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Atomic layer deposition of AlGaN alloy and its application in quantum dot sensitized solar cells

Liu Heng Li Ye Du Meng-Chao Qiu Peng He Ying-Feng Song Yi-Meng Wei Hui-Yun Zhu Xiao-Li Tian Feng Peng Ming-Zeng Zheng Xin-He

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Atomic layer deposition of AlGaN alloy and its application in quantum dot sensitized solar cells

Liu Heng, Li Ye, Du Meng-Chao, Qiu Peng, He Ying-Feng, Song Yi-Meng, Wei Hui-Yun, Zhu Xiao-Li, Tian Feng, Peng Ming-Zeng, Zheng Xin-He
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  • The role of plasma-enhanced atomic layer deposition growth of AlGaN ternary alloys on c-planar sapphire substrates and the preparation of quantum dot-sensitized solar cells are explored in this work. The interface between the film and the substrate as well as the band gap of AlGaN ternary alloys during atomic layer deposition is dependent on Al component. At high Al fraction, there appears a good interface between the AlGaN alloy film and the substrate, however, the interface becomes rough when the Al fraction is reduced. The AlGaN alloy prepared by atomic layer deposition has a high band gap, which is related to the oxygen content within the film. Subsequently, CdSe/AlGaN/ZnS and CdSe/ZnS/AlGaN structured cells are prepared and analyzed for quantum dot solar cells from AlGaN films with an AlN/GaN cycle ratio of 1∶1. It is found that AlGaN can modify and passivate quantum dots and TiO2, which can wrap and protect the structure of TiO2 and CdSe quantum dot, thus avoiding the recombination of photo-generated carriers. This modification effect is also reflected in the improvement of open-circuit voltage, short-circuit current, filling factor and photovoltaic conversion efficiency of quantum dot solar cells. These factors are discussed in this work, trying to modify carrier transport characteristics of AlGaN films prepared by atomic layer deposition.
      Corresponding author: Zheng Xin-He, xinhezheng@ustb.edu.cn
    • Funds: Project supported by the National Key Research and Development Program of China (Grant No. 2018YFA0703700), the National Natural Science Foundation of China (Grant No. 52002021), and the Fundamental Research Funds for the Central Universities of China (Grant No. FRF-IDRY-20-037).
    [1]

    Parkhomenko R G, De Luca O, Kolodziejczyk L, Modin E, Rudolf P, Martínez D, Cunhad L, Knez M 2021 Dalton. Trans. 50 15062Google Scholar

    [2]

    Zhang X L, Liu Q Y, Liu B D, Yang W J, Li J, Niu P J, Jiang X 2017 J. Mater. Chem. C 5 4319Google Scholar

    [3]

    Zhang X L, Liu B D, Liu Q Y, Yang W J M, Xiong C, Li J, Jiang X 2017 Appl. Mater. Interfaces 9 2669Google Scholar

    [4]

    Deminskyi P, Rouf P, Ivanov I G, Pedersen H 2019 J. Vac. Sci. Technol A 37 020926Google Scholar

    [5]

    Iliopoulos E, Moustakas T D 2002 Appl. Phys. Lett. 81 295Google Scholar

    [6]

    Moon Y T, Kim D J, Park J S, Oh J T, Lee J M, Ok Y W, Kim H, Park S J 2001 Appl. Phys. Lett. 79 599Google Scholar

    [7]

    Wu J 2009 J. Appl. Phys. 106 5

    [8]

    Angerer H, Brunner D, Freudenberg F, Ambacher O, Stutzmann M, Höpler R, Körner H J 1997 Appl. Phys. Lett. 71 1504Google Scholar

    [9]

    Jain S C, Willander M, Narayan J, Overstraeten R V 2000 J. Appl. Phys. 87 965Google Scholar

    [10]

    Tonisch K, Buchheim C, Niebelschütz F, Schober A, Gobsch G, Cimalla V, Goldhahn R 2008 J. Appl. Phys. 104 084516Google Scholar

