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Stacking fault tetrahedra in single-crystal aluminum induced by high-current pulsed electron beam

Guan Qing-Feng Chen Bo Zhang Qing-Yu Dong Chuang Zou Guang-Tian

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Stacking fault tetrahedra in single-crystal aluminum induced by high-current pulsed electron beam

Guan Qing-Feng, Chen Bo, Zhang Qing-Yu, Dong Chuang, Zou Guang-Tian
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  • Abstract views:  9053
  • PDF Downloads:  1218
  • Cited By: 0
Publishing process
  • Received Date:  11 March 2007
  • Accepted Date:  09 May 2007
  • Published Online:  15 January 2008

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