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Based on multivariate random analysis and statistical physics, the reliability model of a system with stress-strength interference and initial failure is developed, the system has multi-state and dependent multi-subsystem. According to the definition of conditionally ordered order statistics, the probability density function of random strength vector is studied. Considering the coherence of subsystem items, the system reliability evaluation for different structures is given, and the reliability of any coherent structure is represented as a linear combination of the reliabilities of (n－i+1)-out-of-n system(1≤i≤n). Finally, an example is given to demonstrate the effectiveness of the model, where the stress-strength variable has a bivariate Pareto distribution.
[1] James S 2004 J. Am. Stat. Asso. 99 235
[2] Isaac W, Mustapha N, Daoud A 2009 Reliab. Eng. Syst. Safe. 94 1207
[3] Zong W A, Hong Z H, Yu L 2008 Reliab. Eng. Syst. Safe. 93 1485
[4] Bhatta G K, Johnson R A 1974 J. Am. Stat. Asso. 69 966
[5] Zhang Y J, Wang Z Z 2009 Acta Phys. Sin. 58 178 (in Chinese) [张永进、汪忠志 2009 58 178]
[6] Albert F, Antoine R 2008 Reliab. Eng. Syst. Safe. 93 1025
[7] Lu L X, Gregory L 2008 Reliab. Eng. Syst. Safe. 93 1594
[8] Dong Y M, Li W J, Shao L, Wang J, Wang L, Yang H Y, Zou X 2008 Acta Phys. Sin. 57 4492 (in Chinese) [董业民、李文军、邵 丽、王 俊、王 磊、杨华岳、邹 欣 2008 57 4492]
[9] Xie G F, He X H, Tong J J, Zheng Y H 2007 Acta Phys. Sin. 56 3192 (in Chinese) [谢国锋、何旭洪、童节娟、郑艳华 2007 56 3192]
[10] Xing X S 1986 Acta Phys. Sin. 35 741 (in Chinese) [刑修三 1986 35 741]
[11] Luan S Z, Liu H X, Jia R X 2008 Acta Phys. Sin. 57 2524 (in Chinese) [栾苏珍、刘红侠、贾仁需 2008 57 2524]
[12] Zhang Y M, Zhang X F 2008 Acta Phys. Sin. 57 3989 (in Chinese) [张义民、张旭方2008 57 3989]
[13] Zhang J M, Xu K W 2004 Chin. Phys. 13 205
[14] Zhang J M, Zhang Y, Xu K W 2005 Chin. Phys. 14 1006
[15] Zhang J M, X K W 2005 Chin. Phys. 14 1866
[16] Zhang J M, Zou D S, Xu C, Zhu Y X, Liang T, Da X L, Shen G D 2007 Chin. Phys. 16 1135
[17] Xu J P, Chen W B, Lai P T, Li Y P, Chan C L 2007 Chin. Phys. 16 529
[18] Yang L, Ma X H, Feng Q, Hao Y 2008 Chin. Phys. B 17 2696
[19] Liu H X, Zheng X F, Han X L, Hao Y, Zhang M 2003 Acta Phys. Sin. 52 2576 (in Chinese) [刘红侠、郑雪峰、韩晓亮、郝 跃、张 绵 2003 52 2576]
[20] Yang L, Hu G Z, Hao Y, Ma X H, Quan S, Yang L Y, Jiang S G 2010 Chin. Phys. B 19 047301
[21] Ranjan K P, Uddin M B 1997 Microelectron. Reliab. 37 923
[22] Pandey M, Upadhyay S K 1986 Microelectron. Reliab. 26 275
[23] Hoepfer V M, Saleh J H, Marais K B 2009 Reliab. Eng. Syst. Safe. 94 1904
[24] Lu L X, Gregory L 2008 Reliab. Eng. Syst. Safe. 93 1594
[25] Bairamov I G 2006 J. Multivariate Anal. 97 797
[26] Samaniego F 1985 IEEE T. Reliab. 11 69
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[1] James S 2004 J. Am. Stat. Asso. 99 235
[2] Isaac W, Mustapha N, Daoud A 2009 Reliab. Eng. Syst. Safe. 94 1207
[3] Zong W A, Hong Z H, Yu L 2008 Reliab. Eng. Syst. Safe. 93 1485
[4] Bhatta G K, Johnson R A 1974 J. Am. Stat. Asso. 69 966
[5] Zhang Y J, Wang Z Z 2009 Acta Phys. Sin. 58 178 (in Chinese) [张永进、汪忠志 2009 58 178]
[6] Albert F, Antoine R 2008 Reliab. Eng. Syst. Safe. 93 1025
[7] Lu L X, Gregory L 2008 Reliab. Eng. Syst. Safe. 93 1594
[8] Dong Y M, Li W J, Shao L, Wang J, Wang L, Yang H Y, Zou X 2008 Acta Phys. Sin. 57 4492 (in Chinese) [董业民、李文军、邵 丽、王 俊、王 磊、杨华岳、邹 欣 2008 57 4492]
[9] Xie G F, He X H, Tong J J, Zheng Y H 2007 Acta Phys. Sin. 56 3192 (in Chinese) [谢国锋、何旭洪、童节娟、郑艳华 2007 56 3192]
[10] Xing X S 1986 Acta Phys. Sin. 35 741 (in Chinese) [刑修三 1986 35 741]
[11] Luan S Z, Liu H X, Jia R X 2008 Acta Phys. Sin. 57 2524 (in Chinese) [栾苏珍、刘红侠、贾仁需 2008 57 2524]
[12] Zhang Y M, Zhang X F 2008 Acta Phys. Sin. 57 3989 (in Chinese) [张义民、张旭方2008 57 3989]
[13] Zhang J M, Xu K W 2004 Chin. Phys. 13 205
[14] Zhang J M, Zhang Y, Xu K W 2005 Chin. Phys. 14 1006
[15] Zhang J M, X K W 2005 Chin. Phys. 14 1866
[16] Zhang J M, Zou D S, Xu C, Zhu Y X, Liang T, Da X L, Shen G D 2007 Chin. Phys. 16 1135
[17] Xu J P, Chen W B, Lai P T, Li Y P, Chan C L 2007 Chin. Phys. 16 529
[18] Yang L, Ma X H, Feng Q, Hao Y 2008 Chin. Phys. B 17 2696
[19] Liu H X, Zheng X F, Han X L, Hao Y, Zhang M 2003 Acta Phys. Sin. 52 2576 (in Chinese) [刘红侠、郑雪峰、韩晓亮、郝 跃、张 绵 2003 52 2576]
[20] Yang L, Hu G Z, Hao Y, Ma X H, Quan S, Yang L Y, Jiang S G 2010 Chin. Phys. B 19 047301
[21] Ranjan K P, Uddin M B 1997 Microelectron. Reliab. 37 923
[22] Pandey M, Upadhyay S K 1986 Microelectron. Reliab. 26 275
[23] Hoepfer V M, Saleh J H, Marais K B 2009 Reliab. Eng. Syst. Safe. 94 1904
[24] Lu L X, Gregory L 2008 Reliab. Eng. Syst. Safe. 93 1594
[25] Bairamov I G 2006 J. Multivariate Anal. 97 797
[26] Samaniego F 1985 IEEE T. Reliab. 11 69
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