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中国物理学会期刊
Liu Yu-Dong, Du Lei, Sun Peng, Chen Wen-Hao. The effect of electrostatic discharge on the I-V and low frequency noise characterization of Schottky barrier diodesJ. Acta Physica Sinica, 2012, 61(13): 137203. DOI: 10.7498/aps.61.137203
Citation: Liu Yu-Dong, Du Lei, Sun Peng, Chen Wen-Hao. The effect of electrostatic discharge on the I-V and low frequency noise characterization of Schottky barrier diodesJ. Acta Physica Sinica, 2012, 61(13): 137203. DOI: 10.7498/aps.61.137203

    The effect of electrostatic discharge on the I-V and low frequency noise characterization of Schottky barrier diodes

    CSTR: 32037.14.aps.61.137203
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