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A self-consistent one-dimensional fluid coupled model is built to describe the low pressure xenon dielectric barrier discharge (DBD). And the finite-element method is employed to investigate gas voltages, discharge currents and the time evolutions of surface charges on dielectric barrier under different applied voltage amplitudes and frequencies. The spatial and temporal distributions of electrons, ions, excited, resonance, metastable particles and spatial electrical field are also achieved. The simulation results show that the surface charges accumulated on the dielectric barriers play a key role in the ignition and the extinguishment of the discharge. And based on the variation of gas voltage, the surface charging can be divided into six stages in one discharge cycle. With the increase of applied voltage amplitude, the gas gap breakdown moves ahead of the zero-crossing point of applied voltage gradually, and the discharge becomes more and more intense. Furthermore, with the increase of applied voltage frequency, the gas voltage decreases gradually, gas gap tends to breakdown, and discharge becomes uniform. Finally, spatiotemporal distributions of particles and electric field indicate that the xenon DBD is a typical glow discharge.
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Keywords:
- dielectric barrier discharge /
- fluid model /
- numerical computation /
- low temperature plasma
[1] Wang Y H, Wang D Z 2006 Acta Phys. Sin. 55 5923 (in Chinese)
[2] Carman R J, Mildren R P 2003 J. Phys. D 36 19
[3] Yurgelenas Y V, Wagner H E 2006 J. Phys. D 39 4031
[4] Luo H Y, Wang X X, Mao T, Liang Z, Lü B, Guan Z C, Wang L M 2008 Acta Phys. Sin. 57 4298 (in Chinese) [罗海云、王新新、毛 婷、梁 卓、吕 博、关志成、王黎明 2008 57 4298]
[5] Wang X X, Lu M Z, Pu Y K 2002 Acta Phys. Sin. 51 2778 (in Chinese) [王新新、芦明泽、蒲以康 2002 51 2778]
[6] Dong L F, Mao Z G, Ran J X 2005 Chin. Phys. 14 1618
[7] Li G, Li Y M, Xu Y J, Zhang Y, Li H M, Nie C Q, Zhu J Q 2009 Acta Phys. Sin. 58 4026 (in Chinese) [李 钢、李轶明、徐燕骥、张 翼、李汉明、聂超群、朱俊强 2009 58 4026]
[8] Li G, Xu Y J, Mu K J, Nie C Q, Zhu J Q, Zhang Y, Li H M 2008 Acta Phys.Sin. 57 6444 (in Chinese) [李 钢、徐燕骥、穆克进、聂超群、朱俊强、张 翼、李汉明 2008 57 6444]
[9] Massines F, Rabehi A, Decomps P, Gadri R B, Ségur P, Mayoux C 1998 J. Appl. Phys. 83 2950
[10] Stollenwerk L, Amiranashvili S, Boeuf J P, Pirwins H G 2006 Phys. Rev. Lett. 96 255001
[11] Wang Y H, Wang D Z 2003 Acta Phys. Sin. 52 1694 (in Chinese) [王艳辉、王德真 2003 52 1694]
[12] Wang Y H, Wang D Z 2005 Acta Phys. Sin. 54 1295 (in Chinese) [王艳辉、王德真 2005 54 1295]
[13] Zhang Y, Gu B, Wang W C, Peng X W, Wang D Z 2009 Acta Phys. Sin. 58 5532 (in Chinese) [张 燕、顾 彪、王文春、彭许文、王德真 2009 58 5532]
[14] Zhang H Y, Wang D Z, Wang X G 2007 Chin. Phys. 16 1089
[15] Li X C, Liu Z H, Jia P Y, Li L C, Yin Z Q, Dong L F 2007 Chin. Phys. 16 3016
[16] Yin Z Q, Chai Z F, Dong L F, Li X C 2003 Acta Phys. Sin. 52 925 (in Chinese) [尹增谦、柴志方、董丽芳、李雪辰 2003 52 925]
[17] Li X C, Jia P Y, Liu Z H, Li L C, Dong L F 2008 Acta Phys. Sin. 57 1001 (in Chinese) [李雪辰、贾鹏英、刘志辉、李立春、董丽芳 2008 57 1001]
[18] Eliasson B, Kogelschatz U 1988 Appl. Phys. B 46 299
[19] Mildren R P, Carman R J 2001 J. Phys. D 34 L1
[20] Oda A, Sakai Y, Akashi H, Sugawara H 1999 J. Phys. D 32 2726
[21] Xu Y L, Xu X J 2000 Phys. Scr. 62 76
[22] Cook. D C, Haydon S C 1984 IEE Proc. Sci. Meas. Tech. 131 145