    [11]

    Jebalin B K, Shobha R A, Prajoon P, Kumar N M, Nirmal D 2015 Microelectron. J. 46 1387Google Scholar

    [12]

    Chakroun A, Jaouad A, Bouchilaoun M, Arenas O, Soltani A, Maher H 2017 Phys. Status Solidi A 214 1600836Google Scholar

    [13]

    Ruterana P, De Saint Jores G, Laügt M, Omnes F, Bellet-Amalric E 2001 Appl. Phys. Lett. 78 344Google Scholar

    [14]

    Yang W X, Zhao Y K, Wu Y Y, Li X F, Xing Z W, Bian L F, Lu S L, Luo M C 2019 J. Cryst. Growth 512 213Google Scholar

    [15]

    Puurunen R L 2005 J. Appl. Phys. 97 9

    [16]

    Ozgit C, Donmez I, Alevli M, Biyikli N 2012 J. Vac. Sci. Technol. A 30 01A124Google Scholar

    [17]

    Liu S J, Zhao G, He Y F, Wei H Y, Li Y, Qiu P, Zheng X H 2019 ACS Appl. Mater. Interfaces 11 35382Google Scholar

    [18]

    Liu S J, He Y F, Wei H Y, Qiu P, Song Y M, An Y L, Zheng X H 2019 Chin. Phys. B 28 026801Google Scholar

    [19]

    Liu S J, Peng M Z, Hou C X, He Y F, Li M L, Zheng X H 2017 Nanoscale Res. Lett. 12 1Google Scholar

    [20]

    Qiu P, Wei H Y, An Y, Wu Q, Du W, Jiang Z, Zheng X H 2019 Ceram Int. 46 5765

    [21]

    He Y F, Li M L, Liu S J, Wei H Y, Ye H Y, Song Y M, Zheng X H 2019 Acta Metall. Sin. (English Letters) 32 1530Google Scholar

    [22]

    He Y F, Li M L, Wei H Y, Song Y, Qiu P, Peng M, Zheng X H 2021 Appl. Surf. Sci. 566 150684Google Scholar

    [23]

    Song Y, He Y F, Li Y, Wei H Y, Qiu P, Huang Q, Zheng X H 2021 Cryst. Growth Des. 21 1778Google Scholar

    [24]

    Song Y M, Li Y F, He Y F, Wei H Y, Qiu P, Hu X T, Su Z L, Jiang Y, Peng M Z, Zheng X H 2022 ACS Appl. Mater. Interfaces 14 16866Google Scholar

    [25]

    Liu S J, Zhao G, He Y F, Li Y F, Wei H Y, Qiu P, Wang X Y, Wang X X, Cheng J D, Peng M Z, Zaera F, Zheng X H 2020 Appl. Phys. Lett. 116 211601Google Scholar

    [26]

    Nepal N, Anderson V R, Hite J K, Eddy C R 2015 Thin Solid Films 589 47Google Scholar

    [27]

    Rouf P, Palisaitis J, Bakhit B, O’Brien N J, Pedersen H 2021 J. Mater. Chem. C 9 13077Google Scholar

    [28]

    Choi S, Ansari A S, Yun H J, Kim H, Shong B, Choi B J 2020 J. Alloy. Compd. 854 157186

    [29]

    Ergen O, Gilbert S M, Pham T, Turner S J, Tan M T Z, Worsley M A, Zettl A 2017 Nat. Mater. 16 522Google Scholar

    [30]

    Wei H Y, Wu J, Qiu P, Liu S, He Y F, Peng MZ, Li D, Meng Q, Zaera F, Zheng X H 2019 J. Mater. Chem. A 7 25347Google Scholar

    [31]

    Wei H Y, Qiu P, Peng M Z, Wu Q, Liu S, An Y, He Y F, Song Y M, Zheng X H 2019 Appl. Surf. Sci. 476 608Google Scholar

