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2021, 70(4): 045101.
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Wang Bao-Zhu, Zhang Xiu-Qing, Zhang Ao-Di, Zhou Xiao-Ran, Bahadir Kucukgok, Na Lu, Xiao Hong-Ling, Wang Xiao-Liang, Ian T. Ferguson. Room-temperature thermoelectric properties of GaN thin films grown by metal organic chemical vapor deposition. Acta Physica Sinica,
2015, 64(4): 047202.
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Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica,
2013, 62(4): 048801.
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Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong. Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica,
2013, 62(14): 140701.
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Tang Jun, Liu Zhong-Liang, Ren Peng, Yao Tao, Yan Wen-Sheng, Xu Peng-Shou, Wei Shi-Qiang. Structural characterization of Mn doped SiC magnetic thin films. Acta Physica Sinica,
2010, 59(7): 4774-4780.
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
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Xie Zi-Li, Zhang Rong, Xiu Xiang-Qian, Liu Bin, Zhu Shun-Ming, Zhao Hong, Pu Lin, Han Ping, Jiang Ruo-Lian, Shi Yi, Zheng You-Dou. The oxidation characteristics of InN films. Acta Physica Sinica,
2007, 56(2): 1032-1035.
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Yuan Jin-She, Chen Guang-De. Instantaneous relaxation of photoconductivity in GaN film grown on vicinal sapphire substrate by MBE. Acta Physica Sinica,
2007, 56(7): 4218-4223.
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Zhang Hong-Di, An Yu-Kai, Mai Zhen-Hong, Gao Ju, Hu Feng-Xia, Wang Yong, Jia Quan-Jie. Thickness effect on structure and magnetic properties of La0.8Ca0.2MnO3/SrTiO3 films. Acta Physica Sinica,
2007, 56(9): 5347-5352.
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Liu Guo-Han, Ding Yi, Zhu Xiu-Hong, Chen Guang-Hua, He De-Yan. Preparation and characterization of hydrogenated microcrystalline silicon films by HW-MWECR-CVD. Acta Physica Sinica,
2006, 55(11): 6147-6151.
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Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia. New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica,
2006, 55(3): 1325-1335.
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Peng Dong-Sheng, Feng Yu-Chun, Wang Wen-Xin, Liu Xiao-Feng, Shi Wei, Niu Han-Ben. A new method to grow high quality GaN film by MOCVD. Acta Physica Sinica,
2006, 55(7): 3606-3610.
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Feng Qian, Wang Feng-Xiang, Hao Yue. Effect of Mg doping on properties of AlGaN films. Acta Physica Sinica,
2004, 53(10): 3587-3590.
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Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma. X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica,
2004, 53(10): 3510-3514.
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Zhang Jin-Cheng, Hao Yue, Li Pei-Xian, Fan Long, Feng Qian. Thickness measurement of GaN film based on transmission spectra. Acta Physica Sinica,
2004, 53(4): 1243-1246.
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Lai Tian-Shu, Fan Hai-Hua, Liu Zhen-Dong, Lin Wei-Zhu. Studies of broadband yellow luminescence of GaN. Acta Physica Sinica,
2003, 52(10): 2638-2641.
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Chen Dun-Jun, Shen Bo, Zhang Kai-Xiao, Deng Yong-Zhen, Fan Jie, Zhang Rong, Shi Yi, Zheng You-Dou. Structural properties of GaN1-xPx films. Acta Physica Sinica,
2003, 52(7): 1788-1791.
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2002, 51(5): 1149-1152.
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YUAN JIN-SHE, CHEN GUANG-DE, QI MING, LI AI-ZHEN, XU ZHUO. XPS AND AES INVESTIGATION OF GaN FILMS GROWN BY MBE. Acta Physica Sinica,
2001, 50(12): 2429-2433.
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