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With the development of modern communication technology, unlimited energy harvesting technology has become more and more popular. Among them, the weak energy density wireless energy harvesting technology has broken through the limitations in traditional transmission lines and can use the “waste” energy in the environment, which has become very popular. The Schottky diode is the core device of the 2.45 G weak energy density wireless energy harvesting system, and its performance determines the upper limit of the system's rectification efficiency. From the material design point of view, using crystal orientation optimization technology and Sn alloying technology, we propose and design a Ge-based compound semiconductor with large effective mass, large affinity, and high electron mobility. On this basis, the device simulation tool is further used to set reasonable device material physical parameters and geometric structure parameters, and a Ge-based Schottky diode for 2.45 G weak energy microwave wireless energy transmission is realized. The simulation of the ADS rectifier circuit based on the SPICE model of the device shows that comparing with the conventional Schottky diode, the turn-on voltage of the device is reduced by about 0.1 V, the zero-bias capacitance is reduced by 6 fF, and the reverse saturation current is also significantly increased. At the same time, the designed new Ge-based Schottky diode is used as the core rectifier device to simulate the rectifier circuit. The results show that the new-style Ge-based Schottky diode is in the weak energy working area with input energy in a range of –10 — –20 dBm. The energy conversion efficiency is increased by about 10%. The technical solutions and relevant conclusions of this article can provide a useful reference for solving the problem of low rectification efficiency of the 2.45 G weak energy density wireless energy harvesting system.
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Keywords:
- weak energy wireless transmission /
- Schottky diode /
- germanium-tin /
- crystal orientation /
- rectification efficiency
[1] 李妤晨, 陈航宇, 宋建军 2020 69 108401Google Scholar
Li Y C, Chen H Y, Song J J 2020 Acta Phys. Sin. 69 108401Google Scholar
[2] De S C, Meneghini M, Caria A, Dogmus E, Zegaoui M, Medjdoub F, Kalinic B, Cesca T, Meneghesso G, Zanoni E 2018 Mater. Today 11 153
[3] Wan S P, Huang K 2018 IEEE Antennas Wirel. Propag. Lett. 17 538
[4] Chen Y S, Chiu C W 2018 Int. J. RF Microwave Comput. Aided Eng. 28 1
[5] Erkmen F, Almoneef T S, Ramahi O M 2018 IEEE Trans. Microwave Theory Tech. 66 2433Google Scholar
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[7] Song C Y, Huang Y, Zhou J F, Zhang J W, Yuan S, Carter P 2015 IEEE Trans. Antennas Propag. 63 3486Google Scholar
[8] Hemour S, Zhao Y P, Lorenz C H P, Houssameddine D, Gui Y S, Hu C M, Wu K 2014 IEEE Trans. Microwave Theory Tech. 62 965Google Scholar
[9] Abdelmalek B, Fedoua D, Ilyas B 2019 Wirel. Netw. 25 3029Google Scholar
[10] Zheng S Y, Liu W J, Pan Y M 2019 IEEE Trans. Ind. Inf. 15 3334Google Scholar
[11] Cansiz M, Altinel D, Kurt G K 2019 Energy Technol. 174 292
[12] Liu W F, Wang Y Y, Song J J 2020 Superlattices Microstruct. 28 106639
[13] 施敏, 伍国珏 著 (耿莉, 张瑞智 译) 2007 半导体器件物理 (北京: 西安交通大学出版社) 第 110−113页
Sze S M, Kwok K N (translated by Geng L, Zhang R Z) 2007 Physics of Semiconductor Devices (Xi’an: Xi’an jiaotong University Press) pp130−142 (in Chinese)
[14] Yang W, Song J J, Hu H Y, Zhang H M 2018 J. Nanoelectron. Optoelectron. 13 986Google Scholar
[15] 杨雯, 宋建军, 任远, 张鹤鸣 2018 67 198502Google Scholar
Yang W, Song J J, Ren Y, Zhang H M 2018 Acta Phys. Sin. 67 198502Google Scholar
[16] Yang W, Song J J, Miao Y H, Zhang J, Dai X Y 2019 Sci. Technol. Adv. Mater. 11 1315
[17] Zhai X, Song J J, Dai X Y 2019 IEEE Access 7 127438Google Scholar
[18] Wirths S, Geiger R, Driesch V D N, Mussler G, Stoica T, Mantl S, Ikonic Z, Luysberg M, Chiussi S, Hartmann J M, Sigg H, Faist J, Buca D, Grützmacher D 2015 Nat. Photonics 9 88Google Scholar
[19] Zhai X, Song J J, Dai X Y, Zhao T L 2020 Semicond. Sci. Technol. 35 085026Google Scholar
[20] Amato M, Bertocchi M, Ossicini S 2016 J. Phys. D: Appl. Phys. 119 085705Google Scholar
[21] Minnie M, Rajeev K S, Charita M 2020 Mater. Today 28 1445
[22] Huang W Q, Cheng B W, Xue C L, Li C B 2014 Physica B 443 43Google Scholar
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图 11 整流电路的仿真结果, 输入能量与 (a)阻抗实部、(b)阻抗虚部、(c)整流效率以及(d)弱能量区域整流效率的关系
Figure 11. Simulation results of the rectifier circuit, the relationship between the input energy and (a) the real part of the impedance (b) the imaginary part of the impedance (c) the rectification efficiency (d) the rectification efficiency in the weak energy region.
