Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

High speed gate driver circuit basd on metal oxide thin film transistors

Zhang Li-Rong Ma Xue-Xue Wang Chun-Fu Li Guan-Ming Xia Xing-Heng Luo Dong-Xiang Wu Wei-Jing Xu Miao Wang Lei Peng Jun-Biao

Citation:

High speed gate driver circuit basd on metal oxide thin film transistors

Zhang Li-Rong, Ma Xue-Xue, Wang Chun-Fu, Li Guan-Ming, Xia Xing-Heng, Luo Dong-Xiang, Wu Wei-Jing, Xu Miao, Wang Lei, Peng Jun-Biao
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

  • This paper presents a new high speed gate driver circuit driven by In-Zn-O thin film transistors. Two methods are employed to improve the speed of this dirver: First, the input stage multiplex structure is adopted, one input stage drives three output stages; this could reduce the quantity of thin film transistors and also could achieve the narrow bezels in the AMOLED or AMLCD displays. Even the work frequency of the input stage becomes 1/3 of the output stage. When the speed of the circuit increass, there is enough time for input stage charging and discharging. So this kind of driver is suitable for high speed driving method. Second, three times the capacitance coupled effect generated in the gate driver can pull up the voltage level of the key nodes in the circuit, ensuring the signal integrity, While the first time the effect generated in the input stage is to reduce the charge time of the cascade signal and improve the speed of input stage. The second time that generated between input stage and output stage contrbutes to the integrity of cascade ouput signal and output control signal. A diode-connected thin film transistor applied to connect the output control signal and the gate of pull-up thin film transistors in output stage generates the three time capacitance coupled effects. Since the capacitance coupled effect can pull up the gate voltage of the pull-up thin film transistors during output period, the driving ability of the pull-up thin film transistors and the working speed could be promoted effectively. Simulation result shows that the capacitance coupled effect of each key node can pull up the voltage level considerably and the gate driver can normally work at the speed of 4 s. Finally, ten stage gate driver circuits have been fabricated successfully including ten input stages and thirty output stages. The test result shows that the proposed gate driver could work normally with a load of R=5 k and C=100 pF. Furthermore, the high speed test result shows that the output signal pulse width of the circuit is 2 s meeting the driving demands of the 4 k8 k display at the frame rate of 120 Hz. The power consumption of the gate dirver circuit is measured in different resolutions under the frame frequencies of 60 and 120 Hz respectively.
      Corresponding author: Wu Wei-Jing, wuwj@scut.edu.cn
    • Funds: Project supported by the National Basic Research Program of China(Grant No. 2015CB6500), the National Natural Science Foundation of China (Grant No. 61204089), the Guangdong Natural Science Foundation, China (Grant Nos. S2012010008648, 2014A030310253), the Guangdong Province (Institute) Research Project, China (Grant No. 2013B090500015), the Pearl River ST Nova Program of Guangzhou, China (Grant No. 201506010015), the China Postdoctoral Science Foundation (Grant No. 2015M572313), and the Fundamental Research Funds for the Central Universities, China (Grant Nos. 2015ZM072, 2015ZM070).
    [1]

    Liu B Q, Lan L F, Zou J H, Peng J B 2013 Acta Phys. Sin. 62 087302 (in Chinese) [刘佰全, 兰林锋, 邹建华, 彭俊彪 2013 62 087302]

    [2]

    Liu B Q, Tao H, Su Y J, Gao D Y, Lan L F, Zou J H, Peng J B 2013 Chin. Phys. B 22 077303

    [3]

    Liu Y, Wu W J, Li B, SI Y F, Wang L, Liu Y R 2014 Acta Phys. Sin. 63 098503 (in Chinese) [刘远, 吴为敬, 李斌, 思云飞, 王磊, 刘玉荣 2014 63 098503]

    [4]

    Cao Y,Tao H,Zou J H, Xu M, Lan L F, Wang L,Peng J B 2012 Journal of South China University of Technology 40 1 (in Chinese) [曹镛, 陶洪, 邹建华, 徐苗, 兰林锋, 王磊, 彭俊彪 2012 华南理工大学学报(自然科学版) 40 1]

    [5]

    Lan L, Xiong N, Xiao P, Li M, Xu H, Yao R, Wen S, Peng J 2013 Appl. Phys Lett. 102 242102

    [6]

    Xu H, Lan L F, Li M, Luo D X, Xiao P, Lin Z G, Ning H L, Peng J B 2014 Acta Phys. Sin. 63 038501 (in Chinese) [徐华, 兰林锋, 李民, 罗东向, 肖鹏, 林振国, 宁洪龙, 彭俊彪 2014 63 038501]

    [7]

    Zhou L, Xu M, Wu W J, Xia X H, Wang L, Peng J B 2015 Chinese Journal of Luminescence 36 577 (in Chinese) [周雷, 徐苗, 吴为敬, 夏兴衡, 王磊, 彭俊彪 2015 发光学报 36 577]

    [8]

    Chih L L, Chun D T, Min C C, Jian S Y 2011 Journal of Display Technology 7 10

    [9]

    Jae E P, Min K R, Chi S H, Shin H Y, Sang H K P, Sung M Y, Hong K L, Youn K K, Joon D K, Hwan S O, Kee C P 2012 Electron Device Letters 33 1144

    [10]

    Arokia N, Anil K, Kapil S, Peyman S, Sanjiv S, Denis S 2004 Journal of Solid-State Circuit 39 1477

    [11]

    Lee Y W, Kim S J, Lee S Y, Lee W G, Yoon K S, Park J W, Kwon J Y, Han M K 2012 Electrochemical and Solid-State Letters 15 H126

    [12]

    Binn K, Seung C C, Jeong S L, Sun J K, Yong H J, Soo Y Y, Chang D K, Min K H 2011 Transations On Electron Devices 58 3012

    [13]

    Wu W J, Li G M, Xia X H, Zhang L R, Zhou L, Xu M 2014 Journal Of Display Technology 10 523

    [14]

    Wu W J, Song X F, Zhang L R, Zhou L, Xu M, Wang L, Peng J B Transations On Electron Devices 61 3335

    [15]

    Binn K, Lee Y U, Han M K, Seung C C, Yong H J, Park K S, Kim C D 2011 Society for Information Display 27 1191

    [16]

    Li M, Lan L F, Xu M, Luo D X, Xiao P, Peng J B 2014 Solid State Electron 91 9

    [17]

    Di G, Dong H K, Man J S, Mallory M, Jin J 2012 Society for Information Display 3 38

  • [1]

    Liu B Q, Lan L F, Zou J H, Peng J B 2013 Acta Phys. Sin. 62 087302 (in Chinese) [刘佰全, 兰林锋, 邹建华, 彭俊彪 2013 62 087302]

    [2]

    Liu B Q, Tao H, Su Y J, Gao D Y, Lan L F, Zou J H, Peng J B 2013 Chin. Phys. B 22 077303

    [3]

    Liu Y, Wu W J, Li B, SI Y F, Wang L, Liu Y R 2014 Acta Phys. Sin. 63 098503 (in Chinese) [刘远, 吴为敬, 李斌, 思云飞, 王磊, 刘玉荣 2014 63 098503]

    [4]

    Cao Y,Tao H,Zou J H, Xu M, Lan L F, Wang L,Peng J B 2012 Journal of South China University of Technology 40 1 (in Chinese) [曹镛, 陶洪, 邹建华, 徐苗, 兰林锋, 王磊, 彭俊彪 2012 华南理工大学学报(自然科学版) 40 1]

    [5]

    Lan L, Xiong N, Xiao P, Li M, Xu H, Yao R, Wen S, Peng J 2013 Appl. Phys Lett. 102 242102

    [6]

    Xu H, Lan L F, Li M, Luo D X, Xiao P, Lin Z G, Ning H L, Peng J B 2014 Acta Phys. Sin. 63 038501 (in Chinese) [徐华, 兰林锋, 李民, 罗东向, 肖鹏, 林振国, 宁洪龙, 彭俊彪 2014 63 038501]

    [7]

    Zhou L, Xu M, Wu W J, Xia X H, Wang L, Peng J B 2015 Chinese Journal of Luminescence 36 577 (in Chinese) [周雷, 徐苗, 吴为敬, 夏兴衡, 王磊, 彭俊彪 2015 发光学报 36 577]

