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Phonon scattering has a non-negligible influence on the characteristics of carbon nanotube field effect transistor (CNTFET). Using the ballistic transport model, the device parameters under phonon scattering are analyzed, and then the CNTFET phonon scattering model is established. To reduce the complexity of this model so that simulation speed can be improved, the effects of phonon scattering is studied through analyzing chirality, temperature and energy, and therefore a new CNTFET phonon scattering model is established with linear approximation. By analyzing the scattering current changes, correctness and validity of the model are demonstrated. The proposed model is easier for calculation and has less computational complexity compared with semi-classical scattering model.
[1] Tans S J, Verschueren A R M, Dekker C 1998 Nature 393 49
[2] Zhou H L, Chi Y Q, Zhang M X, Fang L 2010 Acta Phys. Sin. 59 8104 (in Chinese) [周海亮, 池雅庆, 张民选, 方粮2010 59 8104]
[3] Li P J, Zhang W J, Zhang Q F, Wu J L 2007 Acta Phys. Sin. 56 1054 (in Chinese) [李萍剑, 张文静, 张琦锋, 吴锦雷 2007 56 1054]
[4] Deng J, Wong H S P 2007 IEEE Trans. Electron Dev. 54 3186
[5] Zhou X J, Park J Y, Huang S M, Liu J, McEuen P L 2005 Phys. Rev. Lett. 95 146805
[6] Dresselhaus M S, Eklund P C 2000 Adv. Phys. 49 705
[7] Fregonese S, Goguet J, Maneux C, Zimmer T 2009 IEEE Trans. Electron Dev. 56 1184
[8] Guo J, Lundstrom M S 2005 Appl. Phys. Lett. 86 193103
[9] Honincthun H C, Retailleau S G 2005 Appl. Phys. Lett. 87 1112
[10] Koswatta S O, Hasan S, Lundstrom M S, Anantram M P, Nikonov D E 2007 IEEE Trans. Electron Dev. 54 2339
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[1] Tans S J, Verschueren A R M, Dekker C 1998 Nature 393 49
[2] Zhou H L, Chi Y Q, Zhang M X, Fang L 2010 Acta Phys. Sin. 59 8104 (in Chinese) [周海亮, 池雅庆, 张民选, 方粮2010 59 8104]
[3] Li P J, Zhang W J, Zhang Q F, Wu J L 2007 Acta Phys. Sin. 56 1054 (in Chinese) [李萍剑, 张文静, 张琦锋, 吴锦雷 2007 56 1054]
[4] Deng J, Wong H S P 2007 IEEE Trans. Electron Dev. 54 3186
[5] Zhou X J, Park J Y, Huang S M, Liu J, McEuen P L 2005 Phys. Rev. Lett. 95 146805
[6] Dresselhaus M S, Eklund P C 2000 Adv. Phys. 49 705
[7] Fregonese S, Goguet J, Maneux C, Zimmer T 2009 IEEE Trans. Electron Dev. 56 1184
[8] Guo J, Lundstrom M S 2005 Appl. Phys. Lett. 86 193103
[9] Honincthun H C, Retailleau S G 2005 Appl. Phys. Lett. 87 1112
[10] Koswatta S O, Hasan S, Lundstrom M S, Anantram M P, Nikonov D E 2007 IEEE Trans. Electron Dev. 54 2339
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