Xi Xiao-Wen, Chai Chang-Chun, Liu Yang, Yang Yin-Tang, Fan Qing-Yang. Influence of the external condition on the damage process of the GaAs pseudomorphic high electron mobility transistor induced by the electromagnetic pulseJ. Acta Physica Sinica, 2017, 66(7): 078401. DOI: 10.7498/aps.66.078401