| [1] |
Zhang Guan-Jie, Yang Hao, Zhang Nan. Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica,
2020, 69(12): 127711.
doi: 10.7498/aps.69.20200301
|
| [2] |
Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao. Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica,
2018, 67(19): 197203.
doi: 10.7498/aps.67.20181157
|
| [3] |
Han Liang, Liu De-Lian, Chen Xian, Zhao Yu-Qing. The effect of the interlayer CrN on adhesion characteristics of ta-C films on high-speed steel substrate. Acta Physica Sinica,
2013, 62(9): 096802.
doi: 10.7498/aps.62.096802
|
| [4] |
Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica,
2013, 62(4): 048801.
doi: 10.7498/aps.62.048801
|
| [5] |
Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong. Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica,
2013, 62(14): 140701.
doi: 10.7498/aps.62.140701
|
| [6] |
Xu Xiao-Ming, Miao Wei, Tao Kun. Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica,
2011, 60(8): 086101.
doi: 10.7498/aps.60.086101
|
| [7] |
Tang Jun, Liu Zhong-Liang, Ren Peng, Yao Tao, Yan Wen-Sheng, Xu Peng-Shou, Wei Shi-Qiang. Structural characterization of Mn doped SiC magnetic thin films. Acta Physica Sinica,
2010, 59(7): 4774-4780.
doi: 10.7498/aps.59.4774
|
| [8] |
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
doi: 10.7498/aps.58.2742
|
| [9] |
Zhang Li-Ping, Zhang Jian-Jun, Zhang Xin, Shang Ze-Ren, Hu Zeng-Xin, Zhang Ya-Ping, Geng Xin-Hua, Zhao Ying. Investigation of microcrystalline silicon germanium prepared by hydrogen and helium gas mixture diluted VHFPA-RTCVD. Acta Physica Sinica,
2008, 57(11): 7338-7343.
doi: 10.7498/aps.57.7338
|
| [10] |
Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei. X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica,
2008, 57(9): 5962-5967.
doi: 10.7498/aps.57.5962
|
| [11] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
doi: 10.7498/aps.57.7119
|
| [12] |
. Properties of Co nano-films deposited on monocrystalline silicon surface by ion beam sputtering. Acta Physica Sinica,
2007, 56(12): 7158-7164.
doi: 10.7498/aps.56.7158
|
| [13] |
Xie Zi-Li, Zhang Rong, Xiu Xiang-Qian, Liu Bin, Zhu Shun-Ming, Zhao Hong, Pu Lin, Han Ping, Jiang Ruo-Lian, Shi Yi, Zheng You-Dou. The oxidation characteristics of InN films. Acta Physica Sinica,
2007, 56(2): 1032-1035.
doi: 10.7498/aps.56.1032
|
| [14] |
Tan Guo-Tai, Chen Zheng-Hao. XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica,
2007, 56(3): 1702-1706.
doi: 10.7498/aps.56.1702
|
| [15] |
Liu Guo-Han, Ding Yi, Zhu Xiu-Hong, Chen Guang-Hua, He De-Yan. Preparation and characterization of hydrogenated microcrystalline silicon films by HW-MWECR-CVD. Acta Physica Sinica,
2006, 55(11): 6147-6151.
doi: 10.7498/aps.55.6147
|
| [16] |
Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia. New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica,
2006, 55(3): 1325-1335.
doi: 10.7498/aps.55.1325
|
| [17] |
Feng Qian, Wang Feng-Xiang, Hao Yue. Effect of Mg doping on properties of AlGaN films. Acta Physica Sinica,
2004, 53(10): 3587-3590.
doi: 10.7498/aps.53.3587
|
| [18] |
Chen Dun-Jun, Shen Bo, Zhang Kai-Xiao, Deng Yong-Zhen, Fan Jie, Zhang Rong, Shi Yi, Zheng You-Dou. Structural properties of GaN1-xPx films. Acta Physica Sinica,
2003, 52(7): 1788-1791.
doi: 10.7498/aps.52.1788
|
| [19] |
Hao Yan-Ming, Zhao Wei, Gao Yan. Structure and Curie temperature of Y2(Fe1-x-y,Coy,Crx)17 compounds. Acta Physica Sinica,
2003, 52(10): 2612-2615.
doi: 10.7498/aps.52.2612
|
| [20] |
. . Acta Physica Sinica,
1963, 19(3): 202-204.
doi: 10.7498/aps.19.202
|
下载: