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We perform a series of computer simulations and optical experiments for multiple-wavelength ptychographic imaging to analyze the relationship between the imaging quality and the magnitude of wavelength. Two kinds of samples including the grating-like and the biological sample are tested. Our experimental results are highly consistent with simulations, demonstrating the feasibility and effectiveness of the multiple-wavelength ptychography. Compared with the single-wavelength ptychographic imaging, it can achieve very good imaging quality with a fast speed of iterative convergence and a high robustness to the noises in the case of multiple-wavelengh ptychography. In addition, optical experiments also reveal that with the magnitude of wavelength increasing, the complexity of the ptychographic system is grown up within increased noises and errors, which causes the imaging quality to keep no enhancement or even to get worse. For our concrete configuration in this paper, with a simple digital procedure for noise depressing, the best results may be obtained for the case of dual-wavelength. Furthermore, it implies that there is an optimized condition for multiple-wavelength ptychography. We find that it requires mainly analyzing the balance between the multiple-wavelength-benefited noise-resistance and the systematic complexity for the optimized condition, which may be really important and meaningful for the practical utilizing of multiple-wavelength ptychography.
[1] Thibault P, Dierolf M, Bunk O, Menzel A, Pfeiffer F 2009 Ultramicroscopy 109 338
[2] Rodenburg J M 2008 Adv. Imag. Electron Phys. 150 87
[3] Rodenburg J M, Hurst A C, Cullis A G 2007 Ultramicroscopy 107 227
[4] Humphry M J, Kraus B, Hurst A C, Maiden A M, Rodenburg J M 2012 Nat. Commun. 3 1733
[5] Shi Y S, Li T, Wang Y L, Gao Q K, Zhang S G, Li H S 2013 Opt. Lett. 38 1425
[6] Wang Z H, Wang Y L, Li T, Shi Y S 2014 Acta Phys. Sin. 63 164204 (in Chinese) [王治昊, 王雅丽, 李拓, 史祎诗 2014 63 164204]
[7] Maiden A M, Humphry M J, Zhang F, Rodenburg J M 2011 J. Opt. Soc. Am. A 28 604
[8] Gazit S, Szameit A, Eldar Y C, Segev M 2009 Opt. Express 17 23920
[9] Rodenburg J M 1989 Ultramicroscopy 27 413
[10] Hoppe W 1969 Acta Cryst. A 25 495
[11] Rodenburg J M, Faulkner H M L 2004 Appl. Phys. Lett. 85 4795
[12] Faulkner H M L, Rodenburg J M 2004 Phys. Rev. Lett. 93 023903
[13] Maiden A M, Rodenburg J M 2009 Ultramicroscopy 109 1256
[14] Claus D, Robinson D J, Chetwynd D G, Shuo Y, Pike W T, José J D J, Rodenburg J M 2013 J. Opt. 15 035702
[15] Wang Y L, Shi Y S, Li T, Gao Q K, Xiao J, Zhang S G 2013 Acta Phys. Sin. 62 064206 (in Chinese) [王雅丽, 史祎诗, 李拓, 高乾坤, 肖俊, 张三国 2013 62 064206]
[16] Pan X C, Liu C, Lin Q, Zhu J Q 2013 Opt. Express 21 6162
[17] Shi Y S, Situ G H, Zhang J J 2008 Opt. Lett. 33 542
[18] Gao Q K, Wang Y L, Li T, Shi Y S 2014 Appl. Opt. 53 4700
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[1] Thibault P, Dierolf M, Bunk O, Menzel A, Pfeiffer F 2009 Ultramicroscopy 109 338
[2] Rodenburg J M 2008 Adv. Imag. Electron Phys. 150 87
[3] Rodenburg J M, Hurst A C, Cullis A G 2007 Ultramicroscopy 107 227
[4] Humphry M J, Kraus B, Hurst A C, Maiden A M, Rodenburg J M 2012 Nat. Commun. 3 1733
[5] Shi Y S, Li T, Wang Y L, Gao Q K, Zhang S G, Li H S 2013 Opt. Lett. 38 1425
[6] Wang Z H, Wang Y L, Li T, Shi Y S 2014 Acta Phys. Sin. 63 164204 (in Chinese) [王治昊, 王雅丽, 李拓, 史祎诗 2014 63 164204]
[7] Maiden A M, Humphry M J, Zhang F, Rodenburg J M 2011 J. Opt. Soc. Am. A 28 604
[8] Gazit S, Szameit A, Eldar Y C, Segev M 2009 Opt. Express 17 23920
[9] Rodenburg J M 1989 Ultramicroscopy 27 413
[10] Hoppe W 1969 Acta Cryst. A 25 495
[11] Rodenburg J M, Faulkner H M L 2004 Appl. Phys. Lett. 85 4795
[12] Faulkner H M L, Rodenburg J M 2004 Phys. Rev. Lett. 93 023903
[13] Maiden A M, Rodenburg J M 2009 Ultramicroscopy 109 1256
[14] Claus D, Robinson D J, Chetwynd D G, Shuo Y, Pike W T, José J D J, Rodenburg J M 2013 J. Opt. 15 035702
[15] Wang Y L, Shi Y S, Li T, Gao Q K, Xiao J, Zhang S G 2013 Acta Phys. Sin. 62 064206 (in Chinese) [王雅丽, 史祎诗, 李拓, 高乾坤, 肖俊, 张三国 2013 62 064206]
[16] Pan X C, Liu C, Lin Q, Zhu J Q 2013 Opt. Express 21 6162
[17] Shi Y S, Situ G H, Zhang J J 2008 Opt. Lett. 33 542
[18] Gao Q K, Wang Y L, Li T, Shi Y S 2014 Appl. Opt. 53 4700
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