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Su Jie, Liu Zi-Chao, Liao Jian-Ying, Li Ying-Bin, Huang Cheng. Intensity-dependent electron correlation in nonsequential double ionization of Ar atoms in counter-rotating two-color elliptically polarized laser fields. Acta Physica Sinica,
2022, 71(19): 193201.
doi: 10.7498/aps.71.20221044
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Zhai Shi-Ming, Liao Huang-Sheng, Zhou Nai-Gen, Huang Hai-Bin, Zhou Lang. Atomic simulation of SiyHx structure configuration in a-Si:H thin films. Acta Physica Sinica,
2020, 69(7): 076801.
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Liu Yuan, He Hong-Yu, Chen Rong-Sheng, Li Bin, En Yun-Fei, Chen Yi-Qiang. Low-frequency noise in hydrogenated amorphous silicon thin film transistor. Acta Physica Sinica,
2017, 66(23): 237101.
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Wang Lu, Ye Ming, Zhao Xiao-Long, He Yong-Ning. Theory and verification of a microwave transmission method of measuring sheet resistance of metallic thin film. Acta Physica Sinica,
2017, 66(20): 208801.
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Chen Xiu-Guo, Yuan Kui, Du Wei-Chao, Chen Jun, Jiang Hao, Zhang Chuan-Wei, Liu Shi-Yuan. Large-scale nanostructure metrology using Mueller matrix imaging ellipsometry. Acta Physica Sinica,
2016, 65(7): 070703.
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Li Jiang, Tang Jing-You, Pei Wang, Wei Xian-Hua, Huang Feng. Accurate determination of thickness values and optical constants of absorbing thin films on opaque substrates with spectroscopic ellipsometry. Acta Physica Sinica,
2015, 64(11): 110702.
doi: 10.7498/aps.64.110702
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Liu Jun-Yan, Wang Fei, Wang Xiao-Chun, Ma Ying, Wang Yang. Simulation and experimental investigation of tooth tissue in photothermal radiometry dynamic response induced by modluated laser. Acta Physica Sinica,
2015, 64(19): 194203.
doi: 10.7498/aps.64.194203
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Ke Shao-Ying, Wang Chong, Pan Tao, He Peng, Yang Jie, Yang Yu. Optimization design of hydrogenated amorphous silicon germanium thin film solar cell with graded band gap profile. Acta Physica Sinica,
2014, 63(2): 028802.
doi: 10.7498/aps.63.028802
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Chen Ren-Gang, Deng Jin-Xiang, Chen Liang, Kong Le, Cui Min, Gao Xue-Fei, Pang Tian-Qi, Miao Yi-Ming. Spectroscopic ellipsometry study of the Zn3N2 films prepared by radio-frequency sputtering. Acta Physica Sinica,
2014, 63(13): 137701.
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Sun Du-Juan, Hu Yi-Hua, Gu You-Lin, Wang Yong, Li Le. Determination and model construction of microbes' complex refractive index in far infrared band. Acta Physica Sinica,
2013, 62(9): 094218.
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Ke Chuan, Zhao Cheng-Li, Gou Fu-Jun, Zhao Yong. Molecular dynamics study of interaction between the H atoms and Si surface. Acta Physica Sinica,
2013, 62(16): 165203.
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Chen Xiao-Xue, Yao Ruo-He. DC characteristic research based on surface potential for a-Si:H thin-film transistor. Acta Physica Sinica,
2012, 61(23): 237104.
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Zhou Yi, Wu Guo-Song, Dai Wei, Li Hong-Bo, Wang Ai-Ying. Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach. Acta Physica Sinica,
2010, 59(4): 2356-2363.
doi: 10.7498/aps.59.2356
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Li Jiu-Sheng, Li Xiang-Jun. Accurate optical parameter determination of corn oil with terahertz wave time-domain spectroscopy. Acta Physica Sinica,
2009, 58(8): 5805-5809.
doi: 10.7498/aps.58.5805
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Li Shi-Bin, Wu Zhi-Ming, Yuan Kai, Liao Nai-Man, Li Wei, Jiang Ya-Dong. Study on thermal conductivity of hydrogenated amorphous silicon films. Acta Physica Sinica,
2008, 57(5): 3126-3131.
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Mu Quan-Quan, Liu Yong-Jun, Hu Li-Fa, Li Da-Yu, Cao Zhao-Liang, Xuan Li. Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer. Acta Physica Sinica,
2006, 55(3): 1055-1060.
doi: 10.7498/aps.55.1055
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Zhang Jin-Cheng, Hao Yue, Li Pei-Xian, Fan Long, Feng Qian. Thickness measurement of GaN film based on transmission spectra. Acta Physica Sinica,
2004, 53(4): 1243-1246.
doi: 10.7498/aps.53.1243
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Shen Hu-Jiang, Wang Lin-Jun, Fang Zhi-Jun, Zhang Ming-Long, Yang Ying, Wang Lin, Xia Yi-Ben. Study on optical properties of diamond films by means of infrared spectroscopic ellipsometry. Acta Physica Sinica,
2004, 53(6): 2009-2013.
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Luo Zhi, Lin Xuan-Ying, Lin Shun-Hui, Yu Chu-Ying, Lin Kui-Xun, Yu Yun-Peng, Tan Wei-Feng. Infrared analysis on hydrogen content and Si-H bonding configurations of hydrogenated amorphous silicon films. Acta Physica Sinica,
2003, 52(1): 169-174.
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1996, 45(3): 499-505.
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