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Fu Qun-Dong, Wang Xiao-Wei, Zhou Xiu-Xian, Zhu Chao, Liu Zheng. Synthesis of two-dimensional Bi2O2Se on silicon substrate by chemical vapor deposition and its photoelectric detection application. Acta Physica Sinica,
2022, 71(16): 166101.
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Wang Shuo, Wang Wen-Hui, Lü Jun-Peng, Ni Zhen-Hua. Chemical vapor deposition growth of large-areas two dimensional materials: Approaches and mechanisms. Acta Physica Sinica,
2021, 70(2): 026802.
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Zhang Xiao-Bo, Qing Fang-Zhu, Li Xue-Song. Clean transfer of chemical vapor deposition graphene film. Acta Physica Sinica,
2019, 68(9): 096801.
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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao. Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica,
2018, 67(19): 197203.
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Xing Lan-Jun, Chang Yong-Qin, Shao Chang-Jing, Wang Lin, Long Yi. Room temperature gas sensing property and sensing mechanism of Sn-doped ZnO thin film. Acta Physica Sinica,
2016, 65(9): 097302.
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Ai Li-Qiang, Zhang Xiang-Xiong, Chen Min, Xiong Da-Xi. Deposition and thermal conductivity of diamond-like carbon film on a silicon substrate. Acta Physica Sinica,
2016, 65(9): 096501.
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Wang Bin, Feng Ya-Hui, Wang Qiu-Shi, Zhang Wei, Zhang Li-Na, Ma Jin-Wen, Zhang Hao-Ran, Yu Guang-Hui, Wang Gui-Qiang. Hydrogen etching of chemical vapor deposition-grown graphene domains. Acta Physica Sinica,
2016, 65(9): 098101.
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Wang Lang, Feng Wei, Yang Lian-Qiao, Zhang Jian-Hua. The pre-treatment of copper for graphene synthesis. Acta Physica Sinica,
2014, 63(17): 176801.
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Chen Ren-Gang, Deng Jin-Xiang, Chen Liang, Kong Le, Cui Min, Gao Xue-Fei, Pang Tian-Qi, Miao Yi-Ming. Spectroscopic ellipsometry study of the Zn3N2 films prepared by radio-frequency sputtering. Acta Physica Sinica,
2014, 63(13): 137701.
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Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica,
2013, 62(4): 048801.
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Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong. Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica,
2013, 62(14): 140701.
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Fang Jia, Li Shuang-Liang, Xu Sheng-Zhi, Wei Chang-Chun, Zhao Ying, Zhang Xiao-Dan. Analysis on steady plasma process of high-rate microcrystalline silicon by optical emission spectroscopy. Acta Physica Sinica,
2013, 62(16): 168103.
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Xu Xiao-Ming, Miao Wei, Tao Kun. Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica,
2011, 60(8): 086101.
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
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. Properties of Co nano-films deposited on monocrystalline silicon surface by ion beam sputtering. Acta Physica Sinica,
2007, 56(12): 7158-7164.
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Guo Ping-Sheng, Chen Ting, Cao Zhang-Yi, Zhang Zhe-Juan, Chen Yi-Wei, Sun Zhuo. Low temperature growth of carbon nanotubes by chemical vapor deposition for field emission cathodes. Acta Physica Sinica,
2007, 56(11): 6705-6711.
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Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma. X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica,
2004, 53(10): 3510-3514.
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Zeng Xiang－Bo, Liao Xian－Bo, Wang Bo, Diao Hong－Wei, Dai Song－Tao, Xiang Xian－Bi, Chang Xiu－Lan, Xu Yan－Yue, Hu Zhi－Hua, Hao Hui－Ying, Kong Guang－Lin. Boron-doped silicon nanowires grown by plasmaenhanced chemical vapor deposition. Acta Physica Sinica,
2004, 53(12): 4410-4413.
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Yu Wei, Liu Li-Hui, Hou Hai-Hong, Ding Xue-Cheng, Han Li, Fu Guang-Sheng. Silicon nitride films prepared by helicon wave plasam-enhanced chemical vapour deposition. Acta Physica Sinica,
2003, 52(3): 687-691.
doi: 10.7498/aps.52.687
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