Preparation and performance of double-layer metal mesh transparent conductive films based on crack template method

LIAO Dunwei; ZHOU Jianhua; ZHENG Yuejun

doi:10.7498/aps.74.20241305

Abstract

In order to improve the electromagnetic shielding performance of the single-layer metal mesh transparent conductive films (SMMTCFs) based on the crack template method, the preparation of double-layer metal mesh transparent conductive films (DMMTCFs) by using the crack template method is studied. The double-layer cracked templates are prepared by spin-coating crack glue on both sides of the transparent substrate and by pulling the transparent substrate from the cracked adhesive solution with a certain rate to obtain the corresponding double-layer cracked templates, respectively. After obtaining the double-layer crack templates by the spin-coating method and the pulling method, respectively, the corresponding DMMTCF samples are obtained by metal deposition and degumming process. First, the performances of single-layer and double-layer metal mesh samples prepared by the spin-coating method under the same conditions are measured and compared with each other, and the optical transmittance of the double-layer structure decreases by nearly 10.9% compared with that of the single-layer structure, while the electromagnetic shielding effectiveness in the Ku band (12–18 GHz) increases by 30 dB. In addition, the double-layer metal mesh sample prepared by the pulling method is also tested. Compared with the single-layer metal mesh sample prepared under the same conditions, the double-layer structure can improve electromagnetic shielding effectiveness in the Ku band by 20 dB under the premise of losing 8.38% optical transmittance. The measurement results show that the electromagnetic shielding performance of the double-layer metal mesh transparent conductive films can be significantly improved at the expense of some optical transmittance performances. Through the preparation and performance study of DMMTCFs based on the cracked template method, the low-cost advantage of the cracked template method can be fully utilized to prepare DMMTCFs with high electromagnetic shielding performance.

Keywords:

Authors and contacts

1.
School of Information Science and Engineering, Shaoyang University, Shaoyang 422000, China
2.
College of Electronic Science and Technology, National University of Defense Technology, Changsha 410073, China

Corresponding author: ZHENG Yuejun, zhengyuejun18@nudt.edu.cn

Funds: Project supported by the National Natural Science Foundation of China (Grant No. 61901493) and the Natural Science Foundation of Hunan Province, China (Grant No. 2022JJ50239).

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References

[1]	Qiu L, Li L, Pan Z, Sun X, Yan W 2018 MATEC Web of Conferences 189 1003 Google Scholar
[2]	Wang W, Bai B, Zhou Q, Ni K, Lin H 2018 Opt. Mater. Express 8 3485 Google Scholar
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Cited By

图 1 双层裂纹模板的金相显微镜观测结果图　(a) 10×镜头下的正面裂纹图案; (b) 20×镜头下的正面裂纹图案; (c) 10×镜头下的背面裂纹图案; (d) 20×镜头下的背面裂纹图案

Figure 1. Metallographic microscope observation pattern of the double-layer crack template: (a) Top crack pattern under 10× lens; (b) top crack pattern under 20× lens; (c) bottom crack pattern under 10× lens; (d) bottom crack pattern under 20× lens.

DownLoad: Full-Size Img PowerPoint

图 2 双层金属沉积样品示意图

Figure 2. Schematic of the double-layer metal deposition sample.

DownLoad: Full-Size Img PowerPoint

图 3 双层金属沉积样品的金相显微镜观测结果图　(a) 10×镜头下的正面金属沉积图案; (b) 20×镜头下的正面金属沉积图案; (c) 10×镜头下的背面金属沉积图案; (d) 20×镜头下的背面金属沉积图案

Figure 3. Metallographic microscope observation pattern of the double-layer metal deposition: (a) Top metal deposition pattern under 10× lens; (b) top metal deposition pattern under 20× lens; (c) bottom metal deposition pattern under 10× lens; (d) bottom metal deposition pattern under 20× lens.

DownLoad: Full-Size Img PowerPoint

图 4 双层MMTCF样品示意图

Figure 4. Diagram of the double-layer MMTCF sample.

DownLoad: Full-Size Img PowerPoint

图 5 双层金属网格样品的金相显微镜观测结果图　(a) 10×镜头下的正面金属网格图案; (b) 20×镜头下的正面金属网格图案; (c) 10×镜头下的背面金属网格图案; (d) 20×镜头下的背面金属网格图案

Figure 5. Metallographic microscope observation pattern of the double-layer metal mesh: (a) Top metal mesh pattern under 10× lens; (b) top metal mesh pattern under 20× lens; (c) bottom metal mesh pattern under 10× lens; (d) bottom metal mesh pattern under 20× lens.