    [32]

    李晔, 王茜茜, 卫会云, 仇鹏, 何荧峰, 宋祎萌, 段彰, 申诚涛, 彭铭曾, 郑新和 2021 70 187702Google Scholar

    Li Y, Wang X X, Wei H Y, Qiu P, He Y F, Song Y M, Duan Z, Shen C T, Peng M Z, Zheng X H 2021 Acta Phys. Sin. 70 187702Google Scholar

    [33]

    Zhang Q, Parimoo H, Martel E, Zhao S 2022 Ecs. J. Solid State Sc. 11 116002Google Scholar

    [34]

    Portillo M C, Hernández S G, Bernal Y P, Velis I M, Cab J V, Alcántara S, Alvarado J 2020 Opt. Mater. 108 110206Google Scholar

    [35]

    Koo A, Budde F, Ruck B, Trodahl H, Bittar A, Preston A, Zeinert A 2006 J. Appl. Phys. 99 034312Google Scholar

    [36]

    Choi Y Y, Choi K H, Kim H K 2011 J. Electrochem. Soc. 158 J349Google Scholar

    [37]

    Su L X, Chen S Y, Zhao L Q, Zuo Y Q, Xie J 2020 Appl. Phys. Lett. 117 211101Google Scholar

    [38]

    Sun X J, Wu C, Wang Y C, Guo D Y 2022 J. Vacuum Sci. Technol. B 40 012204Google Scholar

    [39]

    Zhang J, Li S L, Xiong H, Tian W, Li Y, Fang Y Y, Wu Z H, Dai J N, Xu J T, Li X Y, Chen C Q 2014 Nanoscale Res. Lett. 9 341Google Scholar

    [40]

    梁琦, 杨孟骐, 张京阳, 王如志 2022 71 097302Google Scholar

    Liang Q, Yang M Q, Zhang J Y, Wang R Z 2022 Acta Phys. Sin. 71 097302Google Scholar

    [41]

    冯嘉恒, 唐立丹, 刘邦武, 夏洋, 王冰 2013 62 117302Google Scholar

    Feng J H, Tang L D, Liu B W, Xia Y, Wang B 2013 Acta Phys. Sin. 62 117302Google Scholar

    [42]

    Motamedi P, Cadien K 2014 Appl. Surf. Sci. 315 104Google Scholar

    [43]

    Alevli M, Haider A, Kizir S, Leghari S A, Biyikli N 2016 J. Vac. Sci. Technol. A 34 01A137Google Scholar

    [44]

    Wang Q, Cheng X H, Zheng L, Shen L Y, Li J L, Zhang D L, Qian R, Yu Y H 2017 RSC Adv. 7 11745Google Scholar

    [45]

    Qu L H, Peng X G 2002 J. Am. Chem. Soc. 124 2049Google Scholar

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    Ren F M, Li S J, He C L 2015 Sci. China Mater. 58 490Google Scholar

  • 图 1  (a) 一个完整的AlGaN-PEALD循环中AlN和GaN的生长过程; (b) 在蓝宝石上生长AlGaN的循环结构图

    Figure 1.  (a) Growth process of AlN and GaN in a complete AlGaN-PEALD cycle; (b) diagram of the cycle structure for growing AlGaN on sapphire.

    图 2  A1G1的生长温度与薄膜厚度关系

    Figure 2.  Growth temperature versus film thickness for A1G1.

    图 3  XRR测试图 (a) 200 ℃, 250 ℃和300 ℃下生长的A1G1; (b) 300 ℃下生长的A3G1, A1G1和A1G3

    Figure 3.  XRR test plots: (a) A1G1 grown at 200 ℃, 250 ℃ and 300 ℃; (b) A3G1, A1G1 and A1G3 grown at 300 ℃.

    图 4  300 ℃下, 不同AlN/GaN循环比例的吸收谱图

    Figure 4.  Absorption spectra of different AlN/GaN cycle ratios at 300 ℃.