    [8]

    Chih L L, Chun D T, Min C C, Jian S Y 2011 Journal of Display Technology 7 10

    [9]

    Jae E P, Min K R, Chi S H, Shin H Y, Sang H K P, Sung M Y, Hong K L, Youn K K, Joon D K, Hwan S O, Kee C P 2012 Electron Device Letters 33 1144

    [10]

    Arokia N, Anil K, Kapil S, Peyman S, Sanjiv S, Denis S 2004 Journal of Solid-State Circuit 39 1477

    [11]

    Lee Y W, Kim S J, Lee S Y, Lee W G, Yoon K S, Park J W, Kwon J Y, Han M K 2012 Electrochemical and Solid-State Letters 15 H126

    [12]

    Binn K, Seung C C, Jeong S L, Sun J K, Yong H J, Soo Y Y, Chang D K, Min K H 2011 Transations On Electron Devices 58 3012

    [13]

    Wu W J, Li G M, Xia X H, Zhang L R, Zhou L, Xu M 2014 Journal Of Display Technology 10 523

    [14]

    Wu W J, Song X F, Zhang L R, Zhou L, Xu M, Wang L, Peng J B Transations On Electron Devices 61 3335

    [15]

    Binn K, Lee Y U, Han M K, Seung C C, Yong H J, Park K S, Kim C D 2011 Society for Information Display 27 1191

    [16]

    Li M, Lan L F, Xu M, Luo D X, Xiao P, Peng J B 2014 Solid State Electron 91 9

    [17]

    Di G, Dong H K, Man J S, Mallory M, Jin J 2012 Society for Information Display 3 38