DownLoad: Full-Size Img PowerPoint

图 6 提拉法制备裂纹模板示意图

Figure 6. Schematic of crack template prepared by pulling method.

DownLoad: Full-Size Img PowerPoint

图 7 提拉法制备的双层裂纹模板的金相显微镜观测结果图　(a) 20×镜头下的正面裂纹图案; (b) 50×镜头下的正面裂纹图案; (c) 20×镜头下的背面裂纹图案; (d) 50×镜头下的背面裂纹图案

Figure 7. Metallographic microscope observation pattern of double-layer crack template by pulling method: (a) Top crack pattern under 20× lens; (b) top crack pattern under 50× lens; (c) bottom crack pattern under 20× lens; (d) bottom crack pattern under 50× lens.

DownLoad: Full-Size Img PowerPoint

图 8 提拉法制备的双层金属沉积样品示意图

Figure 8. Diagram of the double-layer metal deposition by pulling method.

DownLoad: Full-Size Img PowerPoint

图 9 提拉法制备双层金属沉积样品的金相显微镜观测结果图　(a) 20×镜头下的正面金属沉积图案; (b) 50×镜头下的正面金属沉积图案; (c) 20×镜头下的背面金属沉积图案; (d) 50×镜头下的背面金属沉积图案

Figure 9. Metallographic microscope observation pattern of the double-layer metal deposition by pulling method: (a) Top metal deposition pattern under 20× lens; (b) top metal deposition pattern under 50× lens; (c) bottom metal deposition pattern under 20× lens; (d) bottom metal deposition pattern under 50× lens.

DownLoad: Full-Size Img PowerPoint

图 10 提拉法制备的双层MMTCF样品示意图

Figure 10. Diagram of the double-layer MMTCF sample by pulling method.

DownLoad: Full-Size Img PowerPoint

图 11 提拉法制备的双层金属网格样品的金相显微镜观测结果图　(a) 20×镜头下的正面金属网格图案; (b) 50×镜头下的正面金属网格图案; (c) 20×镜头下的背面金属网格图案; (d) 50×镜头下的背面金属网格图案

Figure 11. Metallographic microscope observation pattern of the double-layer metal mesh by pulling method: (a) Top metal mesh pattern under 20× lens; (b) top metal mesh pattern under 50× lens; (c) bottom metal mesh pattern under 20× lens; (d) bottom metal mesh pattern under 50× lens

DownLoad: Full-Size Img PowerPoint

图 12 双层MMTCF样品的方阻测试结果

Figure 12. Square resistance measurement results of the double-layer metal mesh sample.

DownLoad: Full-Size Img PowerPoint

图 13 双层MMTCF样品屏蔽效能测试结果对比

Figure 13. Comparison of electromagnetic shielding effectiveness results for the double-layer metal mesh sample.

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图 14 双层MMTCF样品透光率测试结果对比

Figure 14. Comparison of optical transmittance results for the double-layer metal mesh sample.

DownLoad: Full-Size Img PowerPoint

图 15 提拉法制备的双层金属网格样品方阻测试结果

Figure 15. Square resistance measurement results of the double-layer metal mesh sample by pulling method

DownLoad: Full-Size Img PowerPoint

图 16 提拉法制备的双层MMTCF样品的电磁屏蔽效能测试结果对比

Figure 16. Comparison of electromagnetic shielding effectiveness results for the double-layer metal mesh sample by pulling method.

DownLoad: Full-Size Img PowerPoint

图 17 提拉法制备的双层MMTCF样品透光率测试结果对比

Figure 17. Comparison of optical transmittance results for the double-layer metal mesh sample by pulling method.

DownLoad: Full-Size Img PowerPoint

图 18 提拉速度与裂纹尺寸分布的关系曲线

Figure 18. Relationship curve between the pulling speed and the crack size distribution.

