| [1] |
He Yan, Zhou Gang, Liu Yan-Xia, Wang Hao, Xu Dong-Sheng, Yang Rui. Atomistic simulation of microvoid formation and its influence on crack nucleation in hexagonal titanium. Acta Physica Sinica,
2018, 67(5): 050203.
doi: 10.7498/aps.67.20171670
|
| [2] |
Wu De-Hui, Liu Zhi-Tian, Wang Xiao-Hong, Su Ling-Xin. Mechanism analysis of influence of surface-breaking orientation on magnetic leakage field distribution. Acta Physica Sinica,
2017, 66(4): 048102.
doi: 10.7498/aps.66.048102
|
| [3] |
Zhang Jin-Shuai, Huang Qiu-Shi, Jiang Li, Qi Run-Ze, Yang Yang, Wang Feng-Li, Zhang Zhong, Wang Zhan-Shan. Stress and structure properties of X-ray W/Si multilayer under low temperature annealing. Acta Physica Sinica,
2016, 65(8): 086101.
doi: 10.7498/aps.65.086101
|
| [4] |
Lu Yong-Jun, Yang Yi, Wang Feng-Hui, Lou Kang, Zhao Xiang. Effect of continuously graded functional layer on curvature and residual stress of solid oxide fuel cell in initial reduction process. Acta Physica Sinica,
2016, 65(9): 098102.
doi: 10.7498/aps.65.098102
|
| [5] |
Guo Liu-Yang, Chen Zheng, Long Jian, Yang Tao. Study on the effect of stress state and crystal orientation on micro-crack tip propagation behavior in phase field crystal method. Acta Physica Sinica,
2015, 64(17): 178102.
doi: 10.7498/aps.64.178102
|
| [6] |
Wang Hong, Yun Feng, Liu Shuo, Huang Ya-Ping, Wang Yue, Zhang Wei-Han, Wei Zheng-Hong, Ding Wen, Li Yu-Feng, Zhang Ye, Guo Mao-Feng. Effect of wafer bonding and laser liftoff process on residual stress of GaN-based vertical light emitting diode chips. Acta Physica Sinica,
2015, 64(2): 028501.
doi: 10.7498/aps.64.028501
|
| [7] |
Wang Ying-Long, Zhang Peng-Cheng, Liu Hong-Rang, Liu Bao-Ting, Fu Guang-Sheng. Effects of grain size and substrate stress of ferroelectric film on the physical properties. Acta Physica Sinica,
2011, 60(7): 077702.
doi: 10.7498/aps.60.077702
|
| [8] |
Jiang Wei-Wei, Fan Lin-Yong, Zhao Rui-Feng, Wei Yan, Pei Li, Jian Shui-Sheng. Comb-filter based on two core fiber coupler and its CO2 laser trimming. Acta Physica Sinica,
2011, 60(4): 044214.
doi: 10.7498/aps.60.044214
|
| [9] |
Shao Yu-Fei, Wang Shao-Qing. Quasicontinuum simulation of crack propagation in nanocrystalline Ni. Acta Physica Sinica,
2010, 59(10): 7258-7265.
doi: 10.7498/aps.59.7258
|
| [10] |
Jiang Yang, Luo Yi, Xi Guang-Yi, Wang Lai, Li Hong-Tao, Zhao Wei, Han Yan-Jun. Effect of AlGaN intermediate layer on residual stress control and surface morphology of GaN grown on 6H-SiC substrate by metal organic vapour phase epitaxy. Acta Physica Sinica,
2009, 58(10): 7282-7287.
doi: 10.7498/aps.58.7282
|
| [11] |
Cen Min, Zhang Yue-Guang, Chen Wei-Lan, Gu Pei-Fu. Influences of deposition rate and oxygen partial pressure on residual stress of HfO2 films. Acta Physica Sinica,
2009, 58(10): 7025-7029.
doi: 10.7498/aps.58.7025
|
| [12] |
Yu Yi-Ting, Yuan Wei-Zheng, Qiao Da-Yong, Liang Qing. A novel microstructure for in-situ measurement of residual stress in micromechanical thin films. Acta Physica Sinica,
2007, 56(10): 5691-5697.
doi: 10.7498/aps.56.5691
|
| [13] |
Cao Li-Xia, Wang Chong-Yu. Molecular dynamics simulation of fracture in α-iron. Acta Physica Sinica,
2007, 56(1): 413-422.
doi: 10.7498/aps.56.413
|
| [14] |
Kong De-Jun, Zhang Yong-Kang, Chen Zhi-Gang, Lu Jin-Zhong, Feng Ai-Xin, Ren Xu-Dong, Ge Tao. Experimental study of residual stress of galvanized passive film based on XRD. Acta Physica Sinica,
2007, 56(7): 4056-4061.
doi: 10.7498/aps.56.4056
|
| [15] |
Zhang Yong-Kang, Kong De-Jun, Feng Ai-Xin, Lu Jin-Zhong, Ge Tao. Study on the detection of interfacial bonding strength of coatings (Ⅱ): detecting system of bonding strength. Acta Physica Sinica,
2006, 55(11): 6008-6012.
doi: 10.7498/aps.55.6008
|
| [16] |
Di Yu-Xian, Ji Xin-Hua, Hu Ming, Qin Yu-Wen, Chen Jin-Long. Residual stress measurement of porous silicon thin film by substrate curvature method. Acta Physica Sinica,
2006, 55(10): 5451-5454.
doi: 10.7498/aps.55.5451
|
| [17] |
Qin Qi, Yu Nai-Sen, Guo Li-Wei, Wang Yang, Zhu Xue-Liang, Chen Hong, Zhou Jun-Ming. Residual stress in the GaN epitaxial film prepared by in situ SiNx deposition. Acta Physica Sinica,
2005, 54(11): 5450-5454.
doi: 10.7498/aps.54.5450
|
| [18] |
Shao Shu-Ying, Fan Zheng-Xiu, Shao Jian-Da. Influences of the period of repeating thickness on the stress of alternative high and low refractivity ZrO2/SiO2 multilayers. Acta Physica Sinica,
2005, 54(7): 3312-3316.
doi: 10.7498/aps.54.3312
|
| [19] |
Zhang Jian-Min, Xu Ke-Wei. Investigation of abnormal grain growth andtexture change in Ag and Cu films. Acta Physica Sinica,
2003, 52(1): 145-149.
doi: 10.7498/aps.52.145
|
| [20] |
LIU WEI-GUO, KONG LING-BING, ZHANG LIANG-YING, YAO XI. PHASE TRANSITION IN POLYCRYSTALLINE FERROELECTRIC THIN FILMS——STRESS AND SIZE EFFECTS. Acta Physica Sinica,
1996, 45(2): 318-323.
doi: 10.7498/aps.45.318
|
下载:
