[1] |
Zhu Meng-Long, Yang Jun, Dong Yu-Lan, Zhou Yuan, Shao Yan, Hou Hai-Liang, Chen Zhi-Hui, He Jun. Atomic and electronic structure of monolayer ferroelectric GeS on Cu(111). Acta Physica Sinica,
2024, 73(1): 010701.
doi: 10.7498/aps.73.20231246
|
[2] |
Xu Si-Wei, Wang Xun-Si, Shen Xiang. Structure of GexGa8S92–x glasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scattering. Acta Physica Sinica,
2023, 72(1): 017101.
doi: 10.7498/aps.72.20221653
|
[3] |
Liang Qi, Yang Meng-Qi, Zhang Jing-Yang, Wang Ru-Zhi. PECVD-prepared high-quality GaN films and their photoresponse properties. Acta Physica Sinica,
2022, 71(9): 097302.
doi: 10.7498/aps.71.20211922
|
[4] |
Tang Dao-Sheng, Hua Yu-Chao, Zhou Yan-Guang, Cao Bing-Yang. Thermal conductivity modeling of GaN films. Acta Physica Sinica,
2021, 70(4): 045101.
doi: 10.7498/aps.70.20201611
|
[5] |
Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng. Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica,
2018, 67(2): 027301.
doi: 10.7498/aps.67.20172055
|
[6] |
Xu Si-Wei, Wang Li, Shen Xiang. Raman scattering and X-ray photoelectron spectra of GexSb20Se80-x Glasses. Acta Physica Sinica,
2015, 64(22): 223302.
doi: 10.7498/aps.64.223302
|
[7] |
Liang Wen-Long, Wang Yi-Man, Liu Wei, Li Hong-Yi, Wang Jin-Shu. Study of mini-themionic electron sources for vacuum electron THz devices. Acta Physica Sinica,
2014, 63(5): 057901.
doi: 10.7498/aps.63.057901
|
[8] |
Shi Gao-Ming, Zou Zhi-Qiang, Sun Li-Min, Li Wei-Cong, Liu Xiao-Yong. Scanning tunneling mircroscopy and X-ray photoelectron spectroscopy studies of MnSi film and MnSi1.7 nanowires grown on Si substrates. Acta Physica Sinica,
2012, 61(22): 227301.
doi: 10.7498/aps.61.227301
|
[9] |
Zou Ji-Jun, Zhang Yi-Jun, Yang Zhi, Chang Ben-Kang. Degradation model of GaAs vacuum electron sources. Acta Physica Sinica,
2011, 60(1): 017902.
doi: 10.7498/aps.60.017902
|
[10] |
Zhang Wang, Xu Fa-Qiang, Wang Guo-Dong, Zhang Wen-Hua, Li Zong-Mu, Wang Li-Wu, Chen Tie-Xin. Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission. Acta Physica Sinica,
2011, 60(1): 017104.
doi: 10.7498/aps.60.017104
|
[11] |
Han Lu-Hui, Zhang Chong-Hong, Zhang Li-Qing, Yang Yi-Tao, Song Yin, Sun You-Mei. X-ray photoelectron spectroscopy study on GaN crystal irradiated by slow highly charged ions. Acta Physica Sinica,
2010, 59(7): 4584-4590.
doi: 10.7498/aps.59.4584
|
[12] |
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
doi: 10.7498/aps.58.2742
|
[13] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
doi: 10.7498/aps.57.7119
|
[14] |
. Properties of Co nano-films deposited on monocrystalline silicon surface by ion beam sputtering. Acta Physica Sinica,
2007, 56(12): 7158-7164.
doi: 10.7498/aps.56.7158
|
[15] |
Yuan Jin-She, Chen Guang-De. Instantaneous relaxation of photoconductivity in GaN film grown on vicinal sapphire substrate by MBE. Acta Physica Sinica,
2007, 56(7): 4218-4223.
doi: 10.7498/aps.56.4218
|
[16] |
Peng Dong-Sheng, Feng Yu-Chun, Wang Wen-Xin, Liu Xiao-Feng, Shi Wei, Niu Han-Ben. A new method to grow high quality GaN film by MOCVD. Acta Physica Sinica,
2006, 55(7): 3606-3610.
doi: 10.7498/aps.55.3606
|
[17] |
Wang Xiao-Xiong, Li Hong-Nian. Core-level photoemission of Sm fullerides. Acta Physica Sinica,
2006, 55(8): 4259-4264.
doi: 10.7498/aps.55.4259
|
[18] |
Feng Yu-Qing, Zhao Kun, Zhu Tao, Zhan Wen-Shan. Thermal stability of magnetic tunnel junctions investigated by x-ray photoelectron spectroscopy. Acta Physica Sinica,
2005, 54(11): 5372-5376.
doi: 10.7498/aps.54.5372
|
[19] |
Ou Gu-Ping, Song Zhen, Gui Wen-Ming, Zhang Fu-Jia. Surface analysis of LiBq4/ITO and LiBq4/CuPc/ITO using atomic force microscopy and x-ray photoelectron spectroscopy. Acta Physica Sinica,
2005, 54(12): 5717-5722.
doi: 10.7498/aps.54.5717
|
[20] |
LI LIU-HE, ZHANG HAI-QUAN, CUI XU-MING, ZHANG YAN-HUA, XIA LI-FANG, MA XIN-XIN, SUN YUE. COMPARATIVE ANALYSIS OF DLC FLIM FINE STRUCTURE BY RAMAN SPECTRA AND X-RAY PHOTOELECTRON SPECTROSCOPY. Acta Physica Sinica,
2001, 50(8): 1549-1554.
doi: 10.7498/aps.50.1549
|