| [1] |
Vasiliy Pelenovich, Zeng Xiao-Mei, Luo Jin-Bao, Rakhim Rakhimov, Zuo Wen-Bin, Zhang Xiang-Yu, Tian Can-Xin, Zou Chang-Wei, Fu De-Jun, Yang Bing. Double-step gas cluster ion beam smoothing. Acta Physica Sinica,
2021, 70(5): 053601.
doi: 10.7498/aps.70.20201454
|
| [2] |
Wang Jian-Guo, Yang Song-Lin, Ye Yong-Hong. Effect of silver film roughness on imaging property of BaTiO3 microsphere. Acta Physica Sinica,
2018, 67(21): 214209.
doi: 10.7498/aps.67.20180823
|
| [3] |
Song Yan-Song, Yang Jian-Feng, Li Fu, Ma Xiao-Long, Wang Hong. Method of controlling optical surface roughness based on stray light requirements. Acta Physica Sinica,
2017, 66(19): 194201.
doi: 10.7498/aps.66.194201
|
| [4] |
Cheng Guang-Gui, Zhang Zhong-Qiang, Ding Jian-Ning, Yuan Ning-Yi, Xu Duo. Wetting behaviors of the molten silicon on graphite surface. Acta Physica Sinica,
2017, 66(3): 036801.
doi: 10.7498/aps.66.036801
|
| [5] |
Song Yong-Feng, Li Xiong-Bing, Shi Yi-Wei, Ni Pei-Jun. Effects of surface roughness on diffuse ultrasonic backscatter in the solids. Acta Physica Sinica,
2016, 65(21): 214301.
doi: 10.7498/aps.65.214301
|
| [6] |
Chen Su-Ting, Hu Hai-Feng, Zhang Chuang. Surface roughness modeling based on laser speckle imaging. Acta Physica Sinica,
2015, 64(23): 234203.
doi: 10.7498/aps.64.234203
|
| [7] |
Wang Yu-Xiang, Chen Shuo. Drops on microstructured surfaces: A numerical study using many-body dissipative particle dynamics. Acta Physica Sinica,
2015, 64(5): 054701.
doi: 10.7498/aps.64.054701
|
| [8] |
Ma Jing-Jie, Xia Hui, Tang Gang. Dynamic scaling behavior of the space-fractional stochastic growth equation with correlated noise. Acta Physica Sinica,
2013, 62(2): 020501.
doi: 10.7498/aps.62.020501
|
| [9] |
Cao Hong, Huang Yong, Chen Su-Fen, Zhang Zhan-Wen, Wei Jian-Jun. Influence of pulse tapping technology on surface roughness of polyimide capsule. Acta Physica Sinica,
2013, 62(19): 196801.
doi: 10.7498/aps.62.196801
|
| [10] |
Gao Hai-Bo, Li Rui, Lu Jing-Xiao, Wang Guo, Li Xin-Lin, Jiao Yue-Chao. High-rate deposition of microcrystalline silicon thin film by multi-step method. Acta Physica Sinica,
2012, 61(1): 018101.
doi: 10.7498/aps.61.018101
|
| [11] |
Li Xin-Li, Gu Jin-Hua, Gao Hai-Bo, Chen Yong-Sheng, Gao Xiao-Yong, Yang Shi-E, Lu Jing-Xiao, Li Rui, Jiao Yue-Chao. Real time and ex situ spectroscopic ellipsometry analysis microcrystalline silicon thin films growth. Acta Physica Sinica,
2012, 61(3): 036802.
doi: 10.7498/aps.61.036802
|
| [12] |
Han Xiao-Yan, Hou Guo-Fu, Wei Chang-Chun, Zhang Xiao-Dan, Dai Zhi-Hua, Li Gui-Jun, Sun Jian, Chen Xin-Liang, Zhang De-Kun, Xue Jun-Ming, Zhao Ying, Geng Xin-Hua. Optimization of high rate growth high quality μc-Si:H thin films and its application to the solar cells. Acta Physica Sinica,
2009, 58(6): 4254-4259.
doi: 10.7498/aps.58.4254
|
| [13] |
Han Xiao-Yan, Geng Xin-Hua, Hou Guo-Fu, Zhang Xiao-Dan, Li Gui-Jun, Yuan Yu-Jie, Wei Chang-Chun, Sun Jian, Zhang De-Kun, Zhao Ying. An optical emission spectroscopy study on the high rate growth of microcrystalline silicon films. Acta Physica Sinica,
2009, 58(2): 1344-1347.
doi: 10.7498/aps.58.1344
|
| [14] |
Gu Jin-Hua, Ding Yan-Li, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao. A spectroscopic ellipsometry study of the abnormal scaling behavior of high-rate-deposited microcrystalline silicon films by VHF-PECVD technique. Acta Physica Sinica,
2009, 58(6): 4123-4127.
doi: 10.7498/aps.58.4123
|
| [15] |
Guo Xue-Jun, Lu Jing-Xiao, Chen Yong-Sheng, Zhang Qing-Feng, Wen Shu-Tang, Zheng Wen, Shen Chen-Hai, Chen Qing-Dong. Research on the high-rate deposition of μc-Si:H by VHF-PECVD. Acta Physica Sinica,
2008, 57(9): 6002-6006.
doi: 10.7498/aps.57.6002
|
| [16] |
Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing. Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica,
2007, 56(4): 2422-2427.
doi: 10.7498/aps.56.2422
|
| [17] |
Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui. Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporation. Acta Physica Sinica,
2006, 55(6): 3124-3127.
doi: 10.7498/aps.55.3124
|
| [18] |
Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Gu Jin-Hua, Zhou Yu-Qin, Liu Jin-Long, Dong Bao-Zhong, Li Guo-Hua, Ding Kun. The microstructure of hydrogenated microcrystalline silicon thin films studied by small-angle x-ray scattering. Acta Physica Sinica,
2005, 54(5): 2172-2175.
doi: 10.7498/aps.54.2172
|
| [19] |
Gu Jin-Hua, Zhou Yu-Qin, Zhu Mei-Fang, Li Guo-Hua, Ding Kun, Zhou Bing-Qing, Liu Feng-Zhen, Liu Jin-Long, Zhang Qun-Fang. Study on growth mechanism of low-temperature prepared microcrystalline Si thin f ilms. Acta Physica Sinica,
2005, 54(4): 1890-1894.
doi: 10.7498/aps.54.1890
|
| [20] |
Zhang Chen-Hui, Luo Jian-Bin, Li Wen-Zhi, Chen Da-Rong. The study on the microstructure of TiN and Ti1-xSixNy coatings. Acta Physica Sinica,
2004, 53(1): 182-188.
doi: 10.7498/aps.53.182
|
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