[1] |
Liu Wei, Ping Yun-Xia, Yang Jun, Xue Zhong-Ying, Wei Xing, Wu Ai-Min, Yu Wen-Jie, Zhang Bo. Reaction of titanium-modulated nickel with germanium-tin under microwave and rapid thermal annealing. Acta Physica Sinica,
2021, 70(11): 116801.
doi: 10.7498/aps.70.20202118
|
[2] |
He Tian-Li, Wei Hong-Yuan, Li Cheng-Ming, Li Geng-Wei. Comparative study of n-GaN transition group refractory metal Ohmic electrode. Acta Physica Sinica,
2019, 68(20): 206101.
doi: 10.7498/aps.68.20190717
|
[3] |
Li Rui-Dong, Deng Jin-Xiang, Zhang Hao, Xu Zhi-Yang, Pan Zhi-Wei, Sun Jun-Jie, Wang Gui-Sheng. Preparation, optical, and electrical properties of rubrene∶MoO3 films. Acta Physica Sinica,
2019, 68(17): 178101.
doi: 10.7498/aps.68.20190035
|
[4] |
Lu Wu-Yue, Zhang Yong-Ping, Chen Zhi-Zhan, Cheng Yue, Tan Jia-Hui, Shi Wang-Zhou. Effect of different annealing treatment methods on the Ni/SiC contact interface properties. Acta Physica Sinica,
2015, 64(6): 067303.
doi: 10.7498/aps.64.067303
|
[5] |
Li Xiao-Jing, Zhao De-Gang, He Xiao-Guang, Wu Liang-Liang, Li Liang, Yang Jing, Le Ling-Cong, Chen Ping, Liu Zong-Shun, Jiang De-Sheng. Influence of different annealing temperature and atmosphere on the Ni/Au Ohmic contact to p-GaN. Acta Physica Sinica,
2013, 62(20): 206801.
doi: 10.7498/aps.62.206801
|
[6] |
Liu Yun-Chuan, Zhou Yan-Ping, Wang Xue-Rong, Meng Xiang-Yan, Duan Jian, Zheng Hui-Bao. Accurate Rutherford backscattering spectrocsopy measurement of aluminium composition in AlxGa1-xN crystal film. Acta Physica Sinica,
2013, 62(16): 162901.
doi: 10.7498/aps.62.162901
|
[7] |
Pan Hui-Ping, Bo Lian-Kun, Huang Tai-Wu, Zhang Yi, Yu Tao, Yao Shu-De. Structural analysis of Cu(In1-xGax)Se2 multi-layer thin film solar cells. Acta Physica Sinica,
2012, 61(22): 228801.
doi: 10.7498/aps.61.228801
|
[8] |
Huang Yue, Gou Hong-Yan, Liao Zhong-Wei, Sun Qing-Qing, Zhang Wei, Ding Shi-Jin. Investigation on memory effect of MOS capacitors with Al2O3/Pt-nanocrystals/HfO2. Acta Physica Sinica,
2010, 59(3): 2057-2063.
doi: 10.7498/aps.59.2057
|
[9] |
Wang Huan, Yao Shu-De, Pan Yao-Bo, Zhang Guo-Yi. Strain in AlInGaN thin films caused by different contents of Al and In studied by Rutherford backscattering/channeling and high resolution X-ray diffraction. Acta Physica Sinica,
2007, 56(6): 3350-3354.
doi: 10.7498/aps.56.3350
|
[10] |
Shan Xiao-Nan, Huang Ru, Li Yan, Cai Yi-Mao. Thermal stability of electrical characteristics of nickel silicide metal gate. Acta Physica Sinica,
2007, 56(8): 4943-4949.
doi: 10.7498/aps.56.4943
|
[11] |
Wang Kun, Yao Shu-De, Hou Li-Na, Ding Zhi-Bo, Yuan Hong-Tao, Du Xiao-Long, Xue Qi-Kun. Depth-dependent elastic strain in ZnO/Zn0.9Mg0.1O/ZnO heterostructure studied by Rutherford backscattering/channeling. Acta Physica Sinica,
2006, 55(6): 2892-2896.
doi: 10.7498/aps.55.2892
|
[12] |
Peng De-Quan, Bai Xin-De, Pan Feng, Sun Hui. Surface study of zirconium implanted with yttrium and lanthanum. Acta Physica Sinica,
2005, 54(12): 5914-5919.
doi: 10.7498/aps.54.5914
|
[13] |
Yang Jian-Hua, Zhang Tong-He. Wear resistance of Ti-implanted H13 steel using covering implantation technology. Acta Physica Sinica,
2004, 53(11): 3823-3828.
doi: 10.7498/aps.53.3823
|
[14] |
Wang Yong-Qian, Chen Wei-De, Chen Chang-Yong, Diao Hong-Wei, Zhang Shi-Ben, Xu Yan-Yue, Kong Guang-Lin, Liao Xian-Bo. . Acta Physica Sinica,
2002, 51(7): 1564-1570.
doi: 10.7498/aps.51.1564
|
[15] |
Xu Qiang, Wang Jian-Bao, Yuan Jian, Lu Fang, Sun Heng-Hui. . Acta Physica Sinica,
1995, 44(3): 432-438.
doi: 10.7498/aps.44.432
|
[16] |
JIANG WEI-LIN, WANG RUI-LAN, ZHU FBI-RAN, WANG CHANG-AN, XU TIAN-BING, LI HONG-CHENG, ZHAI YONG-LIANG, REN MENG-MEI, ZHOU JUN-SI. RBS STUDY ON YBCO AMORPHOUS FILMS PREPARED BY D. C. MAGNETRON SPUTTERING. Acta Physica Sinica,
1994, 43(4): 660-666.
doi: 10.7498/aps.43.660
|
[17] |
SHEN HAO, CHENG HUAN-SHENG, TANG JIA-YONG, YANG FU-JIA. THE STUDY OF NON-RUTHERFORD BACKSCATTERING OF 4He FROM CARSON. Acta Physica Sinica,
1994, 43(10): 1569-1575.
doi: 10.7498/aps.43.1569
|
[18] |
REN MENG-MEI, JIANG WEI-LIN, ZHU PEI-RAN. COMPOSITION ANALYSIS AND OXYGEN CONTENT DETERMINATION OF HIGH T SUPERCONDUCTING FILMS BY RBS AND EBS METHODS. Acta Physica Sinica,
1994, 43(2): 340-344.
doi: 10.7498/aps.43.340
|
[19] |
ZHU FEI-RAN, JIANG WEI-LIN, XU TIAN-BING, YIN SHI-DUAN. MeV PROTON ELASTIC BACKSCATTERING ANALYSIS OF SiNx/Si AND SiOx/Si FILMS. Acta Physica Sinica,
1992, 41(12): 2049-2054.
doi: 10.7498/aps.41.2049
|
[20] |
WU TE-CHAN, WANG JEN-HUI. THE THERMAL DIFFUSE X-RAY SCATTERING AND ELASTIC CONSTANTS OF ZINC. Acta Physica Sinica,
1966, 22(5): 533-540.
doi: 10.7498/aps.22.533
|