[23] Cook D C, Haydon S C 1984 IEE Proc. Sci. Meas. Tech. 131 153
[24] Hagelaar G J M, Pitchford L C 2005 Plasma Source Sci. Tech. 14 722
[25] Hagelaar G J M 2000 Ph. D. Dissertation (Eindhoven: Eindhoven University of Technology)
[26] McDaniel E W, Mason E A 1973 The Mobility and Diffusion of Ions in Gases (New York: Wiley Press) p344
[27] Morrow R, Sato N 1999 J. Phys. D 32 L20
[28] Hagelaar G J M, de Hoog F J, Kroesen G M W 2000 Phys. Rev. E 62 1452
[29] Feng C Z, Ma X K 2000 An Introduction to Engineering Electromagnetic Field (Beijing: Higher Education Press) pp21,22 (in Chinese) [冯慈彰、马西奎 2000 工程电磁场导论 (北京:高等教育出版社)第21,22页]
[30] Codina R 1998 Comp. Meth. Appl. Mech. Eng. 156 185
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[1] Wang Y H, Wang D Z 2006 Acta Phys. Sin. 55 5923 (in Chinese)
[2] Carman R J, Mildren R P 2003 J. Phys. D 36 19
[3] Yurgelenas Y V, Wagner H E 2006 J. Phys. D 39 4031
[4] Luo H Y, Wang X X, Mao T, Liang Z, Lü B, Guan Z C, Wang L M 2008 Acta Phys. Sin. 57 4298 (in Chinese) [罗海云、王新新、毛 婷、梁 卓、吕 博、关志成、王黎明 2008 57 4298]
[5] Wang X X, Lu M Z, Pu Y K 2002 Acta Phys. Sin. 51 2778 (in Chinese) [王新新、芦明泽、蒲以康 2002 51 2778]
[6] Dong L F, Mao Z G, Ran J X 2005 Chin. Phys. 14 1618
[7] Li G, Li Y M, Xu Y J, Zhang Y, Li H M, Nie C Q, Zhu J Q 2009 Acta Phys. Sin. 58 4026 (in Chinese) [李 钢、李轶明、徐燕骥、张 翼、李汉明、聂超群、朱俊强 2009 58 4026]
[8] Li G, Xu Y J, Mu K J, Nie C Q, Zhu J Q, Zhang Y, Li H M 2008 Acta Phys.Sin. 57 6444 (in Chinese) [李 钢、徐燕骥、穆克进、聂超群、朱俊强、张 翼、李汉明 2008 57 6444]
[9] Massines F, Rabehi A, Decomps P, Gadri R B, Ségur P, Mayoux C 1998 J. Appl. Phys. 83 2950
[10] Stollenwerk L, Amiranashvili S, Boeuf J P, Pirwins H G 2006 Phys. Rev. Lett. 96 255001
[11] Wang Y H, Wang D Z 2003 Acta Phys. Sin. 52 1694 (in Chinese) [王艳辉、王德真 2003 52 1694]
[12] Wang Y H, Wang D Z 2005 Acta Phys. Sin. 54 1295 (in Chinese) [王艳辉、王德真 2005 54 1295]
[13] Zhang Y, Gu B, Wang W C, Peng X W, Wang D Z 2009 Acta Phys. Sin. 58 5532 (in Chinese) [张 燕、顾 彪、王文春、彭许文、王德真 2009 58 5532]
[14] Zhang H Y, Wang D Z, Wang X G 2007 Chin. Phys. 16 1089
[15] Li X C, Liu Z H, Jia P Y, Li L C, Yin Z Q, Dong L F 2007 Chin. Phys. 16 3016
[16] Yin Z Q, Chai Z F, Dong L F, Li X C 2003 Acta Phys. Sin. 52 925 (in Chinese) [尹增谦、柴志方、董丽芳、李雪辰 2003 52 925]
[17] Li X C, Jia P Y, Liu Z H, Li L C, Dong L F 2008 Acta Phys. Sin. 57 1001 (in Chinese) [李雪辰、贾鹏英、刘志辉、李立春、董丽芳 2008 57 1001]
[18] Eliasson B, Kogelschatz U 1988 Appl. Phys. B 46 299
[19] Mildren R P, Carman R J 2001 J. Phys. D 34 L1
[20] Oda A, Sakai Y, Akashi H, Sugawara H 1999 J. Phys. D 32 2726
[21] Xu Y L, Xu X J 2000 Phys. Scr. 62 76
[22] Cook. D C, Haydon S C 1984 IEE Proc. Sci. Meas. Tech. 131 145
[23] Cook D C, Haydon S C 1984 IEE Proc. Sci. Meas. Tech. 131 153
[24] Hagelaar G J M, Pitchford L C 2005 Plasma Source Sci. Tech. 14 722
[25] Hagelaar G J M 2000 Ph. D. Dissertation (Eindhoven: Eindhoven University of Technology)
[26] McDaniel E W, Mason E A 1973 The Mobility and Diffusion of Ions in Gases (New York: Wiley Press) p344
[27] Morrow R, Sato N 1999 J. Phys. D 32 L20
[28] Hagelaar G J M, de Hoog F J, Kroesen G M W 2000 Phys. Rev. E 62 1452
[29] Feng C Z, Ma X K 2000 An Introduction to Engineering Electromagnetic Field (Beijing: Higher Education Press) pp21,22 (in Chinese) [冯慈彰、马西奎 2000 工程电磁场导论 (北京:高等教育出版社)第21,22页]
[30] Codina R 1998 Comp. Meth. Appl. Mech. Eng. 156 185
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