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On the basis of sudden change of linear absorption coefficient (LACs) in the vicinity of absorption edge, the synchrotron K-edge subtraction technique is developed to label the three-dimensional (3D) distribution of element. In this work, tomographic scans above and below the specific absorption edge of Zn are carried out and the subtracted image is used to identify and quantify the 3D distribution of Zn element inside the cell wall of Al-Zn-Mg foam. A non-uniform spatial distribution of Zn element is found in the cell wall of as-cast foam. After long solution tratment, the concentration of Zn element tended to be homogeneous. It is confirmed that the local agglomerated Zn-bearing particles exerta negative influence on the brittle cracking of the cell wall. The K-edge subtraction technique provides a powerful tool for the quantitative microstructure characterization of three-dimensional tissues.
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Keywords:
- synchrotron radiation /
- K-edge subtraction imaging /
- element distribution /
- three-dimensional characterization
[1] Banhart J, Weaire D 2002 Phys. Today 55 37
[2] Liu C S, Han F S, Zhu Z G 1997 Acta Phys. Sin. 46 1585 (in Chinese) [刘长松、韩福生、朱震刚 1997 46 1585]
[3] Lefebvre L P, Banhart J, Dunand D C 2008 Adv. Eng. Mater. 10 775
[4] Flannery B P, Deckman H W, Roberge W G, D’Amico K L 1987 Science 237 1439
[5] Wang M, Hu X F, Wu X P 2006 Acta Phys. Sin. 55 4065 (in Chinese) [汪 敏、胡小方、伍小平 2006 55 4065]
[6] Zhang X Z, Xu Z J, Zhen X J, Wang Y, Guo Z, Yan R, Chang R, Zhou R R, Tai R Z 2010 Acta Phys. Sin. 59 4535 (in Chinese) [张祥志、许子健、甄香君、王 勇、郭 智、严 睿、常 睿、周冉冉、邰仁忠 2010 59 4535]
[7] Grodzins L 1983 Nucl. Instrum. Methods Phys. Res. 206 547
[8] Scheckel K, Hamon R, Jassogne L, Rivers M, Lombi E 2007 Plant Soil 290 51
[9] Guo R Y, Ma H J, Xue Y L, Xie H L, Deng B, Du G H, Wang M, Xiao T Q 2010 Acta Opt. Sin. 30 2898 (in Chinese) [郭荣怡、马红娟、薛艳玲、谢红兰、邓 彪、杜国浩、王 敏、肖体乔 2010光学学报 30 2898]
[10] Rau C, Somogyi A, Simionovici A 2003 Nucl. Instrum. Methods Phys. Res. B 200 444
[11] Baruchel J, Buffière J Y, Maire E, Merle P, Peix G 2000 X-Ray Tomography in Materials Science (Paris: Hermes Science Publications) p19
[12] Macgillavry C H, Rieck G D 1985 International Tables for X-Ray Crystallography. Volume III: Physical and Chemical Tables 2nd Edition (Dordrecht, Holland: D. Reidel Publishing Company) p161
[13] Prince E 2004 International Tables for Crystallography Volume C: Mathematical, Physical and Chemical Tables 3rd Edition (The Netherlands: Kluwer Academic Publishers) p206
[14] Ikeda S, Nakano T, Tsuchiyama A, Uesugi K, Suzuki Y, Nakamura K I, Nakashima Y, Yoshida H 2004 Am. Mineral. 89 1304
[15] Singh S N 1970 Scr. Metall. 4 147
[16] Ohgaki T, Toda H, Kobayashi M, Uesugi K, Niinomi M, Akahori T, Kobayash T, Makii K, Aruga Y 2006 Philos. Mag. 86 4417
[17] Zhang H, Toda H, Hara H, Kobayashi M, Kobayashi T, Sugiyama D, Kuroda N, Uesugi K 2007 Metall. Mater. Trans. A 38 1774
[18] Toda H, Ohgaki T, Uesugi K, Kobayashi M, Kuroda N, Kobayashi T, Niinomi M, Akahori T, Makii K, Aruga Y 2006 Metall. Mater. Trans. A 37 1211
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[1] Banhart J, Weaire D 2002 Phys. Today 55 37
[2] Liu C S, Han F S, Zhu Z G 1997 Acta Phys. Sin. 46 1585 (in Chinese) [刘长松、韩福生、朱震刚 1997 46 1585]
[3] Lefebvre L P, Banhart J, Dunand D C 2008 Adv. Eng. Mater. 10 775
[4] Flannery B P, Deckman H W, Roberge W G, D’Amico K L 1987 Science 237 1439
[5] Wang M, Hu X F, Wu X P 2006 Acta Phys. Sin. 55 4065 (in Chinese) [汪 敏、胡小方、伍小平 2006 55 4065]
[6] Zhang X Z, Xu Z J, Zhen X J, Wang Y, Guo Z, Yan R, Chang R, Zhou R R, Tai R Z 2010 Acta Phys. Sin. 59 4535 (in Chinese) [张祥志、许子健、甄香君、王 勇、郭 智、严 睿、常 睿、周冉冉、邰仁忠 2010 59 4535]
[7] Grodzins L 1983 Nucl. Instrum. Methods Phys. Res. 206 547
[8] Scheckel K, Hamon R, Jassogne L, Rivers M, Lombi E 2007 Plant Soil 290 51
[9] Guo R Y, Ma H J, Xue Y L, Xie H L, Deng B, Du G H, Wang M, Xiao T Q 2010 Acta Opt. Sin. 30 2898 (in Chinese) [郭荣怡、马红娟、薛艳玲、谢红兰、邓 彪、杜国浩、王 敏、肖体乔 2010光学学报 30 2898]
[10] Rau C, Somogyi A, Simionovici A 2003 Nucl. Instrum. Methods Phys. Res. B 200 444
[11] Baruchel J, Buffière J Y, Maire E, Merle P, Peix G 2000 X-Ray Tomography in Materials Science (Paris: Hermes Science Publications) p19
[12] Macgillavry C H, Rieck G D 1985 International Tables for X-Ray Crystallography. Volume III: Physical and Chemical Tables 2nd Edition (Dordrecht, Holland: D. Reidel Publishing Company) p161
[13] Prince E 2004 International Tables for Crystallography Volume C: Mathematical, Physical and Chemical Tables 3rd Edition (The Netherlands: Kluwer Academic Publishers) p206
[14] Ikeda S, Nakano T, Tsuchiyama A, Uesugi K, Suzuki Y, Nakamura K I, Nakashima Y, Yoshida H 2004 Am. Mineral. 89 1304
[15] Singh S N 1970 Scr. Metall. 4 147
[16] Ohgaki T, Toda H, Kobayashi M, Uesugi K, Niinomi M, Akahori T, Kobayash T, Makii K, Aruga Y 2006 Philos. Mag. 86 4417
[17] Zhang H, Toda H, Hara H, Kobayashi M, Kobayashi T, Sugiyama D, Kuroda N, Uesugi K 2007 Metall. Mater. Trans. A 38 1774
[18] Toda H, Ohgaki T, Uesugi K, Kobayashi M, Kuroda N, Kobayashi T, Niinomi M, Akahori T, Makii K, Aruga Y 2006 Metall. Mater. Trans. A 37 1211
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