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Zhang Fu-Ping, Li Xi-Qin, Du Jin-Mei, Liu Yu-Sheng, Ye Fu-Qing. Failure distribution and reliable analysis of ferroelectric ceramics under pulsed electric field. Acta Physica Sinica,
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Liu Ju, Cao Yi-Wei, Lv Quan-Jiang, Yang Tian-Peng, Mi Ting-Ting, Wang Xiao-Wen, Liu Jun-Lin. Influence of period number of superlattice electron barrier layer on the performance of AlGaN-based deep ultraviolet LED. Acta Physica Sinica,
2024, 73(12): 128503.
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Fu Min, Wen Shang-Sheng, Xia Yun-Yun, Xiang Chang-Ming, Ma Bing-Xu, Fang Fang. Failure analysis of GaN-based Light-emitting diode with hole vertical structure. Acta Physica Sinica,
2017, 66(4): 048501.
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Zhou Hang, Cui Jiang-Wei, Zheng Qi-Wen, Guo Qi, Ren Di-Yuan, Yu Xue-Feng. Reliability of partially-depleted silicon-on-insulator n-channel metal-oxide-semiconductor field-effect transistor under the ionizing radiation environment. Acta Physica Sinica,
2015, 64(8): 086101.
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Li Ri, Wang Jian, Zhou Li-Ming, Pan Hong. The reliability analysis of using the volume averaging method to simulate the solidification process in a ingot. Acta Physica Sinica,
2014, 63(12): 128103.
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Wang Xin-Hua, Wang Jian-Hui, Pang Lei, Chen Xiao-Juan, Yuan Ting-Ting, Luo Wei-Jun, Liu Xin-Yu. Reliability of SiN-based MIM capacitors in GaN MMIC. Acta Physica Sinica,
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2009, 58(9): 6074-6079.
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2008, 57(4): 2524-2528.
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2008, 57(7): 3989-3995.
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2008, 57(7): 4492-4496.
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Wu Zhen-Yu, Yang Yin-Tang, Chai Chang-Chun, Li Yue-Jin, Wang Jia-You, Liu Bin. The effect of via size on the stress migration of Cu interconnects. Acta Physica Sinica,
2008, 57(6): 3730-3734.
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2007, 56(6): 3192-3197.
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2006, 55(3): 1384-1389.
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2006, 55(6): 3003-3006.
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2005, 54(12): 5867-5871.
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2003, 52(10): 2576-2579.
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