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A study of Raman and optical emission spectroscopy on microcrystalline silicon films deposited by VHF-PECVD

Zhang Xiao-Dan Zhao Ying Zhu Feng Wei Chang-Chun Wu Chun-Ya Gao Yan-Tao Hou Guo-Fu Sun Jian Geng Xin-Hua Xiong Shao-Zhen

Citation:

A study of Raman and optical emission spectroscopy on microcrystalline silicon films deposited by VHF-PECVD

Zhang Xiao-Dan, Zhao Ying, Zhu Feng, Wei Chang-Chun, Wu Chun-Ya, Gao Yan-Tao, Hou Guo-Fu, Sun Jian, Geng Xin-Hua, Xiong Shao-Zhen
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  • Abstract views:  7970
  • PDF Downloads:  1512
  • Cited By: 0
Publishing process
  • Received Date:  13 February 2004
  • Accepted Date:  26 April 2004
  • Published Online:  19 January 2005

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