| [1] |
Zhang Xue, Kim Bokyung, Lee Hyeonju, Park Jaehoon. Low-temperature rapid preparation of high-performance indium oxide thin films and transistors based on solution technology. Acta Physica Sinica,
2024, 73(9): 096802.
doi: 10.7498/aps.73.20240082
|
| [2] |
Li Ye, Wang Xi-Xi, Wei Hui-Yun, Qiu Peng, He Ying-Feng, Song Yi-Meng, Duan Zhang, Shen Cheng-Tao, Peng Ming-Zeng, Zheng Xin-He. Enhancement of interface transportation for quantum dot solar cells using ultrathin InN by atomic layer deposition. Acta Physica Sinica,
2021, 70(18): 187702.
doi: 10.7498/aps.70.20210554
|
| [3] |
Zhang Guan-Jie, Yang Hao, Zhang Nan. Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica,
2020, 69(12): 127711.
doi: 10.7498/aps.69.20200301
|
| [4] |
Chen Long, Chen Cheng-Ke, Li Xiao, Hu Xiao-Jun. Effects of oxidation on silicon vacancy photoluminescence and microstructure of separated domain formed nanodiamond films. Acta Physica Sinica,
2019, 68(16): 168101.
doi: 10.7498/aps.68.20190422
|
| [5] |
Li Ming-Yang, Zhang Lei-Min, Lv Shasha, Li Zheng-Cao. Effects of ion irradiation and oxidation on point defects in IG-110 nuclear grade graphite. Acta Physica Sinica,
2019, 68(12): 128102.
doi: 10.7498/aps.68.20190371
|
| [6] |
Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao. Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica,
2018, 67(19): 197203.
doi: 10.7498/aps.67.20181157
|
| [7] |
Tao Ying, Qi Ning, Wang Bo, Chen Zhi-Quan, Tang Xin-Feng. Microstructure and thermoelectric properties of In2O3/poly(3, 4-ethylenedioxythiophene) composites. Acta Physica Sinica,
2018, 67(19): 197201.
doi: 10.7498/aps.67.20180382
|
| [8] |
Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng. Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica,
2018, 67(2): 027301.
doi: 10.7498/aps.67.20172055
|
| [9] |
Li Xiao-Dong, Li Hui, Li Peng-Shan. High pressure single-crystal synchrotron X-ray diffraction technique. Acta Physica Sinica,
2017, 66(3): 036203.
doi: 10.7498/aps.66.036203
|
| [10] |
Li Xiao-Na, Zheng Yue-Hong, Li Zhen, Wang Miao, Zhang Kun, Dong Chuang. High temperature oxidation resistance of cluster model designed alloys Cu-Cu12-[Mx/(12+x)Ni12/(12+x)]5 (M=Si, Cr, Cr+Fe). Acta Physica Sinica,
2014, 63(2): 028102.
doi: 10.7498/aps.63.028102
|
| [11] |
Xu Xiao-Ming, Miao Wei, Tao Kun. Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica,
2011, 60(8): 086101.
doi: 10.7498/aps.60.086101
|
| [12] |
Zhao Guo-Zhong, Wang Xin-Qiang, Wang Hai-Yan. Terahertz radiations from narrow band gap of semiconductor irradiated by femtosecond pulses with different pump intensities. Acta Physica Sinica,
2011, 60(4): 043202.
doi: 10.7498/aps.60.043202
|
| [13] |
Hu Mei-Jiao, Li Cheng, Xu Jian-Fang, Lai Hong-Kai, Chen Song-Yan. Formation and properties of GeOI prepared by cyclic thermal oxidation and annealing processes. Acta Physica Sinica,
2011, 60(7): 078102.
doi: 10.7498/aps.60.078102
|
| [14] |
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
doi: 10.7498/aps.58.2742
|
| [15] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
doi: 10.7498/aps.57.7119
|
| [16] |
Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei. X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica,
2008, 57(9): 5962-5967.
doi: 10.7498/aps.57.5962
|
| [17] |
Tan Guo-Tai, Chen Zheng-Hao. XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica,
2007, 56(3): 1702-1706.
doi: 10.7498/aps.56.1702
|
| [18] |
Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia. New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica,
2006, 55(3): 1325-1335.
doi: 10.7498/aps.55.1325
|
| [19] |
Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma. X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica,
2004, 53(10): 3510-3514.
doi: 10.7498/aps.53.3510
|
| [20] |
LI Ya, Chen Ling-Yan, Zhang Zhe, Wu Yong-Gang, Qiao Yi, Xu Wei-Xin. . Acta Physica Sinica,
2001, 50(1): 79-82.
doi: 10.7498/aps.50.79
|
下载:
