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- Zhang Shi-Bin2,
- Liao Xian-Bo2,
- An Long1,
- Yang Fu-Hua1,
- Kong Guang-Lin2,
- Wang Yong-Qian2,
- Xu Yan-Yue2,
- Chen Chang-Yong2,
- Diao Hong-Wei2
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(1)中国科学院半导体所超晶格与微结构国家重点实验室,北京100083; (2)中国科学院半导体研究所凝聚态物理中心,表面物理国家重点实验室,北京100083
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[1] Jiang Mei-Yan, Zhu Zheng-Jie, Chen Cheng-Ke, Li Xiao, Hu Xiao-Jun. Microstructural and electrochemical properties of sulfur ion implanted nanocrystalline diamond films. Acta Physica Sinica, 2019, 68(14): 148101. doi: 10.7498/aps.68.20190394 [2] Liu Yuan, He Hong-Yu, Chen Rong-Sheng, Li Bin, En Yun-Fei, Chen Yi-Qiang. Low-frequency noise in hydrogenated amorphous silicon thin film transistor. Acta Physica Sinica, 2017, 66(23): 237101. doi: 10.7498/aps.66.237101 [3] Wang Rui, Hu Xiao-Jun. The microstructural and electrochemical properties of oxygen ion implanted nanocrystalline diamond films. Acta Physica Sinica, 2014, 63(14): 148102. doi: 10.7498/aps.63.148102 [4] Gu Shan-Shan, Hu Xiao-Jun, Huang Kai. Effects of annealing temperature on the microstructure and p-type conduction of B-doped nanocrystalline diamond films. Acta Physica Sinica, 2013, 62(11): 118101. doi: 10.7498/aps.62.118101 [5] Yang Duo, Zhong Ning, Shang Hai-Long, Sun Shi-Yang, Li Ge-Yang. Microstructures and mechanical properties of (Ti, N)/Al nanocomposite films by magnetron sputtering. Acta Physica Sinica, 2013, 62(3): 036801. doi: 10.7498/aps.62.036801 [6] Kang Kun-Yong, Deng Shu-Kang, Shen Lan-Xian, Sun Qi-Li, Hao Rui-Ting, Hua Qi-Lin, Tang Run-Sheng, Yang Pei-Zhi, Li Ming. Effect of annealing on crystalline property of poly-Si thin-film by Ge-induce crystallization. Acta Physica Sinica, 2012, 61(19): 198101. doi: 10.7498/aps.61.198101 [7] Hu Heng, Hu Xiao-Jun, Bai Bo-Wen, Chen Xiao-Hu. Effects of annealing time on the microstructural and electrochemical properties of B-doped nanocrystalline diamond films. Acta Physica Sinica, 2012, 61(14): 148101. doi: 10.7498/aps.61.148101 [8] Chen Xiao-Xue, Yao Ruo-He. DC characteristic research based on surface potential for a-Si:H thin-film transistor. Acta Physica Sinica, 2012, 61(23): 237104. doi: 10.7498/aps.61.237104 [9] Qiang Lei, Yao Ruo-He. Distributions of the threshold voltage and the temperature in the channel of amorphous silicon thin film transistors. Acta Physica Sinica, 2012, 61(8): 087303. doi: 10.7498/aps.61.087303 [10] Zhang Zeng-Yuan, Gao Xiao-Yong, Feng Hong-Liang, Ma Jiao-Min, Lu Jing-Xiao. Effect of vacuum thermal-annealing temperatures on the microstructure and optical properties of single-phased Ag2O film. Acta Physica Sinica, 2011, 60(3): 036107. doi: 10.7498/aps.60.036107 [11] Wang Li-Hong, You Jing-Lin, Wang Yuan-Yuan, Zheng Shao-Bo, Simon Patrick, Hou Min, Ji Zi-Fang. Temperature dependent Raman spectra and micro-structure study of hexagonal MgTiO3 crystal. Acta Physica Sinica, 2011, 60(10): 104209. doi: 10.7498/aps.60.104209 [12] Duan Bao-Xing, Yang Yin-Tang. Calculation of Raman shifts of Si(1-x)Gex and amorphous silicon using Keating model. Acta Physica Sinica, 2009, 58(10): 7114-7118. doi: 10.7498/aps.58.7114 [13] Liu Xue-Qin, Han Guo-Jian, Huang Chun-Kui, Lan Wei. Thickness dependence of microstructure for La0.9Sr0.1MnO3/Si films determined by micro-Raman spectroscopy. Acta Physica Sinica, 2009, 58(11): 8008-8013. doi: 10.7498/aps.58.8008 [14] Li Shi-Bin, Wu Zhi-Ming, Yuan Kai, Liao Nai-Man, Li Wei, Jiang Ya-Dong. Study on thermal conductivity of hydrogenated amorphous silicon films. Acta Physica Sinica, 2008, 57(5): 3126-3131. doi: 10.7498/aps.57.3126 [15] Huang Rui, Lin Xuan-Ying, Yu Yun-Peng, Lin Kui-Xun, Zhu Zu-Song, Wei Jun-Hong. Effect of hydrogen dilution on structure and optical properties of polycrystalline silicon films. Acta Physica Sinica, 2006, 55(5): 2523-2528. doi: 10.7498/aps.55.2523 [16] Liu Xiao-Bing, Shi Xiang-Hua, Liao Tai-Chang, Ren Peng, Liu Yue, Liu Yi, Xiong Zu-Hong, Ding Xun-Min, Hou Xiao-Yuan. The microstructure and characteristics of luminescent porous silicon film prepared by the physicochemical sonic-vacating method. Acta Physica Sinica, 2005, 54(1): 416-421. doi: 10.7498/aps.54.416 [17] Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Gu Jin-Hua, Zhou Yu-Qin, Liu Jin-Long, Dong Bao-Zhong, Li Guo-Hua, Ding Kun. The microstructure of hydrogenated microcrystalline silicon thin films studied by small-angle x-ray scattering. Acta Physica Sinica, 2005, 54(5): 2172-2175. doi: 10.7498/aps.54.2172 [18] Xu Yan-Yue, Kong Guang-Lin, Zhang Shi-Bin, Hu Zhi-Hua, Zeng Xiang-Bo, Diao Hong-Wei, Liao Xian-Bo. Preparation and characterization of the stable nc-Si/a-Si:H films. Acta Physica Sinica, 2003, 52(6): 1465-1468. doi: 10.7498/aps.52.1465 [19] Wang Yong-Qian, Chen Wei-De, Chen Chang-Yong, Diao Hong-Wei, Zhang Shi-Ben, Xu Yan-Yue, Kong Guang-Lin, Liao Xian-Bo. . Acta Physica Sinica, 2002, 51(7): 1564-1570. doi: 10.7498/aps.51.1564 [20] WANG YONG-QIAN, CHEN CHANG-YONG, CHEN WEI-DE, YANG FU-HUA, DIAO HONG-WEI, XU ZHEN-JIA, ZHANG SHI-BIN, KONG GUANG-LIN, LIAO XIAN-BO. THE MICROSTRUCTURE AND ITS HIGH-TEMPERATURE ANNEALING BEHAVIOURS OF a-Si∶O∶H FILM. Acta Physica Sinica, 2001, 50(12): 2418-2422. doi: 10.7498/aps.50.2418
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Publishing process
- Received Date:
26 November 2001
- Accepted Date:
07 January 2002
- Published Online:
05 April 2002