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中国物理学会期刊
Ren Xing-Rong, Chai Chang-Chun, Ma Zhen-Yang, Yang Yin-Tang, Qiao Li-Ping, Shi Chun-Lei. The damage effect and mechanism of bipolar transistors induced by injection of electromagnetic pulse from the baseJ. Acta Physica Sinica, 2013, 62(6): 068501. DOI: 10.7498/aps.62.068501
Citation: Ren Xing-Rong, Chai Chang-Chun, Ma Zhen-Yang, Yang Yin-Tang, Qiao Li-Ping, Shi Chun-Lei. The damage effect and mechanism of bipolar transistors induced by injection of electromagnetic pulse from the baseJ. Acta Physica Sinica, 2013, 62(6): 068501. DOI: 10.7498/aps.62.068501

    The damage effect and mechanism of bipolar transistors induced by injection of electromagnetic pulse from the base

    CSTR: 32037.14.aps.62.068501
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