    图 5  A3G1 (a)—(c), A1G1 (d)—(f), A1G3 (g)—(i)的XPS谱图 (a), (d), (g) Al 2p; (b), (e), (h) Ga 2p3/2; (c), (f), (i) N 1s

    Figure 5.  XPS spectra of A3G1 (a)–(c), A1G1 (d)–(f), A1G3 (g)–(i): (a), (d), (g) Al 2p; (b), (e), (h) Ga 2p3/2; (c), (f), (i) N 1s.

    图 6  CdSe QDs的HRTEM (a)和稳态PL图(b)

    Figure 6.  HRTEM (a) and steady-state PL maps (b) of CdSe QDs.

    图 7  量子点太阳能电池示意图 (a) AlGaN/ZnS; (b) ZnS/AlGaN

    Figure 7.  Schematic diagram of QDSCs: (a) AlGaN/ZnS; (b) ZnS/AlGaN.

    图 8  两种结构下沉积不同周期AlGaN薄膜QDSCs的J-V曲线 (a) 5 cycles; (b) 20 cycles; (c) 30 cycles. (d) 5, 20, 30 cycles的Nyquist曲线

    Figure 8.  J-V curves of QDSCs of AlGaN thin films with different cycles deposited under two structures: (a) 5 cycles; (b) 20 cycles; (c) 30 cycles. (d) Nyquist curves for 5, 20 and 30 cycles.

    表 1  不同循环比例生长的AlGaN薄膜的元素组成

    Table 1.  Elemental composition of AlGaN films grown with different cyclic ratios.

    SamplesAl/%Ga/%N/%O/%C/%
    A3G137.974.2116.0338.563.32
    A1G131.897.2820.8335.184.82
    A1G321.8817.5327.729.533.36
    DownLoad: CSV

    表 2  5, 20和30 cycles AlGaN薄膜不同结构J-V测试结果

    Table 2.  J-V test results for different structures of 5, 20 and 30 cycles AlGaN films.

    SamplesJsc/(mA·cm–2)Voc/VFF/%PCE/%
    5AlGaN/ZnS9.30.5660.283.13
    ZnS/5AlGaN7.710.5360.492.5
    20AlGaN/ZnS8.360.5662.692.91
    ZnS/20AlGaN7.90.5456.872.44
    30AlGaN/ZnS6.020.5165.922.01
    ZnS/30AlGaN5.390.4958.811.57
    RC6.810.5158.592.02
    DownLoad: CSV

    表 3  5, 20和30 cycles AlGaN QDSCs的电化学阻抗谱拟合结果

    Table 3.  Electrochemical impedance spectrum fitting results for 5, 20 and 30 cycles AlGaN QDSCs.

    Samples cycles52030
    ${R_{ {\text{ct-Ti} }{{\text{O} }_{\text{2} } } }}/\Omega$18.9332.7241.97
    DownLoad: CSV
    Baidu
  • [1]

    Parkhomenko R G, De Luca O, Kolodziejczyk L, Modin E, Rudolf P, Martínez D, Cunhad L, Knez M 2021 Dalton. Trans. 50 15062Google Scholar

    [2]

    Zhang X L, Liu Q Y, Liu B D, Yang W J, Li J, Niu P J, Jiang X 2017 J. Mater. Chem. C 5 4319Google Scholar

    [3]

    Zhang X L, Liu B D, Liu Q Y, Yang W J M, Xiong C, Li J, Jiang X 2017 Appl. Mater. Interfaces 9 2669Google Scholar

    [4]

    Deminskyi P, Rouf P, Ivanov I G, Pedersen H 2019 J. Vac. Sci. Technol A 37 020926Google Scholar

    [5]

    Iliopoulos E, Moustakas T D 2002 Appl. Phys. Lett. 81 295Google Scholar

    [6]

