-
A novel optical system for detecting and controlling the time-delay value of probe light in the femtosecond pulse pump-probe measurements is presented based on the simultaneous phase-shifting interferometry scheme. The intensity distributions of interference pattern are calculated based on the Jones theory to optimize the optical system, by which the analytical expressions for phase-shifting length between the neighboring interferograms and the relevant phase-delay value are derived. To meet the requirement of practical application, possible latent errors in the process of detecting time-delay are analyzed. In particular, a minimum time-resolution with attosecond level at 800 nm wavelength was achieved. The results show that this system satisfies the requirement of femtosecond pulse pump-probe high-precision measurement.
-
Keywords:
- femtosecond pump-probe /
- time-delay /
- simultaneous phase-shifting interferometry /
- Jones theory
[1] Zewail A H 2000 J. Phys. Chem. A 104 5660
[2] Long Y B, Zhang J, Wang G P 2009 Acta Phys. Sin. 58 7722 (in Chinese) [龙拥兵、 张 剑、 汪国平 2009 58 7722]
[3] Zewail A H 2000 Pure Appl. Chem. 72 2219
[4] Cheng C F, Wang X F, Lu B 2004 Acta Phys. Sin. 53 1826 (in Chinese) [成纯富、 王晓方、 鲁 波 2004 53 1826]
[5] Zhao X H, Ma F, Wu Y S, Ai X C, Zhang J P 2008 Acta Phys. Sin. 57 298 (in Chinese) [赵晓辉、 马 菲、 吴义室、 艾希成、 张建平 2008 57 298]
[6] Dantus M, Rosker M J, Zewail A H 1987 J. Chem. Phys. 87 2395
[7] Wang Y M, Shen H, Hua L Q, Hu C J, Zhang B 2009 Opt. Express 17 10506
[8] Yang H, Zhang T Q, Wang S F, Gong Q H 2000 Acta Phys. Sin. 49 1292 (in Chinese) [杨 宏、 张铁桥、 王树峰、 龚旗煌 2000 49 1292]
[9] Li Z, Zhang J S, Yang J, Gong Q H 2007 Acta Phys. Sin. 56 3630 (in Chinese) [李 智、 张家森、 杨 景、 龚旗煌 2007 56 3630]
[10] Yasuki A, Kazuo T, Wang K, Vincent M 2003 J. Chem. Phys. 119 7913
[11] Zadoyan R, Li Z, Martens C C, Apkarian V A 1994 J. Chem. Phys. 101 6648
[12] Li H Y, Zhao K, Pan R Q, Sun Y H, Wang C K 2005 Acta Phys. Sin. 54 2072 (in Chinese) [李洪玉、 赵 珂、 潘瑞芹、 孙元红、 王传奎 2005 54 2072]
[13] Koliopoulos C L 1991 Proc. SPIE 1531 119
[14] Smythe R, Moore R 1984 Opt. Eng. 23 361
[15] Zhang C M, Zhu L Y 2010 Acta Phys. Sin. 59 989 (in Chinese) [张淳民、 朱兰艳 2010 59 989]
[16] Hettwer A, Kranz J, Schwider J 2000 Opt. Eng. 39 960
[17] Kranz J, Lamprecht J, Hettwer A, Johannes S 1998 Proc. SPIE 3407 328
[18] Jian X H, Zhang C M, Zhao B C 2007 Acta Phys. Sin. 56 824 (in Chinese) [简小华、 张淳民、 赵葆常 2007 56 824]
[19] Zuo F, Chen L, Xu C 2007 Chin. J. Lasers 34 1682 (in Chinese) [左 芬、 陈 磊、 徐 晨 2007 中国激光 34 1682]
