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Three-dimensional numerial simulation of single event upset effects in static random access memory

Zhang Ke-Ying Guo Hong-Xia Luo Yin-Hong He Bao-Ping Yao Zhi-Bin Zhang Feng-Qi Wang Yuan-Ming

Citation:

Three-dimensional numerial simulation of single event upset effects in static random access memory

Zhang Ke-Ying, Guo Hong-Xia, Luo Yin-Hong, He Bao-Ping, Yao Zhi-Bin, Zhang Feng-Qi, Wang Yuan-Ming
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  • Abstract views:  8965
  • PDF Downloads:  1193
  • Cited By: 0
Publishing process
  • Received Date:  05 January 2009
  • Accepted Date:  18 April 2009
  • Published Online:  05 June 2009

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