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Secondary ion mass spectroscopic depth profile analysis of oxygen contamination in hydrogenated microcrystalline silicon

Zhang Xiao-Dan Zhao Ying Zhu Feng Wei Chang-Chun Mai Yao-Hua Gao Yan-Tao Sun Jian Geng Xin-Hua Xiong Shao-Zhen

Citation:

Secondary ion mass spectroscopic depth profile analysis of oxygen contamination in hydrogenated microcrystalline silicon

Zhang Xiao-Dan, Zhao Ying, Zhu Feng, Wei Chang-Chun, Mai Yao-Hua, Gao Yan-Tao, Sun Jian, Geng Xin-Hua, Xiong Shao-Zhen
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  • Abstract views:  7504
  • PDF Downloads:  766
  • Cited By: 0
Publishing process
  • Received Date:  15 July 2004
  • Accepted Date:  03 November 2004
  • Published Online:  05 February 2005

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