DownLoad: Full-Size Img PowerPoint

DownLoad: Full-Size Img PowerPoint

map

[1]	Qiu L, Li L, Pan Z, Sun X, Yan W 2018 MATEC Web of Conferences 189 1003 Google Scholar
[2]	Wang W, Bai B, Zhou Q, Ni K, Lin H 2018 Opt. Mater. Express 8 3485 Google Scholar
[3]	Kai C, Wang K, Liu C 2019 10th EAI International Conference, WiSATS 2019, Part II Harbin, China, January 12–13, 2019 pp656–660 Google Scholar
[4]	Shi K, Su J, Hu K, Liang H 2020 J. Mater. Sci. Mater. Electron. 31 11646 Google Scholar
[5]	Corredores Y, Besnier P, Castel X, Sol J, Dupeyrat C, Foutrel P 2017 IEEE Trans. Electromagn. Compat. 59 1070 Google Scholar
[6]	Zhang Y, Dong H, Li Q, Mou N, Chen L, Zhang L 2019 RSC Adv. 9 22282 Google Scholar
[7]	Smith H A, Rebbert M, Sternberg O 2003 Appl. Phys. Lett. 82 3605 Google Scholar
[8]	Wang H, Lu Z, Liu Y, Tan J, Ma L, Lin S 2017 Opt. Lett. 42 1620 Google Scholar
[9]	Gu J, Hu S, Ji H, Feng H, Zhao W, Wei J, Li M 2020 Nanotechnology 31 185303 Google Scholar
[10]	Kaipa C S, Yakovlev A B, Medina F, Mesa F, Butler C A, Hibbins A P 2010 Opt. Express 18 13309 Google Scholar
[11]	Lu Z, Wang H, Tan J, Lin S 2014 Appl. Phys. Lett. 105 241904 Google Scholar
[12]	Lu Z, Liu Y, Wang H, Tan J 2016 Appl. Opt. 55 5372 Google Scholar
[13]	廖敦微, 郑月军, 崔浩, 寸铁, 付云起 2022 光学精密工程 30 1310 Google Scholar Liao D W, Zheng Y J, Cui H, Cun T, Fu Y Q 2022 Opt. Precis. Eng. 30 1310 Google Scholar
[14]	Jiang Z, Zhao S, Huang W, Chen L, Liu Y H 2020 Opt. Express 28 26531 Google Scholar
[15]	Rao K D M, Hunger C, Gupta R, Kulkarni G U, Thelakkat M 2014 Phys. Chem. Chem. Phys. 16 15107 Google Scholar
[16]	Han B, Pei K, Huang Y, Zhang X, Rong Q, Lin Q, Guo Y, Sun T, Guo C, Carnahan D, Giersig M, Wang Y, Gao J, Ren Z, Kempa K 2014 Adv. Mater. 26 873 Google Scholar
[17]	Kiruthika S, Gupta R, Rao K D M, Chakraborty S, Padmavathy N, Kulkarni G U 2014 J. Mater. Chem. C 2 2089 Google Scholar
[18]	肖宗湖, 王新莲, 韩春, 张帅旗, 付爽, 余玉玲 2018 新余学院学报 23 1 Google Scholar Xiao Z H, Wang X L, Han C, Zhang S Q, Fu S, Yu Y L 2018 J. Xinyu Univ. 23 1 Google Scholar
[19]	Han Y, Lin J, Liu Y, Fu H, Ma Y, Jin P, Tan J 2016 Sci. Rep. 6 25601 Google Scholar
[20]	Kim Y, Tak Y, Park S, Kim H 2017 Nanomaterials 7 214 Google Scholar
[21]	Muzzillo C P, Reese M O, Mansfield L M 2020 Langmuir 36 4630 Google Scholar
[22]	廖敦微, 郑月军, 陈强, 丁亮, 高冕, 付云起 2022 71 154201 Google Scholar Liao D W, Zheng Y J, Chen Q, Ding L, Gao M, Fu Y Q 2022 Acta Phy. Sin. 71 154201 Google Scholar
[23]	Yang C, Merlo J M, Kong J, Xian Z, Han B, Zhou G, Gao J, Burns M J, Kempa K, Naughton M J 2018 Phys. Status Solidi A 215 1700504 Google Scholar
[24]	Voronin A S, Fadeev Y V, Govorun I V, Simunin M, Tambasov I A, Karpova D V, Smolyarova T E, Lukyanenko A V, Karacharov A, Nemtsev I V, Khartov S V 2021 J. Mater. Sci. 56 14741 Google Scholar
[25]	Voronin A S, Fadeev Y V, Makeev M O, Mikhalev P A, Osipkov A S, Provatorov A S, Ryzhenko D S, Yurkov G Y, Simunin Ml M, Karpova D V, Lukyanenko A V, Kokh D, Bainov D, Tambasov I A, Nedelin S V, Zolotovsky N A, Khartov S V 2022 Materials 15 1449 Google Scholar

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