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Spectral interferometry using frequency comb has become a powerful approach to absolute distance measurement. In this paper, we analyze the principle of spectral interferometry in detail. With the consideration of dispersion, pulse chirp and the power ratio of the reference pulse and the measurement pulse, we develop a Gaussian model, which can be used to determine distances. The frequency of the spectral interference fringe is of key importance. The distances can be directly determined by the frequency of the spectral interference fringe through one-step fast Fourier transform with no filters during the data processing. The simulation results show that the maximum deviation is 1.5 nm when the distance is 1.5 mm theoretically. The comb consists of hundreds of thousands of teeth in the spectral domain, and each tooth can be regarded as a cw laser. We propose a method based on the phases of two close modes. The principle is introduced, and the maximum deviation is 8.7 nm with a distance of 1.5 mm while the minimum deviation is 0.3 nm corresponding to distance of 0.5 mm. We theoretically show that the linear pulse chirp can be used for distance measurement. The measurement principle is analyzed, and the simulation shows that the maximum deviation is 5.3 nm when the distance is 1.2 mm.
[1] Liao S S, Yang T, Dong J J 2014 Chin. Phys. B 23 073201
[2] Zhu M H, Wu X J, Wei H Y, Zhang L Q, Zhang J T, Li Y 2013 Acta Phys. Sin. 62 070702 (in Chinese) [朱敏昊, 吴学健, 尉昊赟, 张丽琼, 张继涛, 李岩 2013 62 070702]
[3] Xing S J, Zhang F M, Cao S Y, Wang G W, Qu X H 2013 Acta Phys. Sin. 62 170603 (in Chinese) [邢书剑, 张福民, 曹士英, 王高文, 曲兴华 2013 62 170603]
[4] Zhang Y C, Wu J Z, Li Y Q, Jin L, Ma J, Wang L R, Zhao Y T, Xiao L T, Jia S T 2012 Chin. Phys. B 21 113701
[5] Wu H Z, Cao S Y, Zhang F M, Xing S J, Qu X H 2014 Acta Phys. Sin. 63 100601 (in Chinese) [吴翰钟, 曹士英, 张福民, 邢书剑, 曲兴华 2014 63 100601]
[6] Minoshima K, Matsumoto H 2000 Appl. Opt. 39 5512
[7] Baumann E, Giorgetta F R, Coddington I, Sinclair L C, Knabe K, Swann W C, Newbury N R 2013 Opt. Lett. 38 2026
[8] Hyun S, Kim Y J, Kim Y, Kim S W 2010 CIRP Annals: Manufacturing Technology 59 555
[9] Schuhler N, Salvadé Y, Lévêque S, Dändliker R, Holzwarth R 2006 Opt. Lett. 31 3101
[10] Salvadé Y, Schuhler N, Lévêque S, Floch S L 2008 Appl. Opt. 47 2715
[11] Ye J 2004 Opt. Lett. 29 1153
[12] Wang X N, Takahashi S, Takamasu K, Matsumoto H 2012 Opt. Express 20 2725
[13] Balling P, Křen P, Mašika P, van den Berg S A 2009 Opt. Express 17 9300
[14] Wu H, Zhang F, Cao S, Xing S, Qu X 2014 Opt. Express 22 10380
[15] Coddington I, Swann W C, Nenadovic L, Newbury N R 2009 Nat. Photon. 3 351
[16] Zhang H, Wei H, Wu X, Yang H, Li Y 2014 Opt. Express 22 6597
[17] Lee J, Han S, Lee K, Bae E, Kim S, Lee S, Kim S W, Kim Y J 2013 Meas. Sci. Technol. 24 045201
[18] Joo K, Kim S 2006 Opt. Express 14 5954
[19] Cui M, Zeitouny M G, Bhattacharya N, van den Berg S A, Urbach H P 2011 Opt. Express 19 6549
[20] Berg van den S A, Persijn S T, Kok G J P 2012 Phys. Rev. Lett. 108 183901
[21] Li Y, Hu K, Ji R, Liu D, Zhou W 2014 Opt. Eng. 53 122409
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[1] Liao S S, Yang T, Dong J J 2014 Chin. Phys. B 23 073201
[2] Zhu M H, Wu X J, Wei H Y, Zhang L Q, Zhang J T, Li Y 2013 Acta Phys. Sin. 62 070702 (in Chinese) [朱敏昊, 吴学健, 尉昊赟, 张丽琼, 张继涛, 李岩 2013 62 070702]
[3] Xing S J, Zhang F M, Cao S Y, Wang G W, Qu X H 2013 Acta Phys. Sin. 62 170603 (in Chinese) [邢书剑, 张福民, 曹士英, 王高文, 曲兴华 2013 62 170603]
[4] Zhang Y C, Wu J Z, Li Y Q, Jin L, Ma J, Wang L R, Zhao Y T, Xiao L T, Jia S T 2012 Chin. Phys. B 21 113701
[5] Wu H Z, Cao S Y, Zhang F M, Xing S J, Qu X H 2014 Acta Phys. Sin. 63 100601 (in Chinese) [吴翰钟, 曹士英, 张福民, 邢书剑, 曲兴华 2014 63 100601]
[6] Minoshima K, Matsumoto H 2000 Appl. Opt. 39 5512
[7] Baumann E, Giorgetta F R, Coddington I, Sinclair L C, Knabe K, Swann W C, Newbury N R 2013 Opt. Lett. 38 2026
[8] Hyun S, Kim Y J, Kim Y, Kim S W 2010 CIRP Annals: Manufacturing Technology 59 555
[9] Schuhler N, Salvadé Y, Lévêque S, Dändliker R, Holzwarth R 2006 Opt. Lett. 31 3101
[10] Salvadé Y, Schuhler N, Lévêque S, Floch S L 2008 Appl. Opt. 47 2715
[11] Ye J 2004 Opt. Lett. 29 1153
[12] Wang X N, Takahashi S, Takamasu K, Matsumoto H 2012 Opt. Express 20 2725
[13] Balling P, Křen P, Mašika P, van den Berg S A 2009 Opt. Express 17 9300
[14] Wu H, Zhang F, Cao S, Xing S, Qu X 2014 Opt. Express 22 10380
[15] Coddington I, Swann W C, Nenadovic L, Newbury N R 2009 Nat. Photon. 3 351
[16] Zhang H, Wei H, Wu X, Yang H, Li Y 2014 Opt. Express 22 6597
[17] Lee J, Han S, Lee K, Bae E, Kim S, Lee S, Kim S W, Kim Y J 2013 Meas. Sci. Technol. 24 045201
[18] Joo K, Kim S 2006 Opt. Express 14 5954
[19] Cui M, Zeitouny M G, Bhattacharya N, van den Berg S A, Urbach H P 2011 Opt. Express 19 6549
[20] Berg van den S A, Persijn S T, Kok G J P 2012 Phys. Rev. Lett. 108 183901
[21] Li Y, Hu K, Ji R, Liu D, Zhou W 2014 Opt. Eng. 53 122409
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