    Moon Y T, Kim D J, Park J S, Oh J T, Lee J M, Ok Y W, Kim H, Park S J 2001 Appl. Phys. Lett. 79 599Google Scholar

    [7]

    Wu J 2009 J. Appl. Phys. 106 5

    [8]

    Angerer H, Brunner D, Freudenberg F, Ambacher O, Stutzmann M, Höpler R, Körner H J 1997 Appl. Phys. Lett. 71 1504Google Scholar

    [9]

    Jain S C, Willander M, Narayan J, Overstraeten R V 2000 J. Appl. Phys. 87 965Google Scholar

    [10]

    Tonisch K, Buchheim C, Niebelschütz F, Schober A, Gobsch G, Cimalla V, Goldhahn R 2008 J. Appl. Phys. 104 084516Google Scholar

    [11]

    Jebalin B K, Shobha R A, Prajoon P, Kumar N M, Nirmal D 2015 Microelectron. J. 46 1387Google Scholar

    [12]

    Chakroun A, Jaouad A, Bouchilaoun M, Arenas O, Soltani A, Maher H 2017 Phys. Status Solidi A 214 1600836Google Scholar

    [13]

    Ruterana P, De Saint Jores G, Laügt M, Omnes F, Bellet-Amalric E 2001 Appl. Phys. Lett. 78 344Google Scholar

    [14]

    Yang W X, Zhao Y K, Wu Y Y, Li X F, Xing Z W, Bian L F, Lu S L, Luo M C 2019 J. Cryst. Growth 512 213Google Scholar

    [15]

    Puurunen R L 2005 J. Appl. Phys. 97 9

    [16]

    Ozgit C, Donmez I, Alevli M, Biyikli N 2012 J. Vac. Sci. Technol. A 30 01A124Google Scholar

    [17]

    Liu S J, Zhao G, He Y F, Wei H Y, Li Y, Qiu P, Zheng X H 2019 ACS Appl. Mater. Interfaces 11 35382Google Scholar

    [18]

    Liu S J, He Y F, Wei H Y, Qiu P, Song Y M, An Y L, Zheng X H 2019 Chin. Phys. B 28 026801Google Scholar

    [19]

    Liu S J, Peng M Z, Hou C X, He Y F, Li M L, Zheng X H 2017 Nanoscale Res. Lett. 12 1Google Scholar

    [20]

    Qiu P, Wei H Y, An Y, Wu Q, Du W, Jiang Z, Zheng X H 2019 Ceram Int. 46 5765

    [21]

    He Y F, Li M L, Liu S J, Wei H Y, Ye H Y, Song Y M, Zheng X H 2019 Acta Metall. Sin. (English Letters) 32 1530Google Scholar

    [22]

    He Y F, Li M L, Wei H Y, Song Y, Qiu P, Peng M, Zheng X H 2021 Appl. Surf. Sci. 566 150684Google Scholar

    [23]

    Song Y, He Y F, Li Y, Wei H Y, Qiu P, Huang Q, Zheng X H 2021 Cryst. Growth Des. 21 1778Google Scholar

    [24]

    Song Y M, Li Y F, He Y F, Wei H Y, Qiu P, Hu X T, Su Z L, Jiang Y, Peng M Z, Zheng X H 2022 ACS Appl. Mater. Interfaces 14 16866Google Scholar

    [25]

    Liu S J, Zhao G, He Y F, Li Y F, Wei H Y, Qiu P, Wang X Y, Wang X X, Cheng J D, Peng M Z, Zaera F, Zheng X H 2020 Appl. Phys. Lett. 116 211601Google Scholar

    [26]

    Nepal N, Anderson V R, Hite J K, Eddy C R 2015 Thin Solid Films 589 47Google Scholar

    [27]

    Rouf P, Palisaitis J, Bakhit B, O’Brien N J, Pedersen H 2021 J. Mater. Chem. C 9 13077Google Scholar

    [28]

