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The distribution of trap levels in the low density polyethylene (LDPE) was studied by means of photo-stimulated discharge (PSD). And two scanning modes, continuous scanning and step scanning, were discussed. It was pointed out that there may be some problems because of the incomplete detrapping of the trapping charges for the continuous scanning. The principle and the experimental process for the step scanning were presented. It is found that there is a linear relationship between the logarithm of PSD current produced under the irradiation of the monochromatic light and the time, which is in accordance with the theoretical analysis and indicates that the retrapping effect of the carriers can be neglected. The charges are trapped in the levels of 4.36—6.22 eV in LDPE, the main part of which were trapped in the energy levels of 4.78—5.18 eV.
[1] Mizutani T 2006 Conference on Electrical Insulqtion and Dielectric Phyenomena p1
[2] Zhang Y W, Lewiner J, Alquie C, Hampton N 1996 IEEE Trans. DEI 3 p778
[3] IEEE Trans. DEI p218
[4] Phys. 15 2341
[5] Dissado L A, Mazzanti G, Montanari G C 1997 IEEE Trans. DEI 4 p496
[6] Montanari G C, Mazzanti G, Dissado L, Das Gupta D 1997 Dielectric Society Meeting p259
[7] Xia Z F 2001 Electrets (Beijing: Science Press) p154 (in Chinese) [夏钟福 2001 驻极体 (北京: 科学出版社) 第154页]
[8] Kryszewski M, Ulanski J, Jeszka J K, Zielinski M 1982 Polym. Bull. 8 187
[9] Brodribb J D, Hughes D M, Lewis T J 1972 Electrets: Charge Storage and Transport in Dielectrics p177
[10] Takai Y, Mori K, Mizutani T, Ieda M 1976 Jpn. J. Appl.
[11] Mellinger A, Camacho-Gonzlez F, Gerhard-Multhaupt R 2003 Appl. Phys. Lett. 82 254
[12] Camacho-Gonzlez F, Mellinger A, Gerhard-Multhaupt R 2004 International Conference on Solid Dielectrics Toulouse, France, July 5-9, 2004
[13] Camacho-Gonzlez F, Mellinger A, Gerhard-Multhaupt R, Santos L F, Faria R M 2002 Conference on Electrical Insulation and Dielectric Phenomena p590
[14] Mellinger A, Camacho-Gonzlez F, Gerhard-Multhaupt R 2004
[15] Oda T, Utsumi T, Matsubara G 1988 6th International Symposium on Electrets p142
[16] Brodribb J D, O’Colmain D, Hughes D M 1975 J. Phys. D: Appl. Phys. 8 856
[17] Chen G, Tay T Y G, Davies A E, Tanaka Y, Takada T 2001 IEEE Trans. DEI 8 867
[18] Yang Q, An Z L, Zheng F H, Zhang Y W 2008 Acta Phys. Sin. 57 3834 (in Chinese) [杨 强、安振连、郑飞虎、张冶文 2008 57 3834]
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[1] Mizutani T 2006 Conference on Electrical Insulqtion and Dielectric Phyenomena p1
[2] Zhang Y W, Lewiner J, Alquie C, Hampton N 1996 IEEE Trans. DEI 3 p778
[3] IEEE Trans. DEI p218
[4] Phys. 15 2341
[5] Dissado L A, Mazzanti G, Montanari G C 1997 IEEE Trans. DEI 4 p496
[6] Montanari G C, Mazzanti G, Dissado L, Das Gupta D 1997 Dielectric Society Meeting p259
[7] Xia Z F 2001 Electrets (Beijing: Science Press) p154 (in Chinese) [夏钟福 2001 驻极体 (北京: 科学出版社) 第154页]
[8] Kryszewski M, Ulanski J, Jeszka J K, Zielinski M 1982 Polym. Bull. 8 187
[9] Brodribb J D, Hughes D M, Lewis T J 1972 Electrets: Charge Storage and Transport in Dielectrics p177
[10] Takai Y, Mori K, Mizutani T, Ieda M 1976 Jpn. J. Appl.
[11] Mellinger A, Camacho-Gonzlez F, Gerhard-Multhaupt R 2003 Appl. Phys. Lett. 82 254
[12] Camacho-Gonzlez F, Mellinger A, Gerhard-Multhaupt R 2004 International Conference on Solid Dielectrics Toulouse, France, July 5-9, 2004
[13] Camacho-Gonzlez F, Mellinger A, Gerhard-Multhaupt R, Santos L F, Faria R M 2002 Conference on Electrical Insulation and Dielectric Phenomena p590
[14] Mellinger A, Camacho-Gonzlez F, Gerhard-Multhaupt R 2004
[15] Oda T, Utsumi T, Matsubara G 1988 6th International Symposium on Electrets p142
[16] Brodribb J D, O’Colmain D, Hughes D M 1975 J. Phys. D: Appl. Phys. 8 856
[17] Chen G, Tay T Y G, Davies A E, Tanaka Y, Takada T 2001 IEEE Trans. DEI 8 867
[18] Yang Q, An Z L, Zheng F H, Zhang Y W 2008 Acta Phys. Sin. 57 3834 (in Chinese) [杨 强、安振连、郑飞虎、张冶文 2008 57 3834]
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