表 1 三种Ge基SBD器件SPICE参数表
Table 1. SPICE parameter table of three Ge-based SBD devices.
参数 $ {B}_{v}/ $V $ {C}_{j0} $/fF $ {E}_{\rm{G}} $/eV $ {I}_{\rm{S}} $/A N $ {R}_{\rm{S}} $/${\Omega }$ M Ge 18.9 36 0.69 9.6235 × 10–11 0.999 2.9 0.5072 GeSn 19 36.2 0.69 9.628 × 10–11 0.999 2.8 0.5073 Ge_on_GeSn 11.4 30 0.69 1.0437 × 10–8 1.106 11.6 0.4037 -
[1] 李妤晨, 陈航宇, 宋建军 2020 69 108401Google Scholar
Li Y C, Chen H Y, Song J J 2020 Acta Phys. Sin. 69 108401Google Scholar
[2] De S C, Meneghini M, Caria A, Dogmus E, Zegaoui M, Medjdoub F, Kalinic B, Cesca T, Meneghesso G, Zanoni E 2018 Mater. Today 11 153
[3] Wan S P, Huang K 2018 IEEE Antennas Wirel. Propag. Lett. 17 538
[4] Chen Y S, Chiu C W 2018 Int. J. RF Microwave Comput. Aided Eng. 28 1
[5] Erkmen F, Almoneef T S, Ramahi O M 2018 IEEE Trans. Microwave Theory Tech. 66 2433Google Scholar
[6] Wonwoo L, Yonghee J 2018 Micromachines. 10 12Google Scholar
[7] Song C Y, Huang Y, Zhou J F, Zhang J W, Yuan S, Carter P 2015 IEEE Trans. Antennas Propag. 63 3486Google Scholar
[8] Hemour S, Zhao Y P, Lorenz C H P, Houssameddine D, Gui Y S, Hu C M, Wu K 2014 IEEE Trans. Microwave Theory Tech. 62 965Google Scholar
[9] Abdelmalek B, Fedoua D, Ilyas B 2019 Wirel. Netw. 25 3029Google Scholar
[10] Zheng S Y, Liu W J, Pan Y M 2019 IEEE Trans. Ind. Inf. 15 3334Google Scholar
[11] Cansiz M, Altinel D, Kurt G K 2019 Energy Technol. 174 292
[12] Liu W F, Wang Y Y, Song J J 2020 Superlattices Microstruct. 28 106639
[13] 施敏, 伍国珏 著 (耿莉, 张瑞智 译) 2007 半导体器件物理 (北京: 西安交通大学出版社) 第 110−113页
Sze S M, Kwok K N (translated by Geng L, Zhang R Z) 2007 Physics of Semiconductor Devices (Xi’an: Xi’an jiaotong University Press) pp130−142 (in Chinese)
[14] Yang W, Song J J, Hu H Y, Zhang H M 2018 J. Nanoelectron. Optoelectron. 13 986Google Scholar
[15] 杨雯, 宋建军, 任远, 张鹤鸣 2018 67 198502Google Scholar
Yang W, Song J J, Ren Y, Zhang H M 2018 Acta Phys. Sin. 67 198502Google Scholar
[16] Yang W, Song J J, Miao Y H, Zhang J, Dai X Y 2019 Sci. Technol. Adv. Mater. 11 1315
[17] Zhai X, Song J J, Dai X Y 2019 IEEE Access 7 127438Google Scholar
[18] Wirths S, Geiger R, Driesch V D N, Mussler G, Stoica T, Mantl S, Ikonic Z, Luysberg M, Chiussi S, Hartmann J M, Sigg H, Faist J, Buca D, Grützmacher D 2015 Nat. Photonics 9 88Google Scholar
[19] Zhai X, Song J J, Dai X Y, Zhao T L 2020 Semicond. Sci. Technol. 35 085026Google Scholar
[20] Amato M, Bertocchi M, Ossicini S 2016 J. Phys. D: Appl. Phys. 119 085705Google Scholar
[21] Minnie M, Rajeev K S, Charita M 2020 Mater. Today 28 1445
[22] Huang W Q, Cheng B W, Xue C L, Li C B 2014 Physica B 443 43Google Scholar
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