[20] Liang Q T 1986 Physical Optics (Beijing:China Machine Press) p323 (in Chnese) [梁铨廷 1986 物理光学 (北京:机械工业出版社) 第323页]
[21] Su D T 1996 Optical Testing Technology (Beijing:Beijing Institute of Technology Press) p188 (in Chinese) [苏大图 1996 光学测试技术 (北京:北京理工学院出版社) 第188页]
[22] Greco V, Molesini G, Quercioli F 1994 Rev. Sci. Instrum. 66 3729
[23] Gao P, Yao B L, Han J H, Chen L J, Wang Y L, Lei M 2008 Acta Phys. Sin. 57 2952 (in Chinese) [郜 鹏、 姚保利、 韩俊鹤、 陈利菊、 王英利、 雷 铭 2008 57 2952]
-
[1] Zewail A H 2000 J. Phys. Chem. A 104 5660
[2] Long Y B, Zhang J, Wang G P 2009 Acta Phys. Sin. 58 7722 (in Chinese) [龙拥兵、 张 剑、 汪国平 2009 58 7722]
[3] Zewail A H 2000 Pure Appl. Chem. 72 2219
[4] Cheng C F, Wang X F, Lu B 2004 Acta Phys. Sin. 53 1826 (in Chinese) [成纯富、 王晓方、 鲁 波 2004 53 1826]
[5] Zhao X H, Ma F, Wu Y S, Ai X C, Zhang J P 2008 Acta Phys. Sin. 57 298 (in Chinese) [赵晓辉、 马 菲、 吴义室、 艾希成、 张建平 2008 57 298]
[6] Dantus M, Rosker M J, Zewail A H 1987 J. Chem. Phys. 87 2395
[7] Wang Y M, Shen H, Hua L Q, Hu C J, Zhang B 2009 Opt. Express 17 10506
[8] Yang H, Zhang T Q, Wang S F, Gong Q H 2000 Acta Phys. Sin. 49 1292 (in Chinese) [杨 宏、 张铁桥、 王树峰、 龚旗煌 2000 49 1292]
[9] Li Z, Zhang J S, Yang J, Gong Q H 2007 Acta Phys. Sin. 56 3630 (in Chinese) [李 智、 张家森、 杨 景、 龚旗煌 2007 56 3630]
[10] Yasuki A, Kazuo T, Wang K, Vincent M 2003 J. Chem. Phys. 119 7913
[11] Zadoyan R, Li Z, Martens C C, Apkarian V A 1994 J. Chem. Phys. 101 6648
[12] Li H Y, Zhao K, Pan R Q, Sun Y H, Wang C K 2005 Acta Phys. Sin. 54 2072 (in Chinese) [李洪玉、 赵 珂、 潘瑞芹、 孙元红、 王传奎 2005 54 2072]
[13] Koliopoulos C L 1991 Proc. SPIE 1531 119
[14] Smythe R, Moore R 1984 Opt. Eng. 23 361
[15] Zhang C M, Zhu L Y 2010 Acta Phys. Sin. 59 989 (in Chinese) [张淳民、 朱兰艳 2010 59 989]
[16] Hettwer A, Kranz J, Schwider J 2000 Opt. Eng. 39 960
[17] Kranz J, Lamprecht J, Hettwer A, Johannes S 1998 Proc. SPIE 3407 328
[18] Jian X H, Zhang C M, Zhao B C 2007 Acta Phys. Sin. 56 824 (in Chinese) [简小华、 张淳民、 赵葆常 2007 56 824]
[19] Zuo F, Chen L, Xu C 2007 Chin. J. Lasers 34 1682 (in Chinese) [左 芬、 陈 磊、 徐 晨 2007 中国激光 34 1682]
[20] Liang Q T 1986 Physical Optics (Beijing:China Machine Press) p323 (in Chnese) [梁铨廷 1986 物理光学 (北京:机械工业出版社) 第323页]
[21] Su D T 1996 Optical Testing Technology (Beijing:Beijing Institute of Technology Press) p188 (in Chinese) [苏大图 1996 光学测试技术 (北京:北京理工学院出版社) 第188页]
[22] Greco V, Molesini G, Quercioli F 1994 Rev. Sci. Instrum. 66 3729
[23] Gao P, Yao B L, Han J H, Chen L J, Wang Y L, Lei M 2008 Acta Phys. Sin. 57 2952 (in Chinese) [郜 鹏、 姚保利、 韩俊鹤、 陈利菊、 王英利、 雷 铭 2008 57 2952]
Catalog
Metrics
- Abstract views: 9880
- PDF Downloads: 889
- Cited By: 0
下载:
