| [1] |
Hao Guang-Hui, Li Ze-Peng, Gao Yu-Juan, Zhou Ya-Kun. Effect of surface topography on emission properties of hot-cathode. Acta Physica Sinica,
2019, 68(3): 037901.
doi: 10.7498/aps.68.20181725
|
| [2] |
Wang Yi, Guo Zhe, Zhu Li-Da, Zhou Hong-Xian, Ma Zhen-He. Nanoscale surface topography imaging using phase-resolved spectral domain optical coherence tomography. Acta Physica Sinica,
2017, 66(15): 154202.
doi: 10.7498/aps.66.154202
|
| [3] |
Tao Hai-Yan, Chen Rui, Song Xiao-Wei, Chen Ya-Nan, Lin Jing-Quan. Femtosecond laser pulse energy accumulation optimization effect on surface morphology of black silicon. Acta Physica Sinica,
2017, 66(6): 067902.
doi: 10.7498/aps.66.067902
|
| [4] |
Lu Yong-Jun, Yang Yi, Wang Feng-Hui, Lou Kang, Zhao Xiang. Effect of continuously graded functional layer on curvature and residual stress of solid oxide fuel cell in initial reduction process. Acta Physica Sinica,
2016, 65(9): 098102.
doi: 10.7498/aps.65.098102
|
| [5] |
Zhou Xun, Luo Zi-Jiang, Wang Ji-Hong, Guo Xiang, Ding Zhao. Effect of low As pressure annealing on the morphology and reconstruction of GaAs (001). Acta Physica Sinica,
2015, 64(21): 216803.
doi: 10.7498/aps.64.216803
|
| [6] |
Yu Xiao, Shen Jie, Zhong Hao-Wen, Zhang Jie, Zhang Gao-Long, Zhang Xiao-Fu, Yan Sha, Le Xiao-Yun. Simulation on surface morphology evolution of metal targets irradiated by intense pulsed electron beam. Acta Physica Sinica,
2015, 64(21): 216102.
doi: 10.7498/aps.64.216102
|
| [7] |
Wang Hong, Yun Feng, Liu Shuo, Huang Ya-Ping, Wang Yue, Zhang Wei-Han, Wei Zheng-Hong, Ding Wen, Li Yu-Feng, Zhang Ye, Guo Mao-Feng. Effect of wafer bonding and laser liftoff process on residual stress of GaN-based vertical light emitting diode chips. Acta Physica Sinica,
2015, 64(2): 028501.
doi: 10.7498/aps.64.028501
|
| [8] |
Jing Wei-Xuan, Wang Bing, Niu Ling-Ling, Qi Han, Jiang Zhuang-De, Chen Lu-Jia, Zhou Fan. Relationships between synthesizing parameters, morphology, and contact angles of ZnO nanowire films. Acta Physica Sinica,
2013, 62(21): 218102.
doi: 10.7498/aps.62.218102
|
| [9] |
Peng Shu-Ming, Shen Hua-Hai, Long Xing-Gui, Zhou Xiao-Song, Yang Li, Zu Xiao-Tao. The influence of deuteration and helium-implantation on the surface morphology and phase structure of scandium thick film. Acta Physica Sinica,
2012, 61(17): 176106.
doi: 10.7498/aps.61.176106
|
| [10] |
Su Fa-Gang, Liang Jing-Qiu, Liang Zhong-Zhu, Zhu Wan-Bin. Study on the surface morphology and absorptivity of light-absorbing materials. Acta Physica Sinica,
2011, 60(5): 057802.
doi: 10.7498/aps.60.057802
|
| [11] |
Di Guo-Qing. Surface morphology and optical properties of Ta2O5 films prepared by radio frequency sputtering. Acta Physica Sinica,
2011, 60(3): 038101.
doi: 10.7498/aps.60.038101
|
| [12] |
Zhang Li-Qing, Zhang Chong-Hong, Yang Yi-Tao, Yao Cun-Feng, Sun You-Mei, Li Bing-Sheng, Zhao Zhi-Ming, Song Shu-Jian. Surface morphology of GaN bombarded by highly charged 126Xeq+ ions. Acta Physica Sinica,
2009, 58(8): 5578-5584.
doi: 10.7498/aps.58.5578
|
| [13] |
Cen Min, Zhang Yue-Guang, Chen Wei-Lan, Gu Pei-Fu. Influences of deposition rate and oxygen partial pressure on residual stress of HfO2 films. Acta Physica Sinica,
2009, 58(10): 7025-7029.
doi: 10.7498/aps.58.7025
|
| [14] |
Sun Hao-Liang, Song Zhong-Xiao, Xu Ke-Wei. Effect of substrate constraint on stress-induced cracking of sputtered tungsten thin film. Acta Physica Sinica,
2008, 57(8): 5226-5231.
doi: 10.7498/aps.57.5226
|
| [15] |
Kong De-Jun, Zhang Yong-Kang, Chen Zhi-Gang, Lu Jin-Zhong, Feng Ai-Xin, Ren Xu-Dong, Ge Tao. Experimental study of residual stress of galvanized passive film based on XRD. Acta Physica Sinica,
2007, 56(7): 4056-4061.
doi: 10.7498/aps.56.4056
|
| [16] |
Zhang Yong-Kang, Kong De-Jun, Feng Ai-Xin, Lu Jin-Zhong, Ge Tao. Study on the detection of interfacial bonding strength of coatings (Ⅱ): detecting system of bonding strength. Acta Physica Sinica,
2006, 55(11): 6008-6012.
doi: 10.7498/aps.55.6008
|
| [17] |
Di Yu-Xian, Ji Xin-Hua, Hu Ming, Qin Yu-Wen, Chen Jin-Long. Residual stress measurement of porous silicon thin film by substrate curvature method. Acta Physica Sinica,
2006, 55(10): 5451-5454.
doi: 10.7498/aps.55.5451
|
| [18] |
Qin Qi, Yu Nai-Sen, Guo Li-Wei, Wang Yang, Zhu Xue-Liang, Chen Hong, Zhou Jun-Ming. Residual stress in the GaN epitaxial film prepared by in situ SiNx deposition. Acta Physica Sinica,
2005, 54(11): 5450-5454.
doi: 10.7498/aps.54.5450
|
| [19] |
Shao Shu-Ying, Fan Zheng-Xiu, Shao Jian-Da. Influences of the period of repeating thickness on the stress of alternative high and low refractivity ZrO2/SiO2 multilayers. Acta Physica Sinica,
2005, 54(7): 3312-3316.
doi: 10.7498/aps.54.3312
|
| [20] |
Lin Hong-Feng, Xie Er-Qing, Ma Zi-Wei, Zhang Jun, Peng Ai-Hua, He De-Yan. Study of 3C-SiC and 4H-SiC films deposited using RF sputtering method. Acta Physica Sinica,
2004, 53(8): 2780-2785.
doi: 10.7498/aps.53.2780
|
下载:
