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Synthesizing parameters in the hydrothermal method can affect directly the morphology and the contact angles of ZnO nanowires films, and thus the controllable wettability. In this paper effects of characteristic parameters on the properties of random rough surfaces are simulated, including arithmetical mean deviation of the profile, skewness, kurtosis and correlation length. Batches of ZnO nanowires films with varied morphology were synthesized in different concentrations of seed layer solution and growth solution, as well as growth time spans. Sampling length was determined and characteristic parameters of the profiles of ZnO nanowires films were extracted based on SEM micrographs and specific operators of Matlab software. With vertical and lateral parameters of the morphology introduced into Wenzel model, relationships between synthesizing parameters, morphology, and contact angles of ZnO nanowires films were established. It is conculded that the sampling length was determined to be 5 μm, crystallization between ZnO nanowires occurred as the concentration of growth solution was larger than 0.125 mol/L, resulting in hydrophobic ZnO nanowires films; different concentrations of seed layer solution and growth time spans led to hydrophilic ZnO nanowire films. These results can be used to immobilize various enzymes on ZnO nanowires films and further to improve the property of ZnO nanowires-based bio-sensors.
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Keywords:
- ZnO nanowire /
- hydrothermal synthesis /
- surface morphology /
- contact angle
[1] Dar G H, Umar A, Zaidi S A, Baskoutas S, Kim S H, Abaker M, Al-Hajry A, AL-Sayari S A 2011 Science of Advanced Materials 3 901
[2] Zhao Z, Lei W, Zhang X, Wang B, Jiang H 2010 Sensors 10 1216
[3] Li D Z, Zhu R 2013 Chin. Phys. B 22 018502
[4] Wei A, Wang Z, Pan L H, Li W W, Xiong L, Dong X C, Huang W 2011 Chin. Phys. Lett. 28 080702
[5] Chang S J, Weng W Y, Hsu C L, Hsueh T J 2010 Nano Communication Networks 1 283
[6] Ciofani G, Genchi G G, Mattoli V 2012 Materials Science and Engineering C 32 341
[7] Song Z M, Zhao D X, Guo Z, Li B H, Zhang Z Z, Shen D Z 2012 Acta Phys. Sin. 61 0252901 (in Chinese) [宋志明, 赵东旭, 郭振, 李炳辉, 张振中, 申德振 2012 61 0252901]
[8] Zheng Z K, Duanmu Q D, Zhao G X, Wang L D, Shen D Z 2012 Chin. Phys. Lett. 29 017804
[9] Chen X M, Ji Y, Gao X Y, Zhao X W 2012 Chin. Phys. B 21 116801
[10] Yang Y H, Li Z Y, Wang B, Wang C X, Chen D H, Yang G W 2005 J. Phys.: Condens. Matter 17 5441
[11] Feng X J, Feng L, Jin M H, Zhai J, Jiang L, Zhu D B 2004 J. Am. Chem. Soc. 126 62
[12] L J G, Huang K, Chen X M, Zhu J B, Meng F M, Song X P, Sun Z Q 2010 Applied Surface Science 256 4720
[13] Gong M G, Xu X L, Yang Z, Liu Y S, Liu L 2010 Chin. Phys. B 19 056701
[14] Reizer R 2010 Wear 271 539
[15] Watson W, Spedding T A 1982 Wear 83 215
[16] Hu Y Z, Tonder K 1992 Mach Tools Manufact 32 83
[17] Wenzel R N 1936 Industrial and Engineering Chemistry 28 988
