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Defect microstructures in polycrystalline pure copper induced by high-current pulsed electron beam——the vacancy defect clusters and surface micropores

Wang Xue-Tao Guan Qing-Feng Qiu Dong-Hua Cheng Xiu-Wei Li Yan Peng Dong-Jin Gu Qian-Qian

Citation:

Defect microstructures in polycrystalline pure copper induced by high-current pulsed electron beam——the vacancy defect clusters and surface micropores

Wang Xue-Tao, Guan Qing-Feng, Qiu Dong-Hua, Cheng Xiu-Wei, Li Yan, Peng Dong-Jin, Gu Qian-Qian
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  • Abstract views:  8408
  • PDF Downloads:  886
  • Cited By: 0
Publishing process
  • Received Date:  01 April 2009
  • Accepted Date:  14 April 2009
  • Published Online:  05 May 2010

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