    Choi S, Ansari A S, Yun H J, Kim H, Shong B, Choi B J 2020 J. Alloy. Compd. 854 157186

    [29]

    Ergen O, Gilbert S M, Pham T, Turner S J, Tan M T Z, Worsley M A, Zettl A 2017 Nat. Mater. 16 522Google Scholar

    [30]

    Wei H Y, Wu J, Qiu P, Liu S, He Y F, Peng MZ, Li D, Meng Q, Zaera F, Zheng X H 2019 J. Mater. Chem. A 7 25347Google Scholar

    [31]

    Wei H Y, Qiu P, Peng M Z, Wu Q, Liu S, An Y, He Y F, Song Y M, Zheng X H 2019 Appl. Surf. Sci. 476 608Google Scholar

    [32]

    李晔, 王茜茜, 卫会云, 仇鹏, 何荧峰, 宋祎萌, 段彰, 申诚涛, 彭铭曾, 郑新和 2021 70 187702Google Scholar

    Li Y, Wang X X, Wei H Y, Qiu P, He Y F, Song Y M, Duan Z, Shen C T, Peng M Z, Zheng X H 2021 Acta Phys. Sin. 70 187702Google Scholar

    [33]

    Zhang Q, Parimoo H, Martel E, Zhao S 2022 Ecs. J. Solid State Sc. 11 116002Google Scholar

    [34]

    Portillo M C, Hernández S G, Bernal Y P, Velis I M, Cab J V, Alcántara S, Alvarado J 2020 Opt. Mater. 108 110206Google Scholar

    [35]

    Koo A, Budde F, Ruck B, Trodahl H, Bittar A, Preston A, Zeinert A 2006 J. Appl. Phys. 99 034312Google Scholar

    [36]

    Choi Y Y, Choi K H, Kim H K 2011 J. Electrochem. Soc. 158 J349Google Scholar

    [37]

    Su L X, Chen S Y, Zhao L Q, Zuo Y Q, Xie J 2020 Appl. Phys. Lett. 117 211101Google Scholar

    [38]

    Sun X J, Wu C, Wang Y C, Guo D Y 2022 J. Vacuum Sci. Technol. B 40 012204Google Scholar

    [39]

    Zhang J, Li S L, Xiong H, Tian W, Li Y, Fang Y Y, Wu Z H, Dai J N, Xu J T, Li X Y, Chen C Q 2014 Nanoscale Res. Lett. 9 341Google Scholar

    [40]

    梁琦, 杨孟骐, 张京阳, 王如志 2022 71 097302Google Scholar

    Liang Q, Yang M Q, Zhang J Y, Wang R Z 2022 Acta Phys. Sin. 71 097302Google Scholar

    [41]

    冯嘉恒, 唐立丹, 刘邦武, 夏洋, 王冰 2013 62 117302Google Scholar

    Feng J H, Tang L D, Liu B W, Xia Y, Wang B 2013 Acta Phys. Sin. 62 117302Google Scholar

    [42]

    Motamedi P, Cadien K 2014 Appl. Surf. Sci. 315 104Google Scholar

    [43]

    Alevli M, Haider A, Kizir S, Leghari S A, Biyikli N 2016 J. Vac. Sci. Technol. A 34 01A137Google Scholar

    [44]

    Wang Q, Cheng X H, Zheng L, Shen L Y, Li J L, Zhang D L, Qian R, Yu Y H 2017 RSC Adv. 7 11745Google Scholar

    [45]

    Qu L H, Peng X G 2002 J. Am. Chem. Soc. 124 2049Google Scholar

    [46]

    Ren F M, Li S J, He C L 2015 Sci. China Mater. 58 490Google Scholar

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Metrics
  • Abstract views:  3223
  • PDF Downloads:  57
  • Cited By: 0
Publishing process
  • Received Date:  29 January 2023
  • Accepted Date:  28 April 2023
  • Available Online:  04 May 2023
  • Published Online:  05 July 2023

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