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A study on the stacking fault in GaN crystals by high-resolution electron microscope imaging

Wan Wei Tang Chun-Yan Wang Yu-Mei Li Fang-Hua

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A study on the stacking fault in GaN crystals by high-resolution electron microscope imaging

Wan Wei, Tang Chun-Yan, Wang Yu-Mei, Li Fang-Hua
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  • Abstract views:  9798
  • PDF Downloads:  1767
  • Cited By: 0
Publishing process
  • Received Date:  10 October 2004
  • Accepted Date:  25 January 2005
  • Published Online:  20 September 2005

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