[18] Cassie A B D, Baxter S 1944 Transactions of the Faraday Society 40 546
[19] McHale G 2007 Langmuir 23 8200
[20] Nosonovsky M, Bhushan B 2008 Langmuir 24 1525
[21] Sun H, Zhang Q F, Wu J L 2006 Acta Phys. Sin. 56 3479 (in Chinese) [孙晖, 张琦锋, 吴锦雷 2006 56 3479]
[22] He Y, Jiang C Y, Yin H X, Chen J, Yuan W Z 2011 Journal of Colloid and Interface Science 364 219
[23] Youssef S, Combette P, Podlecki J, Al-Asmar R, Foucaran A 2009 Cryst. Growth Des. 9 1088
[24] Yan J F, You T G, Zhang Z Y, Tian J X, Yun J N, Zhao W 2012 Chin. Phys. B 21 098001
[25] ISO 4287:1997, Geometrical Product Specifications (GPS)–Surface texture: Profile method–Terms, definitions and surface texture parameters
[26] Nosonovsky M 2007 Langmuir 23 9919
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[1] Dar G H, Umar A, Zaidi S A, Baskoutas S, Kim S H, Abaker M, Al-Hajry A, AL-Sayari S A 2011 Science of Advanced Materials 3 901
[2] Zhao Z, Lei W, Zhang X, Wang B, Jiang H 2010 Sensors 10 1216
[3] Li D Z, Zhu R 2013 Chin. Phys. B 22 018502
[4] Wei A, Wang Z, Pan L H, Li W W, Xiong L, Dong X C, Huang W 2011 Chin. Phys. Lett. 28 080702
[5] Chang S J, Weng W Y, Hsu C L, Hsueh T J 2010 Nano Communication Networks 1 283
[6] Ciofani G, Genchi G G, Mattoli V 2012 Materials Science and Engineering C 32 341
[7] Song Z M, Zhao D X, Guo Z, Li B H, Zhang Z Z, Shen D Z 2012 Acta Phys. Sin. 61 0252901 (in Chinese) [宋志明, 赵东旭, 郭振, 李炳辉, 张振中, 申德振 2012 61 0252901]
[8] Zheng Z K, Duanmu Q D, Zhao G X, Wang L D, Shen D Z 2012 Chin. Phys. Lett. 29 017804
[9] Chen X M, Ji Y, Gao X Y, Zhao X W 2012 Chin. Phys. B 21 116801
[10] Yang Y H, Li Z Y, Wang B, Wang C X, Chen D H, Yang G W 2005 J. Phys.: Condens. Matter 17 5441
[11] Feng X J, Feng L, Jin M H, Zhai J, Jiang L, Zhu D B 2004 J. Am. Chem. Soc. 126 62
[12] L J G, Huang K, Chen X M, Zhu J B, Meng F M, Song X P, Sun Z Q 2010 Applied Surface Science 256 4720
[13] Gong M G, Xu X L, Yang Z, Liu Y S, Liu L 2010 Chin. Phys. B 19 056701
[14] Reizer R 2010 Wear 271 539
[15] Watson W, Spedding T A 1982 Wear 83 215
[16] Hu Y Z, Tonder K 1992 Mach Tools Manufact 32 83
[17] Wenzel R N 1936 Industrial and Engineering Chemistry 28 988
[18] Cassie A B D, Baxter S 1944 Transactions of the Faraday Society 40 546
[19] McHale G 2007 Langmuir 23 8200
[20] Nosonovsky M, Bhushan B 2008 Langmuir 24 1525
[21] Sun H, Zhang Q F, Wu J L 2006 Acta Phys. Sin. 56 3479 (in Chinese) [孙晖, 张琦锋, 吴锦雷 2006 56 3479]
[22] He Y, Jiang C Y, Yin H X, Chen J, Yuan W Z 2011 Journal of Colloid and Interface Science 364 219
[23] Youssef S, Combette P, Podlecki J, Al-Asmar R, Foucaran A 2009 Cryst. Growth Des. 9 1088
[24] Yan J F, You T G, Zhang Z Y, Tian J X, Yun J N, Zhao W 2012 Chin. Phys. B 21 098001
[25] ISO 4287:1997, Geometrical Product Specifications (GPS)–Surface texture: Profile method–Terms, definitions and surface texture parameters
[26] Nosonovsky M 2007 Langmuir 23 9919
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