  • [1] Xu Hua, Liu Jing-Dong, Cai Wei, Li Min, Xu Miao, Tao Hong, Zou Jian-Hua, Peng Jun-Biao. Effect of N 2O treatment on performance of back channel etched metal oxide thin film transistors. Acta Physica Sinica, 2022, 71(5): 058503. doi: 10.7498/aps.71.20211350
    [2] Lu Bin, Wang Da-Wei, Chen Yu-Lei, Cui Yan, Miao Yuan-Hao, Dong Lin-Peng. Capacitance model for nanowire gate-all-around tunneling field-effect-transistors. Acta Physica Sinica, 2021, 70(21): 218501. doi: 10.7498/aps.70.20211128
    [3] Chen Jun-Dong, Han Wei-Hua, Yang Chong, Zhao Xiao-Song, Guo Yang-Yan, Zhang Xiao-Di, Yang Fu-Hua. Recent research progress of ferroelectric negative capacitance field effect transistors. Acta Physica Sinica, 2020, 69(13): 137701. doi: 10.7498/aps.69.20200354
    [4] Deng Xiao-Qing, Deng Lian-Wen, He Yi-Ni, Liao Cong-Wei, Huang Sheng-Xiang, Luo Heng. Leakage current model of InGaZnO thin film transistor. Acta Physica Sinica, 2019, 68(5): 057302. doi: 10.7498/aps.68.20182088
    [5] Ma Qun-Gang, Zhou Liu-Fei, Yu Yue, Ma Guo-Yong, Zhang Sheng-Dong. Electro-static discharge failure analysis and design optimization of gate-driver on array circuit in InGaZnO thin film transistor backplane. Acta Physica Sinica, 2019, 68(10): 108501. doi: 10.7498/aps.68.20190265
    [6] Qin Ting, Huang Sheng-Xiang, Liao Cong-Wei, Yu Tian-Bao, Luo Heng, Liu Sheng, Deng Lian-Wen. Floating gate effect in amorphous InGaZnO thin-film transistor. Acta Physica Sinica, 2018, 67(4): 047302. doi: 10.7498/aps.67.20172325
    [7] Guo Li-Qiang, Wen Juan, Cheng Guang-Gui, Yuan Ning-Yi, Ding Jian-Ning. Dual in-plane-gate coupled IZO thin film transistor based on capacitive coupling effect in KH550-GO solid electrolyte. Acta Physica Sinica, 2016, 65(17): 178501. doi: 10.7498/aps.65.178501
    [8] Wang Xiong, Cai Xi-Kun, Yuan Zi-Jian, Zhu Xia-Ming, Qiu Dong-Jiang, Wu Hui-Zhen. Study of zinc tin oxide thin-film transistor. Acta Physica Sinica, 2011, 60(3): 037305. doi: 10.7498/aps.60.037305
    [9] Feng Chao-Wen, Cai Li, Kang Qiang, Peng Wei-Dong, Bai Peng, Wang Jia-Fu. Realization of the discrete chaotic system based on SET-MOS circuits. Acta Physica Sinica, 2011, 60(11): 110502. doi: 10.7498/aps.60.110502
    [10] Liu Yu-Rong, Chen Wei, Liao Rong. Low-operating-voltage polymer thin-film transistors based on poly(3-hexylthiophene). Acta Physica Sinica, 2010, 59(11): 8088-8092. doi: 10.7498/aps.59.8088
    [11] Xu Tian-Ning, Wu Hui-Zhen, Zhang Ying-Ying, Wang Xiong, Zhu Xia-Ming, Yuan Zi-Jian. Fabrication and performance of indium oxide based transparent thin film transistors. Acta Physica Sinica, 2010, 59(7): 5018-5022. doi: 10.7498/aps.59.5018
    [12] Zou Jian-Hua, Lan Lin-Feng, Xu Rui-Xia, Yang Wei, Peng Jun-Biao. Integration of organic thin-film transistor and polymer light-emitting diodes. Acta Physica Sinica, 2010, 59(2): 1275-1281. doi: 10.7498/aps.59.1275
    [13] Sun Qin-Jun, Xu Zheng, Zhao Su-Ling, Zhang Fu-Jun, Gao Li-Yan, Tian Xue-Yan, Wang Yong-Sheng. Contact effect in organic thin film transistors. Acta Physica Sinica, 2010, 59(11): 8125-8130. doi: 10.7498/aps.59.8125
    [14] Yuan Guang-Cai, Xu Zheng, Zhao Su-Ling, Zhang Fu-Jun, Xu Na, Sun Qin-Jun, Xu Xu-Rong. Study of the characteristics of organic thin film transistors with phenyltrimethoxysilane buffer under low gate modulation voltage. Acta Physica Sinica, 2009, 58(7): 4941-4947. doi: 10.7498/aps.58.4941
    [15] Su Jie, Wang Ji-Suo, Liang Bao-Long, Zhang Xiao-Yan. The energy and thermal effects of mesoscopic capacitance coupling LC circuit at finite temperature. Acta Physica Sinica, 2008, 57(11): 7216-7220. doi: 10.7498/aps.57.7216
    [16] Qiu Shen-Yu, Cai Shao-Hong. Quantum effect of dissipative mesoscopic capacitance coupled circuit. Acta Physica Sinica, 2006, 55(2): 816-819. doi: 10.7498/aps.55.816
    [17] Liu Hong-Xia, Zheng Xue-Feng, Hao Yue. Generation mechanism of stress induced leakage current in flash memory cell. Acta Physica Sinica, 2005, 54(12): 5867-5871. doi: 10.7498/aps.54.5867
    [18] Song Tong-Qiang. Quantization of dissipative mesoscopic capacitance coupling circuit. Acta Physica Sinica, 2004, 53(5): 1352-1356. doi: 10.7498/aps.53.1352
    [19] Long Chao-Yun, Liu Bo, Wang Xin-Fu. . Acta Physica Sinica, 2002, 51(1): 159-162. doi: 10.7498/aps.51.159
    [20] WANG JI-SUO, HAN BAO-CUN, SUN CHANG-YONG. QUANTUM FLUCTUATIONS IN MESOSCOPIC CAPACITANCE COUPLED CIRCUITS. Acta Physica Sinica, 1998, 47(7): 1187-1192. doi: 10.7498/aps.47.1187
Metrics
  • Abstract views:  6946
  • PDF Downloads:  259
  • Cited By: 0
Publishing process
  • Received Date:  20 July 2015
  • Accepted Date:  06 October 2015
  • Published Online:  20 January 2016

/

返回文章
返回
Baidu
map