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A comparison of ionizing radiation damage in CMOS devices from 60Co Gamma rays, electrons and protons

He Bao-Ping Chen Wei Wang Gui-Zhen

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A comparison of ionizing radiation damage in CMOS devices from 60Co Gamma rays, electrons and protons

He Bao-Ping, Chen Wei, Wang Gui-Zhen
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(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

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  • Abstract views:  9674
  • PDF Downloads:  1255
  • Cited By: 0
Publishing process
  • Received Date:  28 September 2005
  • Accepted Date:  13 January 2006
  • Published Online:  20 July 2006

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