage effect and mechanism of the bipolar transistor induced by different types of high power microwavesJ. Acta Physica Sinica, 2013, 62(12): 128501. DOI: 10.7498/aps.62.128501
Citation: Ma Zhen-Yang, Chai Chang-Chun, Ren Xing-Rong, Yang Yin-Tang, Qiao Li-Ping, Shi Chun-Lei. The damage effect and mechanism of the bipolar transistor induced by different types of high power microwavesJ. Acta Physica Sinica, 2013, 62(12): 128501. DOI: 10.7498/aps.62.128501

    The damage effect and mechanism of the bipolar transistor induced by different types of high power microwaves

    CSTR: 32037.14.aps.62.128501
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