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The key factor for developing cable plastic cross-linked polyethylene cable is to eliminate space charge in the bulk. Nowadays, it is universally received that the suppression mechanism of charge accumulation in polyethylene/nano-particle composite is the formation of deep traps for trapping charges, which, in fact, is contrary to the principles of electrical field. So in this paper, the formation and the suppression mechanisms of space charge are elaborated by the energy band theory of polymeric dielectric. Then based on the first order trap model, the formation of space charge in polymeric dielectric is deduced by dynamical equation of the trapped and detraped charges. When the deep traps are introduced into polymeric dielectric, a displacement of Fermi energy level in dielectric occurs and the electric contact of interface between electrode and dielectric changes from ohmic contact to blocking contact. The width of the depletion region associated with blocking contact is less than 100 , due to huge density of traps existing in amorphous polyethylene (PE). The tunnel effect of electron makes the electrical contact of interface a neutral contact. The space charges cannot be formed in PE dielectric under electrical stress. Finally, the conductive current as a function of electrical stress and the space charge distribution are measured respectively on both PE samples, one is pure PE and the other is the nano-particle modified PE filled with deep traps. The test results are consistent with the theoretical results.
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Keywords:
- direct current insulation /
- energy band theory /
- space charge /
- inhibition mechanism
[1] Fabiani D, Montaniri G C, Laurent C, Teyssedre G 2008 IEEE Trans. Dielectric. Electric. Insul. 24 5
[2] Terashima K, Suzuki H, Hara M, Watanabe K 1998 IEEE Trans. Power Deliver 12 1
[3] Chen X, Wang X, Wu K, Peng Z R, Cheng Y H 2010 IEEE Trans. Dielectric. Electric. Insul. 17 1796
[4] An Z L, Yang Q, Zheng F H, Zhang Y W 2007 Acta Phys. Sin. 56 5502 (in Chinese) [安振连, 杨强, 郑飞虎, 张冶文 2007 56 5502]
[5] Gong B, Zhang Y W, Zheng F H, Xiao C, Wu C S 2006 J. Mater. Sci. Eng. 24 109 (in Chinese) [宫斌, 张冶文, 郑飞虎, 肖春, 吴长顺 2006 材料科学与工程 24 109]
[6] Yang Q, An Z L, Zheng F H, Zhang Y W 2008 Acta Phys. Sin. 57 3834 (in Chinese) [杨强, 安振连, 郑飞虎, 张冶文 2008 57 3834]
[7] Takada T, Hayase Y, Tanaka Y, Okamoto T 2008 IEEE Trans. Dielectric. Electric. Insul. 15 152
[8] Tanaka T 2005 IEEE Trans. Dielectric. Electric. Insul. 12 914
[9] Cohen M H, Fritgsche H, Ovshinsky S R 1969 Phys. Rev. Lett. 22 1065
[10] Simmons J G 1971 J. Phys. Chem. Solids 32 1987
[11] Yang B T, Tu D M, Liu Y N 1992 J. Appl. Sci. 10 233 (in Chinese) [杨百屯, 屠德民, 刘耀南 1992 应用科学学报 10 233]
[12] Simmons J G, Tam M C 1973 Phys. Rev. B 7 3706
[13] Simmons J G 1971 J. Phys. Chem. Solids 32 2581
[14] Kao K C, Hwang W 1981 Electrical Transport in Solids (Oxford: Pergamon Press) p152
[15] Simmons J G 1971 J. Phys. Chem. Solids 32 1987
[16] Zheng F H, Zhang Y W, Wu C S, Li J X, Xia Z F 2003 Acta Phys. Sin. 52 1137 (in Chinese) [郑飞虎, 张冶文, 吴长顺, 李吉晓, 夏钟福 2003 52 1137]
[17] Chen X, Wang X, Wu K, Peng Z R, Cheng Y H 2010 Acta Phys. Sin. 59 7327 (in Chinese) [陈曦, 王霞, 吴锴, 彭宗仁, 成永红 2010 59 7327]
[18] Anta J A, Marcelli G, Meunier M, Quirke N 2002 J. Appl. Phys. 92 1002
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[1] Fabiani D, Montaniri G C, Laurent C, Teyssedre G 2008 IEEE Trans. Dielectric. Electric. Insul. 24 5
[2] Terashima K, Suzuki H, Hara M, Watanabe K 1998 IEEE Trans. Power Deliver 12 1
[3] Chen X, Wang X, Wu K, Peng Z R, Cheng Y H 2010 IEEE Trans. Dielectric. Electric. Insul. 17 1796
[4] An Z L, Yang Q, Zheng F H, Zhang Y W 2007 Acta Phys. Sin. 56 5502 (in Chinese) [安振连, 杨强, 郑飞虎, 张冶文 2007 56 5502]
[5] Gong B, Zhang Y W, Zheng F H, Xiao C, Wu C S 2006 J. Mater. Sci. Eng. 24 109 (in Chinese) [宫斌, 张冶文, 郑飞虎, 肖春, 吴长顺 2006 材料科学与工程 24 109]
[6] Yang Q, An Z L, Zheng F H, Zhang Y W 2008 Acta Phys. Sin. 57 3834 (in Chinese) [杨强, 安振连, 郑飞虎, 张冶文 2008 57 3834]
[7] Takada T, Hayase Y, Tanaka Y, Okamoto T 2008 IEEE Trans. Dielectric. Electric. Insul. 15 152
[8] Tanaka T 2005 IEEE Trans. Dielectric. Electric. Insul. 12 914
[9] Cohen M H, Fritgsche H, Ovshinsky S R 1969 Phys. Rev. Lett. 22 1065
[10] Simmons J G 1971 J. Phys. Chem. Solids 32 1987
[11] Yang B T, Tu D M, Liu Y N 1992 J. Appl. Sci. 10 233 (in Chinese) [杨百屯, 屠德民, 刘耀南 1992 应用科学学报 10 233]
[12] Simmons J G, Tam M C 1973 Phys. Rev. B 7 3706
[13] Simmons J G 1971 J. Phys. Chem. Solids 32 2581
[14] Kao K C, Hwang W 1981 Electrical Transport in Solids (Oxford: Pergamon Press) p152
[15] Simmons J G 1971 J. Phys. Chem. Solids 32 1987
[16] Zheng F H, Zhang Y W, Wu C S, Li J X, Xia Z F 2003 Acta Phys. Sin. 52 1137 (in Chinese) [郑飞虎, 张冶文, 吴长顺, 李吉晓, 夏钟福 2003 52 1137]
[17] Chen X, Wang X, Wu K, Peng Z R, Cheng Y H 2010 Acta Phys. Sin. 59 7327 (in Chinese) [陈曦, 王霞, 吴锴, 彭宗仁, 成永红 2010 59 7327]
[18] Anta J A, Marcelli G, Meunier M, Quirke N 2002 J. Appl. Phys. 92 1002
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