| [1] |
Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao. Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica,
2018, 67(19): 197203.
doi: 10.7498/aps.67.20181157
|
| [2] |
Zhang Jin-Shuai, Huang Qiu-Shi, Jiang Li, Qi Run-Ze, Yang Yang, Wang Feng-Li, Zhang Zhong, Wang Zhan-Shan. Stress and structure properties of X-ray W/Si multilayer under low temperature annealing. Acta Physica Sinica,
2016, 65(8): 086101.
doi: 10.7498/aps.65.086101
|
| [3] |
Lu Yong-Jun, Yang Yi, Wang Feng-Hui, Lou Kang, Zhao Xiang. Effect of continuously graded functional layer on curvature and residual stress of solid oxide fuel cell in initial reduction process. Acta Physica Sinica,
2016, 65(9): 098102.
doi: 10.7498/aps.65.098102
|
| [4] |
Jian Xiao-Gang, Chen Jun. The Influence of Co binding phase on adhesive strength of diamond coating with cemented carbide substrate. Acta Physica Sinica,
2015, 64(21): 216701.
doi: 10.7498/aps.64.216701
|
| [5] |
Wang Hong, Yun Feng, Liu Shuo, Huang Ya-Ping, Wang Yue, Zhang Wei-Han, Wei Zheng-Hong, Ding Wen, Li Yu-Feng, Zhang Ye, Guo Mao-Feng. Effect of wafer bonding and laser liftoff process on residual stress of GaN-based vertical light emitting diode chips. Acta Physica Sinica,
2015, 64(2): 028501.
doi: 10.7498/aps.64.028501
|
| [6] |
Chen Shu-Ying, Wang Hai-Dou, Xu Bin-Shi, Kang Jia-Jie. Investigation on the bonding behavior of the interface within the supersonic plasma sprayed coating system based on the fractal theory. Acta Physica Sinica,
2014, 63(15): 156801.
doi: 10.7498/aps.63.156801
|
| [7] |
Sun Yun, Wang Sheng-Lai, Gu Qing-Tian, Xu Xin-Guang, Ding Jian-Xu, Liu Wen-Jie, Liu Guang-Xia, Zhu Sheng-Jun. Study of KDP crystal lattice strain and stress by high resolution X-ray diffraction. Acta Physica Sinica,
2012, 61(21): 210203.
doi: 10.7498/aps.61.210203
|
| [8] |
Jiang Wei-Wei, Fan Lin-Yong, Zhao Rui-Feng, Wei Yan, Pei Li, Jian Shui-Sheng. Comb-filter based on two core fiber coupler and its CO2 laser trimming. Acta Physica Sinica,
2011, 60(4): 044214.
doi: 10.7498/aps.60.044214
|
| [9] |
Jiang Yang, Luo Yi, Xi Guang-Yi, Wang Lai, Li Hong-Tao, Zhao Wei, Han Yan-Jun. Effect of AlGaN intermediate layer on residual stress control and surface morphology of GaN grown on 6H-SiC substrate by metal organic vapour phase epitaxy. Acta Physica Sinica,
2009, 58(10): 7282-7287.
doi: 10.7498/aps.58.7282
|
| [10] |
Cen Min, Zhang Yue-Guang, Chen Wei-Lan, Gu Pei-Fu. Influences of deposition rate and oxygen partial pressure on residual stress of HfO2 films. Acta Physica Sinica,
2009, 58(10): 7025-7029.
doi: 10.7498/aps.58.7025
|
| [11] |
Hua Shao-Chun, Wang Han-Gong, Wang Liu-Ying, Zhang Wu, Liu Gu. The adhesives strength of nanostructured AT13 ceramic coatings characterized by fractal dimension. Acta Physica Sinica,
2008, 57(2): 1241-1245.
doi: 10.7498/aps.57.1241
|
| [12] |
Sun Hao-Liang, Song Zhong-Xiao, Xu Ke-Wei. Effect of substrate constraint on stress-induced cracking of sputtered tungsten thin film. Acta Physica Sinica,
2008, 57(8): 5226-5231.
doi: 10.7498/aps.57.5226
|
| [13] |
Zhang Yong-Kang, Kong De-Jun, Feng Ai-Xin, Lu Jin-Zhong, Zhang Lei-Hong, Ge Tao. Study on the determination of interfacial binding strength of coatings (Ⅰ): theorctical analysis of stress in thin film binding interface. Acta Physica Sinica,
2006, 55(6): 2897-2900.
doi: 10.7498/aps.55.2897
|
| [14] |
Di Yu-Xian, Ji Xin-Hua, Hu Ming, Qin Yu-Wen, Chen Jin-Long. Residual stress measurement of porous silicon thin film by substrate curvature method. Acta Physica Sinica,
2006, 55(10): 5451-5454.
doi: 10.7498/aps.55.5451
|
| [15] |
Zhang Yong-Kang, Kong De-Jun, Feng Ai-Xin, Lu Jin-Zhong, Ge Tao. Study on the detection of interfacial bonding strength of coatings (Ⅱ): detecting system of bonding strength. Acta Physica Sinica,
2006, 55(11): 6008-6012.
doi: 10.7498/aps.55.6008
|
| [16] |
Qin Qi, Yu Nai-Sen, Guo Li-Wei, Wang Yang, Zhu Xue-Liang, Chen Hong, Zhou Jun-Ming. Residual stress in the GaN epitaxial film prepared by in situ SiNx deposition. Acta Physica Sinica,
2005, 54(11): 5450-5454.
doi: 10.7498/aps.54.5450
|
| [17] |
Shao Shu-Ying, Fan Zheng-Xiu, Shao Jian-Da. Influences of the period of repeating thickness on the stress of alternative high and low refractivity ZrO2/SiO2 multilayers. Acta Physica Sinica,
2005, 54(7): 3312-3316.
doi: 10.7498/aps.54.3312
|
| [18] |
Ma Hong-Wei, Liang Jing-Kui. A new approach to extract reliable intensities of non-equivalent systematical overlapping reflections from powder diffraction data. Acta Physica Sinica,
2004, 53(3): 829-834.
doi: 10.7498/aps.53.829
|
| [19] |
XU KE-WEI, GAO RUN-SHENG, YU LI-GEN, HE JIA-WEN. THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAM. Acta Physica Sinica,
1994, 43(8): 1295-1300.
doi: 10.7498/aps.43.1295
|
| [20] |
LU XUE-SHAN, LIANG JING-KUI. THE DETERMINATION OF DEBYE CHARACTERISTIC TEMPERATURES OF CRYSTALS FROM X-RAY DIFFRACTION INTENSITIES. Acta Physica Sinica,
1981, 30(10): 1361-1368.
doi: 10.7498/aps.30.1361
|
下载:
